يعرض 1 - 10 نتائج من 10 نتيجة بحث عن '"Halbach, Ralph"', وقت الاستعلام: 1.08s تنقيح النتائج
  1. 1
    مؤتمر
    Maximizing ESD robustness of current-mode-logic (CML) driver with internal gate bias network

    المؤلفون: Li, You, Di Sarro, James, Chang, Shunhua, Li, Junjun, Gauthier, Robert, Halbach, Ralph

    المصدر: 2013 35th Electrical Overstress/Electrostatic Discharge Symposium Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2013 35th. :1-8 Sep, 2013

    Relation: 2013 35th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)

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  2. 2
    مؤتمر
    Identification and verification of BEOL metal fails due to ESD stress using current density analysis tool

    المؤلفون: Mitra, Souvick, Palmer, Nicholas, Muhammad, Mujahid, Gauthier, Robert, Halbach, Ralph, Seguin, Chris

    المصدر: 2013 35th Electrical Overstress/Electrostatic Discharge Symposium Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2013 35th. :1-6 Sep, 2013

    Relation: 2013 35th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)

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  3. 3
    مؤتمر
    A current density analysis tool to identify BEOL fails under ESD stress

    المؤلفون: Mitra, Souvick, Palmer, Nicholas, Gauthier, Robert, Muhammad, Mujahid, Halbach, Ralph, Seguin, Chris

    المصدر: EOS/ESD Symposium Proceedings Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2011 33rd. :1-6 Sep, 2011

    Relation: 2011 33rd Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)

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  4. 4
    مؤتمر
    Maximizing ESD design window by optimizing gate bias for cascoded drivers in 45nm and beyond SOI technologies

    المؤلفون: Mitra, Souvick, Gauthier, Robert, Chang, Shunhua, Li, Junjun, Halbach, Ralph, Seguin, Chris

    المصدر: Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2010 Electrical Overstress/ Electrostatic Discharge Symposium (EOS/ESD), 2010 32nd. :1-6 Oct, 2010

    Relation: 2010 32nd Electrical Overstress/ Electrostatic Discharge Symposium (EOS/ESD)

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  5. 5
    مؤتمر
    Impact of stress engineering on high-k metal gate ESD diodes in 32nm SOI technology

    المؤلفون: Mitra, Souvick, Gauthier, Robert, Putnam, Chris S, Halbach, Ralph, Seguin, Chris

    المصدر: 2009 31st EOS/ESD Symposium EOS/ESD Symposium, 2009 31st. :1-7 Aug, 2009

    Relation: 2009 31st Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)

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  6. 6
    مؤتمر
    ESD protection using grounded gate, gate non-silicided (GG-GNS) ESD NFETs in 45nm SOI technology

    المؤلفون: Mitra, Souvick, Gauthier, Robert, Li, Junjun, Abou-Khalil, Michel, Putnam, Chris S, Halbach, Ralph, Seguin, Christopher

    المصدر: EOS/ESD 2008 - 2008 30th Electrical Overstress/Electrostatic Discharge Symposium Electrical Overstress/Electrostatic Discharge Symposium, 2008. EOS/ESD 2008. 30th. :312-316 Sep, 2008

    Relation: 2008 30th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)

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  7. 7
    مؤتمر
    Design optimization of gate-silicided ESD NMOSFETs in a 45nm bulk CMOS technology

    المؤلفون: Alvarez, David, Chatty, Kiran, Russ, Christian, Abou-Khalil, Michel J., Li, Junjun, Gauthier, Robert, Esmark, Kai, Halbach, Ralph, Seguin, Christopher

    المصدر: 2007 29th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) 29th Electrical Overstress/Electrostatic Discharge Symposium, 2007. EOS/ESD. :1A.4-1-1A.4-9 Sep, 2007

    Relation: 2007 29th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)

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  8. 8
    مؤتمر
    Capacitance investigation of diodes and SCRs for ESD protection of high frequency circuits in sub-100nm bulk CMOS technologies

    المؤلفون: Li, Junjun, Gauthier, Robert, Chatty, Kiran, Mitra, Souvick, Hongmei Li, Xingle Wang, Halbach, Ralph, Seguin, Christopher

    المصدر: 2007 29th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) 29th Electrical Overstress/Electrostatic Discharge Symposium, 2007. EOS/ESD. :4A.2-1-4A.2-7 Sep, 2007

    Relation: 2007 29th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)

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  9. 9
    مؤتمر
    Design and characterization of a multi-RC-triggered MOSFET-based power clamp for on-chip ESD protection

    المؤلفون: Li, Junjun, Gauthier, Robert, Mitra, Souvick, Putnam, Christopher, Chatty, Kiran, Halbach, Ralph, Seguin, Christopher

    المصدر: 2006 Electrical Overstress/Electrostatic Discharge Symposium Electrical Overstress/Electrostatic Discharge Symposium, 2006. EOS/ESD '06.. :179-185 Sep, 2006

    Relation: 2006 Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)

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  10. 10
    دورية أكاديمية

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