يعرض 1 - 10 نتائج من 40 نتيجة بحث عن '"Hazra, Jubin"', وقت الاستعلام: 1.10s تنقيح النتائج
  1. 1
    مؤتمر
    Failure Analysis of 65nm CMOS Integrated Nanoscale ReRAM Devices on a 300mm Wafer Platform

    المؤلفون: Liehr, Maximilian, Hazra, Jubin, Beckmann, Karsten, Cady, Nathaniel

    المصدر: 2022 IEEE International Integrated Reliability Workshop (IIRW) Integrated Reliability Workshop (IIRW), 2022 IEEE International. :1-7 Oct, 2022

    Relation: 2022 IEEE International Integrated Reliability Workshop (IIRW)

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  2. 2
    مؤتمر
    In-memory Computation of Error-Correcting Codes Using a Reconfigurable HfOx ReRAM 1T1R Array

    المؤلفون: Abedin, Minhaz, Liehr, Maximilian, Beckmann, Karsten, Hazra, Jubin, Rafiq, Sarah, Cady, Nathaniel C.

    المصدر: 2021 IEEE International Midwest Symposium on Circuits and Systems (MWSCAS) Circuits and Systems (MWSCAS), 2021 IEEE International Midwest Symposium on. :593-598 Aug, 2021

    Relation: 2021 IEEE International Midwest Symposium on Circuits and Systems (MWSCAS)

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  3. 3
    مؤتمر
    Optimization of Switching Metrics for CMOS Integrated HfO2 based RRAM Devices on 300 mm Wafer Platform

    المؤلفون: Hazra, Jubin, Liehr, Maximilian, Beckmann, Karsten, Abedin, Minhaz, Rafq, Sarah, Cady, Nathaniel

    المصدر: 2021 IEEE International Memory Workshop (IMW) Memory Workshop (IMW), 2021 IEEE International. :1-4 May, 2021

    Relation: 2021 IEEE International Memory Workshop (IMW)

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  4. 4
    مؤتمر
    Robust RRAM-based In-Memory Computing in Light of Model Stability

    المؤلفون: Krishnan, Gokul, Sun, Jingbo, Hazra, Jubin, Du, Xiaocong, Liehr, Maximilian, Li, Zheng, Beckmann, Karsten, Joshi, Rajiv V., Cady, Nathaniel C., Cao, Yu

    المصدر: 2021 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2021 IEEE International. :1-5 Mar, 2021

    Relation: 2021 IEEE International Reliability Physics Symposium (IRPS)

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  5. 5
    مؤتمر
    Impact of Switching Variability of 65nm CMOS Integrated Hafnium Dioxide-based ReRAM Devices on Distinct Level Operations

    المؤلفون: Liehr, Maximilian, Hazra, Jubin, Beckmann, Karsten, Rafiq, Sarah, Cady, Nathaniel

    المصدر: 2020 IEEE International Integrated Reliability Workshop (IIRW) Integrated Reliability Workshop (IIRW), 2020 IEEE International. :1-4 Oct, 2020

    Relation: 2020 IEEE International Integrated Reliability Workshop (IIRW)

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  6. 6
    مؤتمر
    Impact of Atomic Layer Deposition Co-Reactant Pulse Time on 65nm CMOS Integrated Hafnium Dioxide-based Nanoscale RRAM Devices

    المؤلفون: Hazra, Jubin, Liehr, Maximilian, Beckmann, Karsten, Rafiq, Sarah, Cady, Nathaniel

    المصدر: 2020 IEEE International Integrated Reliability Workshop (IIRW) Integrated Reliability Workshop (IIRW), 2020 IEEE International. :1-4 Oct, 2020

    Relation: 2020 IEEE International Integrated Reliability Workshop (IIRW)

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  7. 7
    مؤتمر
    Design Limits of In-Memory Computing: Beyond the Crossbar

    المؤلفون: Krishnan, Gokul, Hazra, Jubin, Liehr, Maximilian, Du, Xiaocong, Beckmann, Karsten, Joshi, Rajiv V., Cady, Nathaniel C., Cao, Yu

    المصدر: 2021 5th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) Electron Devices Technology & Manufacturing Conference (EDTM), 2021 5th IEEE. :1-3 Apr, 2021

    Relation: 2021 5th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)

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  8. 8
    مؤتمر
    Accurate Inference with Inaccurate RRAM Devices: Statistical Data, Model Transfer, and On-line Adaptation

    المؤلفون: Charan, Gouranga, Hazra, Jubin, Beckmann, Karsten, Du, Xiaocong, Krishnan, Gokul, Joshi, Rajiv V., Cady, Nathaniel C., Cao, Yu

    المصدر: 2020 57th ACM/IEEE Design Automation Conference (DAC) Design Automation Conference (DAC), 2020 57th ACM/IEEE. :1-6 Jul, 2020

    Relation: 2020 57th ACM/IEEE Design Automation Conference (DAC)

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  9. 9
    مؤتمر
    Improving the Memory Window/Resistance Variability Trade-Off for 65nm CMOS Integrated HfO2 Based Nanoscale RRAM Devices

    المؤلفون: Hazra, Jubin, Liehr, Maximilian, Beckmann, Karsten, Rafiq, Sarah, Cady, Nathaniel

    المصدر: 2019 IEEE International Integrated Reliability Workshop (IIRW) Integrated Reliability Workshop (IIRW), 2019 IEEE International. :1-4 Oct, 2019

    Relation: 2019 IEEE International Integrated Reliability Workshop (IIRW)

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  10. 10
    مؤتمر
    An evolutionary approach to drug-design using Quantam binary Particle Swarm optimization algorithm

    المؤلفون: Ghosh, Avishek, Ghosh, Arnab, Chowdhury, Arkabandhu, Hazra, Jubin

    المصدر: 2012 IEEE Students' Conference on Electrical, Electronics and Computer Science Electrical, Electronics and Computer Science (SCEECS), 2012 IEEE Students' Conference on. :1-4 Mar, 2012

    Relation: 2012 IEEE Students' Conference on Electrical, Electronics and Computer Science (SCEECS)

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