المؤلفون: Suhana Nafais, A, Cibi, S L, Harish Kumar, A, Tharani, M, Viswak Avinash, S P

المصدر: 2023 7th International Conference on Intelligent Computing and Control Systems (ICICCS) Intelligent Computing and Control Systems (ICICCS), 2023 7th International Conference on. :1569-1574 May, 2023

Relation: 2023 7th International Conference on Intelligent Computing and Control Systems (ICICCS)

المؤلفون: Paliwoda, P., Toledano-Luque, M., Nigam, T., Guarin, F., Nour, M., Cimino, S., Pantisano, L., Gupta, A., Gonzalez, O. H., Hauser, M., Liu, W., Vayshenker, A., Ioannou, D., Lee, D., Jiang, L., Yee, P., Rauch, S., Min, B.

المصدر: 2020 IEEE 29th North Atlantic Test Workshop (NATW) North Atlantic Test Workshop (NATW), 2020 IEEE 29th. :1-7 Jun, 2020

Relation: 2020 IEEE 29th North Atlantic Test Workshop (NATW)

المؤلفون: Elhamid, Abd Elhamid M. Abd, Attiya, Ahmed M., Zahran, Mohamed B.

المصدر: 2019 6th International Conference on Advanced Control Circuits and Systems (ACCS) & 2019 5th International Conference on New Paradigms in Electronics & information Technology (PEIT) Advanced Control Circuits and Systems (ACCS) & 2019 5th International Conference on New Paradigms in Electronics & information Technology (PEIT), 2019 6th International Conference on. :161-166 Nov, 2019

Relation: 2019 6th International Conference on Advanced Control Circuits and Systems (ACCS) & 2019 5th International Conference on New Paradigms in Electronics & information Technology (PEIT)

المؤلفون: Paliwoda, P., Chbili, Z., Kerber, A., Nigam, T., Singh, D., Nagahiro, K., Manik, P.P, Cimino, S., Misra, D.

المصدر: 2018 International Integrated Reliability Workshop (IIRW) Integrated Reliability Workshop (IIRW), 2018 International. :01-04 Oct, 2018

Relation: 2018 International Integrated Reliability Workshop (IIRW)

المؤلفون: Paliwoda, P., Chbili, Z., Kerber, A., Gondal, A., Misra, D.

المصدر: 2017 IEEE International Integrated Reliability Workshop (IIRW) Integrated Reliability Workshop (IIRW), 2017 IEEE International. :1-4 Oct, 2017

Relation: 2017 IEEE International Integrated Reliability Workshop (IIRW)

المؤلفون: Paliwoda, P., Chbili, Z., Kerber, A., Nigam, T., Nagahiro, K., Cimino, S., Toledano-Luque, M., Pantisano, L., Min, B.W., Misra, D.

المصدر: IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 19(2):249-254 Jun, 2019

المؤلفون: Paliwoda, P., Chbili, Z., Kerber, A., Singh, D., Misra, D.

المصدر: 2018 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2018 IEEE International. :6E.2-1-6E.2-5 Mar, 2018

Relation: 2018 IEEE International Reliability Physics Symposium (IRPS)

المؤلفون: Babar, A. A., Manzari, S., Sydanheimo, L., Elsherbeni, A. Z., Ukkonen, L.

المصدر: IEEE Transactions on Antennas and Propagation IEEE Trans. Antennas Propagat. Antennas and Propagation, IEEE Transactions on. 60(9):4056-4064 Sep, 2012

المؤلفون: Paliwoda, P., Manik, P.P., Singh, D., Chbili, Z., Kerber, A., Johnson, J., Misra, D.

المصدر: IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 18(2):133-138 Jun, 2018

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