المؤلفون: Hilmers, Torben, Leroy, Benjamin M.L., Bae, Soyeon, Hahn, W. Andreas, Hochrein, Sophia, Jacobs, Martin, Lemme, Hannes, Müller, Jörg, Schmied, Gerhard, Weisser, Wolfgang W., Pretzsch, Hans

المصدر: In Forest Ecology and Management 1 December 2023 549

المؤلفون: Hahn, W., Lentali, J. -M., Polovodov, P., Young, N., Nakamura, S., Speck, J. S., Weisbuch, C., Filoche, M., Wu, Y-R., Piccardo, M., Maroun, F., Martinelli, L., Lassailly, Y., Peretti, J.

المصدر: Phys. Rev. B 98, 045305 (2018)

مصطلحات موضوعية: Condensed Matter - Mesoscale and Nanoscale Physics, Condensed Matter - Disordered Systems and Neural Networks, Condensed Matter - Materials Science

URL الوصول: http://arxiv.org/abs/1805.09030

المؤلفون: Jeong, W., Im, J.-w., Kim, D.-H., Nam, S.-W., Shim, D.-K., Choi, M.-H., Yoon, H.-J., Kim, Y.-S., Park, H.-W., Kwak, D.-H., Park, S.-W., Yoon, S.-M., Hahn, W.-G., Ryu, J.-H., Shim, S.-W., Kang, K.-T., Ihm, J.-D., Kim, I.-M., Lee, D.-S., Cho, J.-H., Kim, M.-S., Jang, J.-H., Hwang, S.-W., Byeon, D.-S., Yang, H.-J., Park, K., Kyung, K.-H., Choi, J.-H.

المصدر: IEEE Journal of Solid-State Circuits IEEE J. Solid-State Circuits Solid-State Circuits, IEEE Journal of. 51(1):204-212 Jan, 2016

المؤلفون: Hahn, W., Gajic, B.

المصدر: 2015 18th International Conference on Intelligence in Next Generation Networks Intelligence in Next Generation Networks (ICIN), 2015 18th International Conference on. :16-22 2015

Relation: 2015 18th International Conference on Intelligence in Next Generation Networks (ICIN)

المؤلفون: Jeon, J., Park, I. H., Kang, M., Hahn, W., Choi, K., Yun, S., Yang, G.-Y., Lee, K.-H., Park, Y.-K., Chung, C.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 59(12):3503-3509 Dec, 2012

المؤلفون: Kang, M., Hahn, W., Park, I. H., Park, J., Song, Y., Lee, H., Eun, C., Ju, S., Choi, K., Lim, Y., Jang, S., Cho, S., Park, B.-G., Shin, H.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 58(10):3626-3629 Oct, 2011

المؤلفون: Hahn, W., Hagerer, A., Kandlbinder, R.

المصدر: Proceedings of the Fourth Asian Test Symposium Asian test symposium Test Symposium, 1995., Proceedings of the Fourth Asian. :107-111 1995

Relation: Proceedings of the Fourth Asian Test Symposium

المؤلفون: Hahn, W., Hagerer, A.

المصدر: Proceedings of IEEE 3rd Asian Test Symposium (ATS) Asian test symposium Test Symposium, 1994., Proceedings of the Third Asian. :8-13 1994

Relation: Proceedings of IEEE 3rd Asian Test Symposium (ATS)

المؤلفون: Kirchner, C.W., Hagerer, A., Hahn, W.

المصدر: Proceedings of the Twenty-Fifth Hawaii International Conference on System Sciences System Sciences, 1992. Proceedings of the Twenty-Fifth Hawaii International Conference on. i:277-286 vol.1 1992

Relation: Proceedings of the Twenty-Fifth Hawaii International Conference on System Sciences

المؤلفون: Hahn, W., Gossel, M.

المصدر: Digest of Papers 1991 VLSI Test Symposium 'Chip-to-System Test Concerns for the 90's VLSI Test Symposium, 1991. 'Chip-to-System Test Concerns for the 90's', Digest of Papers. :161-165 1991

Relation: Digest of Papers 1991 VLSI Test Symposium 'Chip-to-System Test Concerns for the 90's