المؤلفون: Su Chang Jeon, Han Sung Joo, Bongyong Lee, Joong-Seon Choe, Yong Hwan Kwon, Ilgu Yun

المصدر: IEEE/CPMT/SEMI 29th International Electronics Manufacturing Technology Symposium (IEEE Cat. No.04CH37585) Electronics manufacturing technology Electronics Manufacturing Technology Symposium, 2004. IEEE/CPMT/SEMI 29th International. :100-105 2004

Relation: IEEE/CPMT/SEMI 29th International Electronics Manufacturing Technology Symposium

المؤلفون: HAN Sung-Joo

المساهمون: Institut Français des Relations Internationales

المصدر: Politique étrangère 58(4):1045-1054

URL الوصول: http://www.persee.fr/doc/polit_0032-342X_1993_num_58_4_5909

المؤلفون: Han Sung Joo, Su Chang Jeon, Bongyong Lee, Hongil Yoon, Yong Hwan Kwon, Joong-Seon Choe, Yun, I.

المصدر: IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 5(2):262-267 Jun, 2005

المؤلفون: Uksong Kang, Hoe-Ju Chung, Seongmoo Heo, Soon-Hong Ahn, Hoon Lee, Soo-Ho Cha, Jaesung Ahn, DukMin Kwon, Jin Ho Kim, Jae-Wook Lee, Han-Sung Joo, Woo-Seop Kim, Hyun-Kyung Kim, Eun-Mi Lee, So-Ra Kim, Keum-Hee Ma, Dong-Hyun Jang, Nam-Seog Kim, Man-Sik Choi, Sae-Jang Oh, Jung-Bae Lee, Tae-Kyung Jung, Jei-Hwan Yoo, Changhyun Kim

المصدر: 2009 IEEE International Solid-State Circuits Conference - Digest of Technical Papers Solid-State Circuits Conference - Digest of Technical Papers, 2009. ISSCC 2009. IEEE International. :130-131,131a Feb, 2009

Relation: 2009 IEEE International Solid-State Circuits Conference - (ISSCC)

المؤلفون: Ki-Whan Song, Hoon Jeong, Jae-Wook Lee, Sung In Hong, Nam-Kyun Tak, Young-Tae Kim, Yong Lack Choi, Han Sung Joo, Sung Hwan Kim, Ho Ju Song, Yong Chul Oh, Woo-Seop Kim, Yeong-Taek Lee, Kyungseok Oh, Changhyun Kim

المصدر: 2008 IEEE International Electron Devices Meeting Electron Devices Meeting, 2008. IEDM 2008. IEEE International. :1-4 Dec, 2008

Relation: 2008 IEEE International Electron Devices Meeting (IEDM)

المؤلفون: Han Sung Joo, Su Chang Jeon, Bongyong Lee, Yong Hwan Kwon, Joong-Seon Choe, Ilgu Yun

المصدر: International Meeting for Future of Electron Devices, 2004. Future of Electron Devices Future of Electron Devices, 2004. International Meeting for. :73-74 2004

Relation: International Meeting for Future of Electron Devices, Kansai

المؤلفون: Han, Sung-Joo

المساهمون: Park, Kyung-Ae, editor^Aff1, Kim, Dalchoong, editor^Aff2

المصدر: Korean Security Dynamics in Transition. :191-203

المؤلفون: Han, Sung-Joo

المصدر: Journal of East Asian Studies, 2002 Feb 01. 2(1), 165-184.

URL الوصول: https://www.jstor.org/stable/23417716

المؤلفون: Han, Sung-Joo

المصدر: Journal of East Asian Studies, 2001 Feb 01. 1(1), 155-178.

URL الوصول: https://www.jstor.org/stable/23417865

المؤلفون: Han, Sung-Joo

المصدر: Survival. 2001-ed-00 42(4):85-95

مصطلحات موضوعية: KOREA (NORTH) - Foreign Relations - Korea (South), KOREA (SOUTH) - Foreign Relations - Korea (North), INTERNATIONAL RELATIONS, KOREA (NORTH) - Foreign Relations - United States, KOREA (SOUTH) - Foreign Relations - United States

URL الوصول: http://www.dtic.mil/dtic/aulimp/citations/gsa/2001_112382/78972.html