-
1دورية أكاديمية
المؤلفون: Tim Böckendorf, Jan Kirschbaum, Felix Kipke, Dominique Bougeard, John Lundsgaard Hansen, Arne Nylandsted Larsen, Matthias Posselt, Hartmut Bracht
المصدر: AIP Advances, Vol 14, Iss 6, Pp 065129-065129-8 (2024)
وصف الملف: electronic resource
Relation: https://doaj.org/toc/2158-3226
-
2دورية أكاديمية
المؤلفون: Matthias Posselt, Hartmut Bracht, Mahdi Ghorbani-Asl, Drazen Radić
المصدر: AIP Advances, Vol 12, Iss 11, Pp 115325-115325-11 (2022)
وصف الملف: electronic resource
Relation: https://doaj.org/toc/2158-3226
-
3دورية أكاديمية
المؤلفون: Slawomir Prucnal, Maciej O Liedke, Xiaoshuang Wang, Maik Butterling, Matthias Posselt, Joachim Knoch, Horst Windgassen, Eric Hirschmann, Yonder Berencén, Lars Rebohle, Mao Wang, Enrico Napolitani, Jacopo Frigerio, Andrea Ballabio, Giovani Isella, René Hübner, Andreas Wagner, Hartmut Bracht, Manfred Helm, Shengqiang Zhou
المصدر: New Journal of Physics, Vol 22, Iss 12, p 123036 (2020)
مصطلحات موضوعية: germanium, vacancies, doping, positron annihilation lifetime spectroscopy, flash lamp annealing, Science, Physics, QC1-999
وصف الملف: electronic resource
Relation: https://doaj.org/toc/1367-2630
-
4دورية أكاديمية
المؤلفون: Anton Plech, Bärbel Krause, Tilo Baumbach, Margarita Zakharova, Soizic Eon, Caroline Girmen, Gernot Buth, Hartmut Bracht
المصدر: Nanomaterials, Vol 9, Iss 4, p 501 (2019)
مصطلحات موضوعية: thin films, multilayers, thermal conductivity, thermal expansion, laser heating, synchrotron pump-probe powder scattering, Chemistry, QD1-999
وصف الملف: electronic resource
-
5دورية أكاديمية
المؤلفون: Manuel Radek, Bartosz Liedke, Bernd Schmidt, Matthias Voelskow, Lothar Bischoff, John Lundsgaard Hansen, Arne Nylandsted Larsen, Dominique Bougeard, Roman Böttger, Slawomir Prucnal, Matthias Posselt, Hartmut Bracht
المصدر: Materials, Vol 10, Iss 7, p 813 (2017)
مصطلحات موضوعية: silicon, germanium, ion beam, atomic mixing, thermal spike, radiation enhanced diffusion, amorphization, recrystallization, molecular dynamics, Technology, Electrical engineering. Electronics. Nuclear engineering, TK1-9971, Engineering (General). Civil engineering (General), TA1-2040, Microscopy, QH201-278.5, Descriptive and experimental mechanics, QC120-168.85
وصف الملف: electronic resource
-
6دورية أكاديمية
المؤلفون: Dr. Annika Buchheit, Britta Teßmer, Dr. Marina Muñoz‐Castro, Prof. Hartmut Bracht, Prof. Hans‐Dieter Wiemhöfer
المصدر: ChemistryOpen, Vol 10, Iss 3, Pp 340-346 (2021)
مصطلحات موضوعية: electrochromism, infrared, proton intercalation, thin films, vanadium pentoxide, Chemistry, QD1-999
وصف الملف: electronic resource
Relation: https://doaj.org/toc/2191-1363
-
7
المؤلفون: Dražen Radić, Martin Peterlechner, Matthias Posselt, Hartmut Bracht
المصدر: Microscopy and Microanalysis 29(2023), 189-195
مصطلحات موضوعية: diffraction mapping, energy filtering, amorphous germanium, medium range order, Instrumentation, fluctuation electron microscopy
وصف الملف: application/pdf
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::92e94c0d3d1f3949a04ed05d9414e865
https://www.hzdr.de/publications/Publ-36147-1 -
8
المؤلفون: Dražen Radić, Martin Peterlechner, Matthias Posselt, Hartmut Bracht
المصدر: Microscopy and Microanalysis 29(2023), 477-489
مصطلحات موضوعية: amorphous germanium, medium-range order, amorphous silicon, Instrumentation, fluctuation electron microscopy
وصف الملف: application/pdf
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::17953b4c4b33b537feb602dd0d6e432f
https://www.hzdr.de/publications/Publ-36691-1 -
9
المؤلفون: Dražen Radić, Martin Peterlechner, Matthias Posselt, Hartmut Bracht
المصدر: Microscopy and Microanalysis 28(2022), 2036-2046
مصطلحات موضوعية: diffraction mapping, beam damage, medium-range order, amorphous silicon, Instrumentation, fluctuation electron microscopy
وصف الملف: application/pdf
-
10
المؤلفون: Hartmut Bracht, Martin Peterlechner, Dražen Radić
المصدر: Microscopy and Microanalysis. 27:828-834
مصطلحات موضوعية: 010302 applied physics, Fabrication, Materials science, Ion beam, business.industry, Electron energy loss spectroscopy, 02 engineering and technology, 021001 nanoscience & nanotechnology, Chip, 01 natural sciences, Focused ion beam, law.invention, law, Transmission electron microscopy, 0103 physical sciences, Optoelectronics, Sample preparation, Electron microscope, 0210 nano-technology, business, Instrumentation