المؤلفون: Higginson, K., Fernando, D., Veidt, M., Burnton, P., You, Z., Heitzmann, M.

المصدر: In Thin-Walled Structures November 2021 168

المؤلفون: Achard, H., Ducroquet, F., Coudert, F., Previtali, B., Lugand, J.F., Ulmer, L., Farjot, T., Gobil, Y., Heitzmann, M., Tedesco, S., Nier, M.E., Deleonibus, S.

المصدر: 30th European Solid-State Device Research Conference Solid-State Device Research Conference, 2000. Proceeding of the 30th European. :408-411 2000

Relation: 30th European Solid-State Device Research Conference

المؤلفون: Guegan, G., Deleonibus, S., Bertrand, G., Souil, D., Clerc, R., Tedesco, S., Heitzmann, M., Mur, P.

المصدر: 30th European Solid-State Device Research Conference Solid-State Device Research Conference, 2000. Proceeding of the 30th European. :544-547 2000

Relation: 30th European Solid-State Device Research Conference

المؤلفون: Deleonibus, S., Caillat, C., Gautier, J., Guegan, G., Heitzmann, M., Martin, F., Tedesco, S.

المصدر: 29th European Solid-State Device Research Conference Solid-State Device Research Conference, 1999. Proceeding of the 29th European. 1:119-126 1999

Relation: 29th European Solid-State Device Research Conference

المؤلفون: Poiroux, T., Pascal, F., Heitzmann, M., Berruyer, P., Turban, G., Reimbold, G.

المصدر: 1999 4th International Symposium on Plasma Process-Induced Damage (IEEE Cat. No.99TH8395) Plasma process-induced damage Plasma Process-Induced Damage, 1999 4th International Symposium on. :12-15 1999

Relation: 1999 4th International Symposium on Plasma Process-Induced Damage

المؤلفون: Poiroux, T., Heitzmann, M., Morand, Y., Berruyer, P., Turban, G., Reimbold, G.

المصدر: 1999 4th International Symposium on Plasma Process-Induced Damage (IEEE Cat. No.99TH8395) Plasma process-induced damage Plasma Process-Induced Damage, 1999 4th International Symposium on. :177-180 1999

Relation: 1999 4th International Symposium on Plasma Process-Induced Damage

المؤلفون: Guegan, G., Deleonibus, S., Tedesco, S., Dal'zotto, B., Heitzmann, M., Roussin, J.C., Martin, F., Caillat, C.

المصدر: 27th European Solid-State Device Research Conference Solid-State Device Research Conference, 1997. Proceeding of the 27th European. :244-247 1997

Relation: 27th European Solid-State Device Research Conference

المؤلفون: Deleonibus, S., Heitzmann, M., Martin, F., Guibert, J.-C.

المصدر: 27th European Solid-State Device Research Conference Solid-State Device Research Conference, 1997. Proceeding of the 27th European. :736-739 1997

Relation: 27th European Solid-State Device Research Conference

المؤلفون: Bouillon, P., Benistant, F., Skotnicki, T., Guegan, G., Roche, D., Andre, E., Mathiot, D., Tedesco, S., Martin, F., Heitzmann, M., Lerme, M., Haond, M.

المصدر: Proceedings of International Electron Devices Meeting Electron devices Electron Devices Meeting, 1995. IEDM '95., International. :897-900 1995

Relation: Proceedings of International Electron Devices Meeting

المؤلفون: Cassan, E., Lardenois, S., Pascal, D., Vivien, L., Heitzmann, M., Bouzaida, N., Mollard, L., Orobtchouk, R., Laval, S.

المصدر: Proceedings of the IEEE 2003 International Interconnect Technology Conference (Cat. No.03TH8695) Interconnect technology Interconnect Technology Conference, 2003. Proceedings of the IEEE 2003 International. :39-41 2003

Relation: IEEE International Interconnect Technology Conference