-
1مؤتمر
المؤلفون: Masuda, T., Saito, Y., Kumazawa, T., Hatayama, T., Harada, S.
المصدر: 2018 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2018 IEEE International. :8.1.1-8.1.4 Dec, 2018
Relation: 2018 IEEE International Electron Devices Meeting (IEDM)
-
2مؤتمر
المؤلفون: Uraoka, Y., Hirai, N., Yano, H., Hatayama, T., Fuyuki, T.
المصدر: International Conference on Microelectronic Test Structures, 2003. Microelectronic test structures Microelectronic Test Structures, 2003. International Conference on. :173-177 2003
Relation: ICMTS 2002. Proceedings of the 2003 International Conference on Microelectronic Test Structures
-
3مؤتمر
المؤلفون: Uraoka, Y., Hirai, N., Yano, H., Hatayama, T., Fuyuki, T.
المصدر: Digest. International Electron Devices Meeting, Electron devices meeting Electron Devices Meeting, 2002. IEDM '02. International. :577-580 2002
Relation: IEEE International Electron Devices Meeting
-
4مؤتمر
المؤلفون: Uraoka, Y., Hatayama, T., Fuyuki, T., Kawamura, T., Tsuchihashi, Y.
المصدر: ICMTS 2001. Proceedings of the 2001 International Conference on Microelectronic Test Structures (Cat. No.01CH37153) Microelectronic test structures Microelectronic Test Structures, 2001. ICMTS 2001. Proceedings of the 2001 International Conference on. :251-256 2001
Relation: ICMTS 2001. Proceedings of the 2001 International Conference on Microelectronic Test Structures
-
5مؤتمر
المؤلفون: Ishikawa, Y., Yamamoto, Y., Hatayama, T., Uraoka, Y., Fuyuki, T.
المصدر: Conference Record of the Twenty-Eighth IEEE Photovoltaic Specialists Conference - 2000 (Cat. No.00CH37036) Photovoltaic specialist conference Photovoltaic Specialists Conference, 2000. Conference Record of the Twenty-Eighth IEEE. :280-283 2000
Relation: Proceedings of 28th IEEE Photovoltaic Specialists Conference
-
6مؤتمر
المؤلفون: Uraoka, Y., Hatayama, T., Fuyuki, T.
المصدر: ICMTS 2000. Proceedings of the 2000 International Conference on Microelectronic Test Structures (Cat. No.00CH37095) Microelectronic test structures Microelectronic Test Structures, 2000. ICMTS 2000. Proceedings of the 2000 International Conference on. :158-162 2000
Relation: ICMTS 2000. Proceedings of the 2000 International Conference on Microelectronic Test Structures
-
7دورية أكاديمية
المؤلفون: Hatayama, T., Hino, S., Miura, N., Oomori, T., Tokumitsu, E.
المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 55(8):2041-2045 Aug, 2008
-
8دورية أكاديمية
المؤلفون: Okamoto, D., Yano, H., Hatayama, T., Uraoka, Y., Fuyuki, T.
المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 55(8):2013-2020 Aug, 2008
-
9دورية أكاديمية
المؤلفون: Uraoka, Y., Hirai, N., Yano, H., Hatayama, T., Fuyuki, T.
المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 51(1):28-35 Jan, 2004
-
10دورية أكاديمية
المؤلفون: Uraoka, Y., Hatayama, T., Fuyuki, T., Kawamura, T., Tsuchihashi, Y.
المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 48(10):2370-2374 Oct, 2001