يعرض 1 - 10 نتائج من 48 نتيجة بحث عن '"He, Yonggen"', وقت الاستعلام: 0.95s تنقيح النتائج
  1. 1
    مؤتمر
    Conformal SiGe selective epitaxial growth for advanced CMOS technology

    المؤلفون: Liu, Yiqun, Jin, Lan, Song, Kunshan, Wu, Qiong, He, Youfeng, He, Yonggen

    المصدر: 2018 China Semiconductor Technology International Conference (CSTIC) Semiconductor Technology International Conference (CSTIC), 2018 China. :1-3 Mar, 2018

    Relation: 2018 China Semiconductor Technology International Conference (CSTIC)

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  2. 2
    مؤتمر
    Device performance improvement with implantation balancing energy contamination and productivity

    المؤلفون: He, Yonggen, Cai, Guohui, Zhou, Zuyuan, He, Youfeng, Wu, Jingang, Zhang, David Wei, Cai, Ting, Lu, Junfeng, Zhao, Ganming, Guo, Baonian

    المصدر: 2016 16th International Workshop on Junction Technology (IWJT) Junction Technology (IWJT), 2016 16th International Workshop on. :51-53 May, 2016

    Relation: 2016 16th International Workshop on Junction Technology (IWJT)

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  3. 3
    مؤتمر
    Investigation of embedded silicon germanium typical defect solution for advanced CMOS process

    المؤلفون: Tu, Huojin, He, Yonggen, He, Youfeng, Liu, Jialei, Jin, Lan, Cai, Guohui, Liu, Yu, Huang, Yujian

    المصدر: 2016 China Semiconductor Technology International Conference (CSTIC) Semiconductor Technology International Conference (CSTIC), 2016 China. :1-3 Mar, 2016

    Relation: 2016 China Semiconductor Technology International Conference (CSTIC)

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  4. 4
    مؤتمر
    Optimization of 28nm HK/MG single wafer cleaning process

    المؤلفون: Liang, Haihui, Liu, JiaLei, Liu, HuanXin, He, Yonggen, Wu, Jingang, Ge, Xiaojing, Haigermoser, Christian

    المصدر: 2016 China Semiconductor Technology International Conference (CSTIC) Semiconductor Technology International Conference (CSTIC), 2016 China. :1-3 Mar, 2016

    Relation: 2016 China Semiconductor Technology International Conference (CSTIC)

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  5. 5
    مؤتمر
    Post ion implantation photoresist residue removal study

    المؤلفون: Liu, Jialei, Liu, Huanxin, He, Yonggen, Liang, Haihui, Tu, Huojin

    المصدر: 2016 China Semiconductor Technology International Conference (CSTIC) Semiconductor Technology International Conference (CSTIC), 2016 China. :1-3 Mar, 2016

    Relation: 2016 China Semiconductor Technology International Conference (CSTIC)

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  6. 6
    مؤتمر
    Investigation of seal nitride process in 32nm beyond HK/MG technology

    المؤلفون: He, Youfeng, Zhu, Haifeng, Jin, Lan, Tu, Huojin, Ni, Jinghua, He, Yonggen, Wu, Jingang

    المصدر: 2016 China Semiconductor Technology International Conference (CSTIC) Semiconductor Technology International Conference (CSTIC), 2016 China. :1-3 Mar, 2016

    Relation: 2016 China Semiconductor Technology International Conference (CSTIC)

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  7. 7
    مؤتمر
    Spectrometric ellipsometry application to optical metrology of Silicon-Germanium layer

    المؤلفون: He, Yonggen, Wu, Zhenyu, Jin, Lan, Huang, Yi, Dong, Hao

    المصدر: 2016 China Semiconductor Technology International Conference (CSTIC) Semiconductor Technology International Conference (CSTIC), 2016 China. :1-3 Mar, 2016

    Relation: 2016 China Semiconductor Technology International Conference (CSTIC)

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  8. 8
    مؤتمر
    Investigation of Si Implantation into ILD (Interlayer Dielectric) for film property modification

    المؤلفون: He, Yonggen, Cai, Guohui, Zhou, Zuyuan, He, Youfeng, Zhao, Jie, Song, Weiji, Yu, Shaofeng, Wu, Jingang, Lu, Jun Feng, Zhao, Ganming

    المصدر: 2014 International Workshop on Junction Technology (IWJT) Junction Technology (IWJT), 2014 International Workshop on. :1-4 May, 2014

    Relation: 2014 14th International Workshop on Junction Technology (IWJT)

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  9. 9
    مؤتمر
    Investigation of groove surface induced by strain relaxation in selective epitaxy SiGe process

    المؤلفون: Jin, Lan, Tu, Huojin, He, Youfeng, Lin, Jing, He, Yonggen, Lu, Wei, Wu, Jingang

    المصدر: 2012 12th International Workshop on Junction Technology Junction Technology (IWJT), 2012 12th International Workshop on. :234-237 May, 2012

    Relation: 2012 12th International Workshop on Junction Technology (IWJT)

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  10. 10
    مؤتمر
    Laser spike anneal macro & micro non-uniformity investigation using modulated optical reflectance and four-point-probe

    المؤلفون: He, Yonggen, Chen, Yong, Yu, Guobin, Hong, Albert, Lu, Jiong-Ping, Liu, Xianghua, Yu, Lu, Chen, Yue

    المصدر: 2010 International Workshop on Junction Technology Extended Abstracts Junction Technology (IWJT), 2010 International Workshop on. :1-4 May, 2010

    Relation: 2010 International Workshop on Junction Technology (IWJT)

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