المؤلفون: Yoocheol Shin, Jungdal Choi, Changseok Kang, Changhyun Lee, Ki-Tae Park, Jang-Sik Lee, Sel, J., Viena Kim, Byeongin Choi, Jaesung Sim, Dongchan Kim, Hag-ju Cho, Kinam Kim

المصدر: IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. International Electron Devices Meeting 2005 Electron Devices Meeting, 2005. IEDM Technical Digest. IEEE International. :327-330 2005

Relation: International Electron Devices Meeting 2005

المؤلفون: Se Jong Rhee, Young Hee Kim, Chang Yong Kang, Chang Seok Kang, Hag-Ju Cho, Rino Choi, Chang Hwan Choi, Akbar, M.S., Lee, J.C.

المصدر: 2004 IEEE International Reliability Physics Symposium. Proceedings Reliability physics Reliability Physics Symposium Proceedings, 2004. 42nd Annual. 2004 IEEE International. :269-272 2004

Relation: 2004 IEEE International Reliability Physics Symposium. Proceedings

المؤلفون: Seong Geon Park, Beom Jun Jin, Hye Lan Lee, Hong Bae Park, Taek Soo Jeon, Hag-Ju Cho, Sang Yong Kim, Soo Ik Jang, Sang Bom Kang, Yu Gyun Shin, U-In Chung, Joo Tae Moon

المصدر: IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. Electron devices meeting Electron Devices Meeting, 2004. IEDM Technical Digest. IEEE International. :515-518 2004

Relation: 2004 International Electron Devices Meeting

المؤلفون: Jong-Wook Lee, Sun-Ghil Lee, Young-Pil Kimx, Young-Pil Kim, Chul-Sung Kim, Hag-Ju Cho, Seung-Beom Kim, In-Soo Jung, Deok-Hyung Lee, Dong-Chan Kim, Taek-Soo Jeon, Seong-Geon Park, Hong-Bae Park, Yong-Hoon Son, Young-Eun Lee, Beom-Jun Jin, Hye-Lan Lee, Bon-Young Koo, Sang-Bom Kang, Yu Gyun Shin, U-In Chung, Joo-Tae Moon, Byung-Il Ryu

المصدر: IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. Electron devices meeting Electron Devices Meeting, 2004. IEDM Technical Digest. IEEE International. :1047-1050 2004

Relation: 2004 International Electron Devices Meeting

المؤلفون: Rino Choi, Onishi, K., Chang Seok Kang, Gopalan, S., Renee Nieh, Kim, Y.H., Han, J.H., Krishnan, S., Hag-ju Cho, Shahriar, A., Lee, J.C.

المصدر: Digest. International Electron Devices Meeting, Electron devices meeting Electron Devices Meeting, 2002. IEDM '02. International. :613-616 2002

Relation: IEEE International Electron Devices Meeting

المؤلفون: Nieh, R., Onishi, K., Rino Choi, Hag-Ju Cho, Chang Seok Kang, Gopalan, S., Krishna, S., Lee, J.C.

المصدر: Extended Abstracts of International Workshop on Gate Insulator. IWGI 2001 (IEEE Cat. No.01EX537) Gate insulator Gate Insulator, 2001. IWGI 2001. Extended Abstracts of International Workshop on. :70-74 2001

Relation: Extended Abstracts of International Workshop on Gate Insulator. IWGI 2001

المؤلفون: Byoung Taek Lee, Ki Hoon Lee, Cheol Seong Hwang, Wan Don Kim, Hideki Horii, Hyoun-Woo Kim, Hag-Ju Cho, Chang Seek Kang, Ju Hyuck Chung, Sang In Lee, Moon Yong Lee

المصدر: International Electron Devices Meeting. IEDM Technical Digest Electron Devices Electron Devices Meeting, 1997. IEDM '97. Technical Digest., International. :249-252 1997

Relation: International Electron Devices Meeting. IEDM Technical Digest

المؤلفون: Chang Seok Kang, Hag-Ju Cho, Rino Choi, Young-Hee Kim, Chang Yong Kang, Se Jong Rhee, Changhwan Choi, Akbar, M.S., Lee, J.C.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 51(2):220-227 Feb, 2004

المؤلفون: Onishi, K., Rino Choi, Chang Seok Kang, Hag-Ju Cho, Young Hee Kim, Nieh, R.E., Jeong Han, Krishnan, S.A., Akbar, M.S., Lee, J.C.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 50(6):1517-1524 Jun, 2003

المؤلفون: Nieh, R.E., Chang Seok Kang, Hag-Ju Cho, Onishi, K., Rino Choi, Krishnan, S., Jeong Hee Han, Young-Hee Kim, Akbar, M.S., Lee, J.C.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 50(2):333-340 Feb, 2003