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1دورية أكاديمية
المصدر: IEEE Transactions on Aerospace and Electronic Systems IEEE Trans. Aerosp. Electron. Syst. Aerospace and Electronic Systems, IEEE Transactions on. 60(2):1679-1691 Apr, 2024
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2دورية أكاديمية
المصدر: IEEE Transactions on Reliability IEEE Trans. Rel. Reliability, IEEE Transactions on. 73(1):536-548 Mar, 2024
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3مؤتمر
المؤلفون: Pan, Maoyang, Deng, Erping, Zhao, Yushan, Liu, Jianhui, Liu, Peng, Huang, Yongzhang
المصدر: 2023 IEEE 6th International Electrical and Energy Conference (CIEEC) Electrical and Energy Conference (CIEEC), 2023 IEEE 6th International. :2183-2187 May, 2023
Relation: 2023 IEEE 6th International Electrical and Energy Conference (CIEEC)
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4دورية أكاديمية
المؤلفون: Wu, Y., Olson, G.F., Peretti, L.
المصدر: IEEE Transactions on Industrial Electronics IEEE Trans. Ind. Electron. Industrial Electronics, IEEE Transactions on. 70(8):7753-7760 Aug, 2023
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5دورية أكاديمية
المؤلفون: Wang, JieAff1, Aff2, Long, Weixiong, Pan, Jintao, Zhang, Xiaolin, Luo, Lihua, Qian, Mingjuan, Chen, Wei, Luo, Laiyang, Xu, Weibiao, Li, Yonghui, Cai, Yaohui, Xie, HongweiAff1, IDs00425024043764_cor12
المصدر: Planta: An International Journal of Plant Biology. 259(5)
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6دورية أكاديمية
المصدر: IEEE Transactions on Geoscience and Remote Sensing IEEE Trans. Geosci. Remote Sensing Geoscience and Remote Sensing, IEEE Transactions on. 61:1-15 2023
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7دورية أكاديمية
المصدر: IEEE Transactions on Geoscience and Remote Sensing IEEE Trans. Geosci. Remote Sensing Geoscience and Remote Sensing, IEEE Transactions on. 61:1-14 2023
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8دورية أكاديمية
المصدر: IEEE Transactions on Geoscience and Remote Sensing IEEE Trans. Geosci. Remote Sensing Geoscience and Remote Sensing, IEEE Transactions on. 61:1-15 2023
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9مؤتمر
المؤلفون: Guo, Yuhua, Liu, Xin, Shi, Huifeng, Jin, Shichao
المصدر: IGARSS 2022 - 2022 IEEE International Geoscience and Remote Sensing Symposium Geoscience and Remote Sensing Symposium, IGARSS 2022 - 2022 IEEE International. :7034-7037 Jul, 2022
Relation: IGARSS 2022 - 2022 IEEE International Geoscience and Remote Sensing Symposium
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10دورية أكاديمية
المصدر: IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 22(3):457-461 Sep, 2022