المؤلفون: Shamanna, M., Fischer, K., Hafez, W., Jiang, L., Kobrinsky, M., Lin, Chung-Hsun, Mistry, K., Natarajan, S., Ramaswamy, R., Sell, B.

المصدر: 2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) Electron Devices Technology & Manufacturing Conference (EDTM), 2024 8th IEEE. :1-3 Mar, 2024

Relation: 2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)

المؤلفون: Hafez, W., Agnihotri, P., Asoro, M., Aykol, M., Bains, B., Bambery, R., Bapna, M., Barik, A., Chatterjee, A., Chiu, P.C., Chu, T., Firby, C., Fischer, K., Fradkin, M., Greve, H., Gupta, A., Haralson, E., Haran, M., Hicks, J., Illa, A., Jang, M., Klopcic, S., Kobrinsky, M., Kuns, B., Lai, H.-h., Lanni, G., Lee, S.-H., Lindert, N., Lo, C.-l., Luo, Y., Malyavanatham, G., Marinkovic, B., Maymon, Y., Nabors, M., Neirynck, J., Packan, P., Paliwal, A., Pantisano, L., Paulson, L., Penmatsa, P., Prasad, C., Puls, C., Rahman, T., Ramaswamy, R., Samant, S., Sell, B., Sethi, K., Shah, F., Shamanna, M., Shang, K., Li, Q., Sibakoti, M., Stoeger, J., Strutt, N., Thirugnanasambandam, R., Tsai, C., Wang, X., Wang, A., Wu, S.-j., Xu, Q., Zhong, X.-h., Natarajan, S.

المصدر: 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) VLSI Technology and Circuits (VLSI Technology and Circuits), 2023 IEEE Symposium on. :1-2 Jun, 2023

Relation: 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)

المؤلفون: Shamanna, M., Abuayob, E., Aenuganti, G., Alvares, C., Antony, J., Bahudhanam, A., Chandran, A., Chew, P., Chatterjee, A., Chauhan, B., Dandeti, N., Desai, J., Doyle, M., Dmukauskas, T., Farache, P., Fetzer, E., Fischer, K., Hack, P., Greenzweig, Y., Giacobbe, J., Hafez, W., Haralson, E., Hegde, A., Illa, A., Islam, M., Jain, S., Jang, M., Nguyen, J., Tong, T., Jiang, L., Karl, E., Kalangi, P., Khoo, G., Krishnamoorthy, A., Kuns, B., Li, W., Livengood, R., Malik, T., Priyanka, R., Faraby, H., Maymon, Y., Mistry, K., Morgan, K., Natarajan, S., Nevo, O., Oh, M., Pardy, P., Park, J., Penmatsa, P., Phelps, B., Peterson, C., Rajappa, S., Raveh, A., Rezaie, A, Ravishankar, T., Ramaswamy, R., Reddy, S., Saha, R., Sen, S., Sanchez, R., Sanaga, R., Simkhovich, B., Sell, B., Senger, M., Schnarch, B., Seshadri, M., Sidorov, O., Subramaniam, S., Subramanian, K., Truong, B., Bangalore, S., Hicks, J., Venkatesh, S., Christensen, D., Bhargav, K., Haartman, M. Von, Joshi, P., Zickel, S., Lin, C-H, Huening, J., Wu, T-H, Bakken, N., Afzal, A., Raman, A., Rao, Sj., Kawar, V., Neirynck, J., Bradley, D., Duwe, M., Wu, S., Patil, V., Bayoumy, M.

المصدر: 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) VLSI Technology and Circuits (VLSI Technology and Circuits), 2023 IEEE Symposium on. :1-2 Jun, 2023

Relation: 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)

المؤلفون: Swed, S., Alibrahim, H., Bohsas, H., Aljabali, A., Almoshantaf, M. B., Sawaf, B., Shoib, S., Patwary, M. M., Albazee, E., Lee, Ka Yiu, Farwati, A., Seijari, M. N., Hafez, W., Rakab, A.

المصدر: IJID Regions. 7:271-276

مصطلحات موضوعية: Awareness, Cross sectional, Healthcare workers, Monkeypox, Syria

وصف الملف: print

URL الوصول: https://urn.kb.se/resolve?urn=urn:nbn:se:miun:diva-48388
https://doi.org/10.1016/j.ijregi.2023.04.008

المؤلفون: Sell, B., An, S., Armstrong, J., Bahr, D., Bains, B., Bambery, R., Bang, K., Basu, D., Bendapudi, S., Bergstrom, D., Bhandavat, R., Bhowmick, S., Buehler, M., Caselli, D., Cekli, S., Chaganti, Vrsk., Chang, Y. J., Chikkadi, K., Chu, T., Crimmins, T., Darby, G., Ege, C., Elfick, P., Elko-Hansen, T., Fang, S., Gaddam, C., Ghoneim, M., Gomez, H., Govindaraju, S., Guo, Z., Hafez, W., Haran, M., Hattendorf, M., Hu, S., Jain, A., Jaloviar, S., Jang, M., Kameswaran, J., Kapinus, V., Kennedy, A., Klopcic, S., Krishnan, D., Leib, J., Lin, Y.-T., Lindert, N., Liu, G., Loh, O., Luo, Y., Mani, S., Mleczko, M., Mocherla, S., Packan, P., Paik, M., Paliwal, A., Pandey, R., Patankar, K., Pipes, L., Plekhanov, P., Prasad, C., Prince, M., Ramalingam, G., Ramaswamy, R., Riley, J., Perez, J. R. Sanchez, Sandford, J., Sathe, A., Shah, F., Shim, H., Subramanian, S., Tandon, S., Tanniru, M., Thakurta, D., Troeger, T., Wang, X., Ward, C., Welsh, A., Wickramaratne, S., Wnuk, J., Xu, S. Q., Yashar, P., Yaung, J., Yoon, K., Young, N.

المصدر: 2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) VLSI Technology and Circuits (VLSI Technology and Circuits), 2022 IEEE Symposium on. :282-283 Jun, 2022

Relation: 2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)

المؤلفون: Swed, S., Alibrahim, H., Bohsas, H., Hafez, W., Rais, M. A., Shoib, S., Albazee, E., Elsayed, M. E. G., Sawaf, B., Farwati, A., Seijari, M. N., Battikh, N., Shaheen, N., Ibrahem, N., Alsaleh, A., Lee, Ka Yiu, Rakab, A.

المصدر: Scientific Reports. 13(1)

وصف الملف: print

URL الوصول: https://urn.kb.se/resolve?urn=urn:nbn:se:miun:diva-48322
https://doi.org/10.1038/s41598-023-32026-4

المؤلفون: Swed, S., El-Sakka, A. A., Abouainain, Y., Lee, Ka Yiu, Sawaf, B., Albuni, M. K., Battikh, E., Ahmad, E. M. S., Elkalagi, N. K. H., Abbas, K. S., Hafez, W., Rakab, A.

المصدر: Scientific Reports. 13(1)

وصف الملف: print

URL الوصول: https://urn.kb.se/resolve?urn=urn:nbn:se:miun:diva-47577
https://doi.org/10.1038/s41598-023-29029-6

المؤلفون: Then, Han Wui, Radosavljevic, M., Agababov, P., Ban, I., Bristol, R., Chandhok, M., Chouksey, S., Holybee, B., Huang, C. Y., Krist, B., Jun, K., Koirala, P., Lin, K., Michaelos, T., Paul, R., Peck, J., Rachmady, W., Staines, D., Talukdar, T., Thomas, N., Tronic, T., Fischer, P., Hafez, W.

المصدر: 2020 IEEE Symposium on VLSI Technology VLSI Technology, 2020 IEEE Symposium on. :1-2 Jun, 2020

Relation: 2020 IEEE Symposium on VLSI Technology

المؤلفون: Prasad, C., Bai, P., Gannavaram, S., Hafez, W., Hicks, J., Jan, C.-H., Lin, J., Jones, M., Komeyli, K., Kotlyar, R., Mistry, K., Post, I., Tsai, C.

المصدر: 2010 IEEE International Reliability Physics Symposium Reliability Physics Symposium (IRPS), 2010 IEEE International. :293-298 May, 2010

Relation: 2010 IEEE International Reliability Physics Symposium (IRPS)

المؤلفون: Lai, J.W., Hafez, W., Feng, M.

المصدر: Proceedings. IEEE Lester Eastman Conference on High Performance Devices, 2004. High Performance Devices High Performance Devices, 2004. Proceedings. IEEE Lester Eastman Conference on. :1-7 2004

Relation: High Performance Devices. Proceedings of the 2004 IEEE Lester Eastman Conference on High Performance Devices