المؤلفون: Yamamoto, S., Sasaki, Y., Zhao, Y., Kuwana, A., Katoh, K., Zhang, Z., Wei, J., Tran, T.M., Katayama, S., Sato, K., Ishida, T., Okamoto, T., Ichikawa, T., Nakatani, T., Hatayama, K., Kobayashi, H.

المصدر: IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 22(2):142-153 Jun, 2022

المؤلفون: Jiang, R., Li, C., Yang, M., Kobayashi, H., Ozawa, Y., Tsukiji, N., Hirano, M., Shiota, R., Hatayama, K.

المصدر: 2016 IEEE 21st International Mixed-Signal Testing Workshop (IMSTW) Mixed-Signal Testing Workshop (IMSTW), 2016 IEEE 21st International. :1-6 Jul, 2016

Relation: 2016 IEEE 21st International Mixed-Signal Testing Workshop (IMSTW)

المؤلفون: Sato, Y., Sato, M., Tsutsumida, K., Kawashima, M., Hatayama, K., Nomoto, K.

المصدر: Proceedings of the ASP-DAC Asia and South Pacific Design Automation Conference, 2003. Design automation conference Design Automation Conference, 2003. Proceedings of the ASP-DAC 2003. Asia and South Pacific. :763-768 2003

Relation: Conference of Asia and South Pacific Design Automation 2003

المؤلفون: Hatayama, K., Nakao, M., Sato, Y.

المصدر: Proceedings of the 11th Asian Test Symposium, 2002. (ATS '02). Asian test symposium Test Symposium, 2002. (ATS '02). Proceedings of the 11th Asian. :292-297 2002

Relation: Eleventh Asian Test Symposium

المؤلفون: Hatayama, K., Nakao, M., Kiyoshige, Y., Natsume, K., Sato, Y., Nagumo, T.

المصدر: Proceedings. International Test Conference International test conference Test Conference, 2002. Proceedings. International. :1003-1012 2002

Relation: International Test Conference

المؤلفون: Nakao, M., Kiyoshige, Y., Hatayama, K., Sato, Y., Nagumo, T.

المصدر: Proceedings 10th Asian Test Symposium Asian test symposium Test Symposium, 2001. Proceedings. 10th Asian. :244-249 2001

Relation: Tenth Asian Test Symposium

المؤلفون: Nakao, M., Kobayashi, S., Hatayama, K., Iijima, K., Terada, S.

المصدر: International Test Conference 1999. Proceedings (IEEE Cat. No.99CH37034) International test conference Test Conference, 1999. Proceedings. International. :348-357 1999

Relation: Proceedings of IEEE Computer Society International Test Conference (ICSM'99)

المؤلفون: Hatayama, K., Ikeda, M., Takakura, M., Uchiyama, S., Sakamoto, Y.

المصدر: Proceedings Sixth Asian Test Symposium (ATS'97) Test symposium Test Symposium, 1997. (ATS '97) Proceedings., Sixth Asian. :112-115 1997

Relation: Proceedings Sixth Asian Test Symposium (ATS'97)

المؤلفون: Nakao, M., Hatayama, K., Higashi, I.

المصدر: Proceedings Sixth Asian Test Symposium (ATS'97) Test symposium Test Symposium, 1997. (ATS '97) Proceedings., Sixth Asian. :359-364 1997

Relation: Proceedings Sixth Asian Test Symposium (ATS'97)

المؤلفون: Hatayama, K., Hikone, K., Miyazaki, T., Yamada, H.

المصدر: Proceedings. 15th IEEE VLSI Test Symposium (Cat. No.97TB100125) VLSI test VLSI Test Symposium, 1997., 15th IEEE. :17-22 1997

Relation: Proceedings. 15th IEEE VLSI Test Symposium (Cat. No.97TB100125)