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1تقرير
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2
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3تقرير
المؤلفون: Sleeman, Jennifer, Chung, David, Ashcraft, Chace, Brett, Jay, Gnanadesikan, Anand, Kevrekidis, Yannis, Hughes, Marisa, Haine, Thomas, Pradal, Marie-Aude, Gelderloos, Renske, Tang, Caroline, Saksena, Anshu, White, Larry
مصطلحات موضوعية: Computer Science - Artificial Intelligence, Computer Science - Computational Engineering, Finance, and Science
URL الوصول: http://arxiv.org/abs/2302.06852
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4دورية أكاديمية
المؤلفون: Weijer, Wilbert, Haine, Thomas W.N., Siddiqui, Ali H., Cheng, Wei, Veneziani, Milena, Kurtakoti, Prajvala
المصدر: Oceanography, 2022 Dec 01. 35(3/4), 118-127.
URL الوصول: https://www.jstor.org/stable/27182704
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5دورية أكاديمية
المؤلفون: Weingartner, Thomas, Ashjian, Carin, Brigham, Lawson, Haine, Thomas, Mack, Liza, Perovich, Don, Rabe, Benjamin
المصدر: Oceanography, 2022 Dec 01. 35(3/4), 6-9.
URL الوصول: https://www.jstor.org/stable/27182689
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6تقرير
المؤلفون: Jimenez-Urias, Miguel A., Haine, Thomas W. N.
مصطلحات موضوعية: Physics - Fluid Dynamics
URL الوصول: http://arxiv.org/abs/2101.05406
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7مؤتمر
المؤلفون: Haine, Thomas, Segers, Johan, Flandre, Denis, Bol, David
المصدر: 2018 Design, Automation & Test in Europe Conference & Exhibition (DATE) Design, Automation & Test in Europe Conference & Exhibition (DATE), 2018. :195-200 Mar, 2018
Relation: 2018 Design, Automation & Test in Europe Conference & Exhibition (DATE)
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8مؤتمر
المؤلفون: Bol, David, Schramme, Maxime, Moreau, Ludovic, Haine, Thomas, Xu, Pengcheng, Frenkel, Charlotte, Dekimpe, Remi, Stas, Francois, Flandre, Denis
المصدر: 2019 IEEE International Solid-State Circuits Conference - (ISSCC) Solid-State Circuits Conference - (ISSCC), 2019 IEEE International. :322-324 Feb, 2019
Relation: 2019 IEEE International Solid-State Circuits Conference - (ISSCC)
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9مؤتمر
المؤلفون: Haine, Thomas, Nguyen, Quoc-Khoi, Stas, Francois, Moreau, Ludovic, Flandre, Denis, Bol, David
المصدر: ESSCIRC 2017 - 43rd IEEE European Solid State Circuits Conference. :312-315 Sep, 2017
Relation: ESSCIRC 2017 - 43rd IEEE European Solid State Circuits Conference (ESSCIRC)
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10مؤتمر
المؤلفون: Haine, Thomas, Flandre, Denis, Bol, David
المصدر: 2018 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S), 2018 IEEE. :1-3 Oct, 2018
Relation: 2018 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S)