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1دورية أكاديمية
المؤلفون: Siyoun Lee, Seong-Yeon Kim, Haesoon Oh, Jaesung Sim, Woo Young Choi
المصدر: IEEE Access, Vol 11, Pp 60758-60762 (2023)
مصطلحات موضوعية: Snapback breakdown, impact ionization, parasitic bipolar junction transistor (BJT), pocket implantation, multi-finger MOSFET, Electrical engineering. Electronics. Nuclear engineering, TK1-9971
وصف الملف: electronic resource
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2
المؤلفون: Wanik Cho, Jongseok Jung, Jongwoo Kim, Junghoon Ham, Sangkyu Lee, Yujong Noh, Dauni Kim, Wanseob Lee, Kayoung Cho, Kwanho Kim, Heejoo Lee, Sooyeol Chai, Eunwoo Jo, Hanna Cho, Jong-Seok Kim, Chankeun Kwon, Cheolioona Park, Hveonsu Nam, Haeun Won, Taeho Kim, Kyeonghwan Park, Sanghoon Oh, Jinhyun Ban, Junyoung Park, Jaehyeon Shin, Taisik Shin, Junseo Jang, Jiseong Mun, Jehyun Choi, Hyunseung Choi, Suna-Wook Choi, Wonsun Park, Dongkvu Yoon, Minsu Kim, Junvoun Lim, Chiwook An, Hyunyoung Shirr, Haesoon Oh, Haechan Park, Sungbo Shim, Hwang Huh, Honasok Choi, Seungpil Lee, Jaesuna Sim, Kichana Gwon, Jumsoo Kim, Woopyo Jeong, Jungdal Choi, Kyo-Won Jin
المصدر: 2022 IEEE International Solid- State Circuits Conference (ISSCC).
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::d26dc3c61a3840646dbee3c4b8ab0fa8
https://doi.org/10.1109/isscc42614.2022.9731785 -
3
المؤلفون: Wonhyo Cha, Jeongseob Oh, Seokwon Cho, Kun-Ok Ahn, Jaewook Yang, Hyunyoung Shim, Haesoon Oh, Ki-Seog Kim, Gi-Hyun Bae, Shinwon Seo, Se-kyoung Choi, Byung-Kook Kim
المصدر: 2013 IEEE International Reliability Physics Symposium (IRPS).
مصطلحات موضوعية: Hardware_MEMORYSTRUCTURES, Hydrogen, chemistry, Hardware_GENERAL, business.industry, Doping, Electrical engineering, NAND gate, chemistry.chemical_element, Optoelectronics, business, Boron, Leakage (electronics)
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::a158483b624934401127bf6ec2887fc0
https://doi.org/10.1109/irps.2013.6532092