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1مؤتمر
المؤلفون: Renaudin, T., Joly, J., Hamon, B., Tothe, B.
المصدر: 2016 22nd International Workshop on Thermal Investigations of ICs and Systems (THERMINIC) Thermal Investigations of ICs and Systems (THERMINIC), 2016 22nd International Workshop on. :187-193 Sep, 2016
Relation: 2016 22nd International Workshop on Thermal Investigations of ICs and Systems (THERMINIC)
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2مؤتمر
المؤلفون: van Driel, W.D., Schuld, M., Jacobs, B., Commissaris, F., van der Eyden, J., Hamon, B.
المصدر: 2015 16th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE), 2015 16th International Conference on. :1-5 Apr, 2015
Relation: 2015 16th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE)
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3كتاب إلكتروني
المؤلفون: Hamon, B.Aff6, Merelle, T.Aff7, Bataillou, B.Aff7
المساهمون: Zhang, Guo Qi, Series editorAff1, Aff5, Ling, Wu, EditorAff2, van Driel, Willem Dirk, editorAff3, Fan, Xuejun, editorAff4
المصدر: Solid State Lighting Reliability Part 2 : Components to Systems. 3:49-75
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4مؤتمر
المؤلفون: Hamon, B., Bataillou, B., Mendizabal, L., Gasse, A., Feuillet, G.
المصدر: 2014 IEEE International Reliability Physics Symposium Reliability Physics Symposium, 2014 IEEE International. :FA.1.1-FA.1.6 Jun, 2014
Relation: 2014 IEEE International Reliability Physics Symposium (IRPS)
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5دورية أكاديمية
المؤلفون: Hamon, B., van Driel, W.D.
المصدر: In Microelectronics Reliability September 2016 64:599-604
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6دورية أكاديمية
المؤلفون: van Driel, W.D., Schuld, M., Jacobs, B., Commissaris, F., van der Eyden, J., Hamon, B.
المصدر: In Microelectronics Reliability July 2016 62:39-44
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7
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8دورية أكاديمية
لا يتم عرض هذه النتيجة على الضيوف.
تسجيل الدخول للوصول الكامل. -
9دورية أكاديمية
المؤلفون: Hamon, B. V., Hannan, E. J.
المصدر: Journal of the Royal Statistical Society. Series C (Applied Statistics), 1974 Jan 01. 23(2), 134-142.
URL الوصول: https://www.jstor.org/stable/2346994
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10دورية أكاديمية
المؤلفون: Métais, I., Hamon, B., Jalouzot, R., Peltier, D.
المصدر: Theoretical and Applied Genetics: International Journal of Plant Breeding Research. June 2002 104(8):1346-1352