المؤلفون: Chae, Dong-Hun, Park, Jaesung, Shin, Seong Su

المصدر: 2024 Conference on Precision Electromagnetic Measurements (CPEM) Precision Electromagnetic Measurements (CPEM), 2024 Conference on. :1-2 Jul, 2024

Relation: 2024 Conference on Precision Electromagnetic Measurements (CPEM)

المؤلفون: Tanarom, Jutarat, Kurupakorn, Chatchaval, Tangsupaktada, Supachai, Detudom, Piyaporn, Jassadajin, Chaiwat, Homklintian, Monthol

المصدر: 2023 20th International Conference on Electrical Engineering/Electronics, Computer, Telecommunications and Information Technology (ECTI-CON) Electrical Engineering/Electronics, Computer, Telecommunications and Information Technology (ECTI-CON), 2023 20th International Conference on. :1-4 May, 2023

Relation: 2023 20th International Conference on Electrical Engineering/Electronics, Computer, Telecommunications and Information Technology (ECTI-CON)

المؤلفون: Jarrett, D.G., Yeh, C., Payagala, S.U., Panna, A.R., Yang, Y., Meng, L., Mhatre, S.M., Tran, N.T.M., Hill, H.M., Saha, D., Elmquist, R.E., Newell, D.B., Rigosi, A.F.

المصدر: IEEE Transactions on Instrumentation and Measurement IEEE Trans. Instrum. Meas. Instrumentation and Measurement, IEEE Transactions on. 72:1-10 2023

المؤلفون: Yang, Z., Lu, Y., Zhao, J., Yang, H., He, Q.

المصدر: IEEE Transactions on Instrumentation and Measurement IEEE Trans. Instrum. Meas. Instrumentation and Measurement, IEEE Transactions on. 72:1-7 2023

المؤلفون: Schurr, J., Lee, J.

المصدر: IEEE Transactions on Instrumentation and Measurement IEEE Trans. Instrum. Meas. Instrumentation and Measurement, IEEE Transactions on. 71:1-8 2022

المؤلفون: Kruskopf, M., Bauer, S., Pimsut, Y., Chatterjee, A., Patel, D.K., Rigosi, A.F., Elmquist, R.E., Pierz, K., Pesel, E., Gotz, M., Schurr, J.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 68(7):3672-3677 Jul, 2021

المؤلفون: Payagala, S.U., Rigosi, A.F., Panna, A.R., Pollarolo, A., Kruskopf, M., Schlamminger, S., Jarrett, D.G., Brown, R., Elmquist, R.E., Brown, D., Newell, D.B.

المصدر: IEEE Transactions on Instrumentation and Measurement IEEE Trans. Instrum. Meas. Instrumentation and Measurement, IEEE Transactions on. 69(12):9374-9380 Dec, 2020

المؤلفون: Oe, T., Rigosi, A.F., Kruskopf, M., Wu, B., Lee, H., Yang, Y., Elmquist, R.E., Kaneko, N., Jarrett, D.G.

المصدر: IEEE Transactions on Instrumentation and Measurement IEEE Trans. Instrum. Meas. Instrumentation and Measurement, IEEE Transactions on. 69(6):3103-3108 Jun, 2020

المؤلفون: Burger, Paul, Singh, G., Johansson, Christer, Moya, Carlos, Bruylants, Gilles, Jakob, Gerhard, Kalaboukhov, Alexei

المصدر: ACS Nano. 16(11):19253-19260

مصطلحات موضوعية: atomic force microscopy, Hall magnetometry, LAO-STO interface, magnetic nanoparticles, nanomanipulation, oxide heterointerfaces, Aluminum compounds, Hysteresis, Hysteresis loops, Lanthanum compounds, Magnetic moments, Magnetic storage, Magnetite, Magnetization, Magnetometry, Nanomagnetics, Nanoparticles, Phase interfaces, Strontium titanates, Two dimensional electron gas, Atomic force, Atomic-force-microscopy, Hall resistance, Hetero-interfaces, Nanomanipulations, Oxide heterointerface, Spin-based electronics, Topdown, Titanium compounds

وصف الملف: print

URL الوصول: https://urn.kb.se/resolve?urn=urn:nbn:se:ri:diva-61186
https://doi.org/10.1021/acsnano.2c08622

المؤلفون: Kruskopf, M., Rigosi, A.F., Panna, A.R., Patel, D.K., Jin, H., Marzano, M., Berilla, M., Newell, D.B., Elmquist, R.E.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 66(9):3973-3977 Sep, 2019