يعرض 1 - 10 نتائج من 1,100 نتيجة بحث عن '"Hatayama T"', وقت الاستعلام: 0.89s تنقيح النتائج
  1. 1
    مؤتمر
    $0.63\ \mathrm{m}\Omega \text{cm}^{2}$ / 1170 V 4H-SiC Super Junction V-Groove Trench MOSFET

    المؤلفون: Masuda, T., Saito, Y., Kumazawa, T., Hatayama, T., Harada, S.

    المصدر: 2018 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2018 IEEE International. :8.1.1-8.1.4 Dec, 2018

    Relation: 2018 IEEE International Electron Devices Meeting (IEDM)

    Full Text Finder
    أضف إلى المفضلة
  2. 2
    مؤتمر
    New evaluation method for reliability of poly-Si thin film transistors using pico-second time-resolved emission microscope

    المؤلفون: Uraoka, Y., Hirai, N., Yano, H., Hatayama, T., Fuyuki, T.

    المصدر: International Conference on Microelectronic Test Structures, 2003. Microelectronic test structures Microelectronic Test Structures, 2003. International Conference on. :173-177 2003

    Relation: ICMTS 2002. Proceedings of the 2003 International Conference on Microelectronic Test Structures

    Full Text Finder
    أضف إلى المفضلة
  3. 3
    مؤتمر
    Analysis of reliability in low-temperature poly-Si thin film transistors using pico-second time-resolved emission microscope

    المؤلفون: Uraoka, Y., Hirai, N., Yano, H., Hatayama, T., Fuyuki, T.

    المصدر: Digest. International Electron Devices Meeting, Electron devices meeting Electron Devices Meeting, 2002. IEDM '02. International. :577-580 2002

    Relation: IEEE International Electron Devices Meeting

    Full Text Finder
    أضف إلى المفضلة
  4. 4
    مؤتمر
    Analysis of hot carrier effects in low temperature poly-Si TFTs using device simulator

    المؤلفون: Uraoka, Y., Hatayama, T., Fuyuki, T., Kawamura, T., Tsuchihashi, Y.

    المصدر: ICMTS 2001. Proceedings of the 2001 International Conference on Microelectronic Test Structures (Cat. No.01CH37153) Microelectronic test structures Microelectronic Test Structures, 2001. ICMTS 2001. Proceedings of the 2001 International Conference on. :251-256 2001

    Relation: ICMTS 2001. Proceedings of the 2001 International Conference on Microelectronic Test Structures

    Full Text Finder
    أضف إلى المفضلة
  5. 5
    مؤتمر
    Quasi three-dimensional simulation for thin film polycrystalline silicon solar cells

    المؤلفون: Ishikawa, Y., Yamamoto, Y., Hatayama, T., Uraoka, Y., Fuyuki, T.

    المصدر: Conference Record of the Twenty-Eighth IEEE Photovoltaic Specialists Conference - 2000 (Cat. No.00CH37036) Photovoltaic specialist conference Photovoltaic Specialists Conference, 2000. Conference Record of the Twenty-Eighth IEEE. :280-283 2000

    Relation: Proceedings of 28th IEEE Photovoltaic Specialists Conference

    Full Text Finder
    أضف إلى المفضلة
  6. 6
    مؤتمر
    Reliability evaluation method of low temperature poly-silicon TFTs using dynamic stress

    المؤلفون: Uraoka, Y., Hatayama, T., Fuyuki, T.

    المصدر: ICMTS 2000. Proceedings of the 2000 International Conference on Microelectronic Test Structures (Cat. No.00CH37095) Microelectronic test structures Microelectronic Test Structures, 2000. ICMTS 2000. Proceedings of the 2000 International Conference on. :158-162 2000

    Relation: ICMTS 2000. Proceedings of the 2000 International Conference on Microelectronic Test Structures

    أضف إلى المفضلة
  7. 7
    دورية أكاديمية
    Remarkable Increase in the Channel Mobility of SiC-MOSFETs by Controlling the Interfacial $\hbox{SiO}_{2}$ Layer Between $\hbox{Al}_{2}\hbox{O}_{3}$ and SiC

    المؤلفون: Hatayama, T., Hino, S., Miura, N., Oomori, T., Tokumitsu, E.

    المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 55(8):2041-2045 Aug, 2008

    Full Text Finder
    أضف إلى المفضلة
  8. 8
    دورية أكاديمية
    Analysis of Anomalous Charge-Pumping Characteristics on 4H-SiC MOSFETs

    المؤلفون: Okamoto, D., Yano, H., Hatayama, T., Uraoka, Y., Fuyuki, T.

    المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 55(8):2013-2020 Aug, 2008

    Full Text Finder
    أضف إلى المفضلة
  9. 9
    دورية أكاديمية
    Hot carrier analysis in low-temperature poly-Si TFTs using picosecond emission microscope

    المؤلفون: Uraoka, Y., Hirai, N., Yano, H., Hatayama, T., Fuyuki, T.

    المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 51(1):28-35 Jan, 2004

    Full Text Finder
    أضف إلى المفضلة
  10. 10
    دورية أكاديمية
    Reliability of low temperature poly-silicon TFTs under inverter operation

    المؤلفون: Uraoka, Y., Hatayama, T., Fuyuki, T., Kawamura, T., Tsuchihashi, Y.

    المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 48(10):2370-2374 Oct, 2001

    Full Text Finder
    أضف إلى المفضلة
أدوات البحث: أحصل على تغذية RSS – أرسل هذا البحث بالبريد الإلكتروني – حفظ البحث – جدول التنبيهات: لا شيء