المؤلفون: Shao, Jieqiu, Naris, Mantas, Hauser, John, Nicotra, Marco M.

المصدر: Phys. Rev. A 109 (2024) 012609

مصطلحات موضوعية: Quantum Physics, Electrical Engineering and Systems Science - Systems and Control

URL الوصول: http://arxiv.org/abs/2305.17630

المؤلفون: Dearing, Thomas L., Hauser, John, Petersen, Christopher, Nicotra, Marco M., Chen, Xudong

مصطلحات موضوعية: Mathematics - Optimization and Control, Electrical Engineering and Systems Science - Systems and Control

URL الوصول: http://arxiv.org/abs/2211.02110

المؤلفون: Rousse, Paul, Hauser, John, Garoche, Pierre-Loic

المصدر: 2020 59th IEEE Conference on Decision and Control (CDC) Decision and Control (CDC), 2020 59th IEEE Conference on. :4653-4658 Dec, 2020

Relation: 2020 59th IEEE Conference on Decision and Control (CDC)

المؤلفون: Fabris, Marco, Cenedese, Angelo, Hauser, John

المصدر: 2019 18th European Control Conference (ECC) Napoli, Italy, pp. 1556-1561, June 25-28, 2019

مصطلحات موضوعية: Electrical Engineering and Systems Science - Systems and Control

URL الوصول: http://arxiv.org/abs/2202.10196

المؤلفون: Shao, Jieqiu, Combes, Joshua, Hauser, John, Nicotra, Marco M.

المصدر: Phys. Rev. A 105, 032605 (2022)

مصطلحات موضوعية: Quantum Physics, Electrical Engineering and Systems Science - Systems and Control

URL الوصول: http://arxiv.org/abs/2111.08795

المؤلفون: Fabris, Marco, Cenedese, Angelo, Hauser, John

المصدر: 2019 18th European Control Conference (ECC) Control Conference (ECC), 2019 18th European. :1556-1561 Jun, 2019

Relation: 2019 18th European Control Conference (ECC)

المؤلفون: Afman, Juan-Pablo, Feron, Eric, Hauser, John

المصدر: 2018 IEEE Conference on Decision and Control (CDC) Decision and Control (CDC), 2018 IEEE Conference on. :731-736 Dec, 2018

Relation: 2018 IEEE Conference on Decision and Control (CDC)

المؤلفون: Cook, Jacob, Hauser, John

المصدر: 2018 Annual American Control Conference (ACC) American Control Conference (ACC), 2018 Annual. :2237-2242 Jun, 2018

Relation: 2018 Annual American Control Conference (ACC)

المؤلفون: Afman, Juan-Pablo, Feron, Eric, Hauser, John

المصدر: 2018 Annual American Control Conference (ACC) American Control Conference (ACC), 2018 Annual. :392-397 Jun, 2018

Relation: 2018 Annual American Control Conference (ACC)

المؤلفون: Burnap, Alex, Hauser, John R., Timoshenko, Artem

مصطلحات موضوعية: Computer Science - Machine Learning, Computer Science - Computer Vision and Pattern Recognition, Economics - Econometrics, Statistics - Machine Learning

URL الوصول: http://arxiv.org/abs/1907.07786