يعرض 1 - 10 نتائج من 22 نتيجة بحث عن '"Haggag, Amr"', وقت الاستعلام: 1.04s تنقيح النتائج
  1. 1
    مؤتمر
    Silent Data Corruptions in Computing: Understand and Quantify

    المؤلفون: Macieira, Thiago, Gurumurthy, Sankar, Gurumurthi, Sudhanva, Haggag, Amr, Papadimitriou, George, Gizopoulos, Dimitris

    المصدر: 2024 IEEE 30th International Symposium on On-Line Testing and Robust System Design (IOLTS) On-Line Testing and Robust System Design (IOLTS), 2024 IEEE 30th International Symposium on. :1-7 Jul, 2024

    Relation: 2024 IEEE 30th International Symposium on On-Line Testing and Robust System Design (IOLTS)

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  2. 2
    مؤتمر
    Protecting against emerging vmin failures in advanced technology nodes

    المؤلفون: Lee, J. K. Jerry, Haggag, Amr, Eklow, William

    المصدر: 2014 International Test Conference Test Conference (ITC), 2014 IEEE International. :1-7 Oct, 2014

    Relation: 2014 IEEE International Test Conference (ITC)

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  3. 3
    مؤتمر
    Product failures: Power-law or exponential voltage dependence?

    المؤلفون: Haggag, Amr, Forbes, Keith, Anderson, Gary, Burnett, Dave, Abramowitz, Peter, Moosa, Mohamed

    المصدر: 2010 IEEE International Reliability Physics Symposium Reliability Physics Symposium (IRPS), 2010 IEEE International. :125-128 May, 2010

    Relation: 2010 IEEE International Reliability Physics Symposium (IRPS)

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  4. 4
    مؤتمر
    Reliability/yield trade-off in mitigating “no trouble found” field returns

    المؤلفون: Haggag, Amr, Sumikawa, Nik, Shaukat, Aamer

    المصدر: 2015 IEEE 21st International On-Line Testing Symposium (IOLTS) On-Line Testing Symposium (IOLTS), 2015 IEEE 21st International. :174-175 Jul, 2015

    Relation: 2015 IEEE 21st International On-Line Testing Symposium (IOLTS)

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  5. 5
    مؤتمر
    Impact of VLSI scaling on die qualification

    المؤلفون: Haggag, Amr, Phillips, Michael, Lee, J.K. Jerry

    المصدر: 2014 IEEE International Reliability Physics Symposium Reliability Physics Symposium, 2014 IEEE International. :3B.5.1-3B.5.3 Jun, 2014

    Relation: 2014 IEEE International Reliability Physics Symposium (IRPS)

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  6. 6
    مؤتمر
    Fast aging degradation rate prediction during production test

    المؤلفون: Wang, Xiaoxiao, Winemberg, LeRoy, Haggag, Amr, Chayachinda, Joe, Saluja, Amandeep, Tehranipoor, Mohammad

    المصدر: 2014 IEEE International Reliability Physics Symposium Reliability Physics Symposium, 2014 IEEE International. :6B.5.1-6B.5.5 Jun, 2014

    Relation: 2014 IEEE International Reliability Physics Symposium (IRPS)

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  7. 7
    مؤتمر
    Component and system effective lifetime & FIT model in advanced technology

    المؤلفون: Lee, J.K. Jerry, Haggag, Amr

    المصدر: 2014 IEEE International Reliability Physics Symposium Reliability Physics Symposium, 2014 IEEE International. :ER.2.1-ER.2.5 Jun, 2014

    Relation: 2014 IEEE International Reliability Physics Symposium (IRPS)

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  8. 8
    مؤتمر
    Product NBTI Distribution and Voltage Dependence - impact of relaxation and droops

    المؤلفون: Haggag, Amr, Liu, Ning, Abramowitz, Peter, Moosa, Mohamed, Anderson, Gary, Burnett, David, Parihar, Sanjay, Abeln, Glenn, Higman, Jack

    المصدر: 2010 IEEE International Reliability Physics Symposium Reliability Physics Symposium (IRPS), 2010 IEEE International. :1115-1116 May, 2010

    Relation: 2010 IEEE International Reliability Physics Symposium (IRPS)

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  9. 9
    مؤتمر
    Qualifying reliable systems from unreliable components

    المؤلفون: Haggag, Amr

    المصدر: 2010 IEEE International Integrated Reliability Workshop Final Report Integrated Reliability Workshop Final Report (IRW), 2010 IEEE International. :85-85 Oct, 2010

    Relation: 2010 IEEE International Integrated Reliability Workshop (IIRW)

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  10. 10
    دورية أكاديمية
    Accuracy of transcerebellar diameter in comparison with biparietal diameter, femur length, and fetal kidney length in the sonographic assessment of gestational age in the third trimester of pregnancy.

    المؤلفون: Haggag, Amr, Hamisa, Manal, Elsayed-Atallah, Walid, Marie, Safaa

    المصدر: Tanta Medical Journal; Jul-Sep2022, Vol. 50 Issue 3, p199-203, 5p

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