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المؤلفون: Yuri Yasuda-Masuoka, Jaehun Jeong, Kihwang Son, SeungWook Lee, Seulki Park, Youngho Lee, Ju Youn Kim, Jaeho Lee, Moongi Cho, Sihyung Lee, Soohun Hong, Heebum Hong, Younghun Jung, Changkeun Yoon, Yonghyun Ko, Kyunghoon Jung, Taehun Myung, Jong Mil Youn, Gitae Jeong
المصدر: 2021 IEEE International Electron Devices Meeting (IEDM).
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::b6ed776a19715b49489ce62a2a6dafe1
https://doi.org/10.1109/iedm19574.2021.9720656 -
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المؤلفون: Young-Gun Ko, Jeongmin Choi, Y. Yasuda-Masuoka, Kyunghoon Jung, Heebum Hong, Sungil Jo, Jae-Hun Jeong, Minseong Lee, Young-Ho Lee, Sihyung Lee, Ju Youn Kim, Gitae Jeong, Kihwang Son, Ho Lee, Byungha Choi, Hyung-Jong Lee, Chunghwan Shin, Jong Mil Youn, Sung Won Kim, Jae-Chul Kim
المصدر: 2020 IEEE International Electron Devices Meeting (IEDM).
مصطلحات موضوعية: Power management, Power gain, Computer architecture, Computer science, law, Extreme ultraviolet lithography, Transistor, Process (computing), State (computer science), Dual (category theory), Power (physics), law.invention
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::e0efae1aa35f1f41261d412f146b43f5
https://doi.org/10.1109/iedm13553.2020.9371958 -
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المؤلفون: Nak-Jin Son, Yongmin Park, Hwa-Sung Rhee, Sung Gun Kang, Sung-il Cho, Kyung-Hwan Yeo, Eun-Cheol Lee, Yun-Ki Choi, Jong Shik Yoon, Heebum Hong, Jeong-Hoon Ahn, Dongwoo Kim, Il-Ryong Kim, Jungtae Kim, Jong Mil Youn, Jae-Hun Jeong
المصدر: 2018 IEEE Symposium on VLSI Technology.
مصطلحات موضوعية: 010302 applied physics, Cryptocurrency, Computer science, Volume (computing), Process (computing), 01 natural sciences, Automotive engineering, High volume manufacturing, Power (physics), Reduction (complexity), Logic gate, 0103 physical sciences, 010301 acoustics, Scaling
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::40b1037773b5c94d6df5444162cc2a3a
https://doi.org/10.1109/vlsit.2018.8510673 -
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المؤلفون: Sun-Me Lim, Yongshik Kim, Sunil Yu, Heebum Hong, Jongwoo Park, Zhang Ming
المصدر: 2011 International Reliability Physics Symposium.
مصطلحات موضوعية: Materials science, Duty cycle, Temperature instability, law, Logic gate, High-temperature operating life, Sram cell, Transistor, Analytical chemistry, Electronic engineering, Static random-access memory, Metal gate, law.invention
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::b129a94e2cef22dfdf9a49961143ca41
https://doi.org/10.1109/irps.2011.5784460