المؤلفون: Renaudin, T., Joly, J., Hamon, B., Tothe, B.

المصدر: 2016 22nd International Workshop on Thermal Investigations of ICs and Systems (THERMINIC) Thermal Investigations of ICs and Systems (THERMINIC), 2016 22nd International Workshop on. :187-193 Sep, 2016

Relation: 2016 22nd International Workshop on Thermal Investigations of ICs and Systems (THERMINIC)

المؤلفون: van Driel, W.D., Schuld, M., Jacobs, B., Commissaris, F., van der Eyden, J., Hamon, B.

المصدر: 2015 16th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE), 2015 16th International Conference on. :1-5 Apr, 2015

Relation: 2015 16th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE)

المؤلفون: Hamon, B.^Aff6, Merelle, T.^Aff7, Bataillou, B.^Aff7

المساهمون: Zhang, Guo Qi, Series editor^{Aff1, Aff5}, Ling, Wu, Editor^Aff2, van Driel, Willem Dirk, editor^Aff3, Fan, Xuejun, editor^Aff4

المصدر: Solid State Lighting Reliability Part 2 : Components to Systems. 3:49-75

المؤلفون: Hamon, B., Bataillou, B., Mendizabal, L., Gasse, A., Feuillet, G.

المصدر: 2014 IEEE International Reliability Physics Symposium Reliability Physics Symposium, 2014 IEEE International. :FA.1.1-FA.1.6 Jun, 2014

Relation: 2014 IEEE International Reliability Physics Symposium (IRPS)

المؤلفون: Hamon, B., van Driel, W.D.

المصدر: In Microelectronics Reliability September 2016 64:599-604

المؤلفون: van Driel, W.D., Schuld, M., Jacobs, B., Commissaris, F., van der Eyden, J., Hamon, B.

المصدر: In Microelectronics Reliability July 2016 62:39-44

المؤلفون: Hamon, B. V.

جغرافية الموضوع: Murramarang (Australia) -- History., Kioloa (N.S.W.) -- History., Bawley Point (Australia) -- History., Kioloa (Australia) -- History.

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المؤلفون: Hamon, B. V., Hannan, E. J.

المصدر: Journal of the Royal Statistical Society. Series C (Applied Statistics), 1974 Jan 01. 23(2), 134-142.

URL الوصول: https://www.jstor.org/stable/2346994

المؤلفون: Métais, I., Hamon, B., Jalouzot, R., Peltier, D.

المصدر: Theoretical and Applied Genetics: International Journal of Plant Breeding Research. June 2002 104(8):1346-1352