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المؤلفون: Alberto Cestero, Gregory J. Fredeman, Toshiaki Kirihata, Janakiraman Viraraghavan, Abraham Mathews, Babar A. Khan, Subramanian S. Iyer, Daniel J. Rainey, Chris Paone, Donald W. Plass, Thomas R. Miller, Michael A. Sperling, Herbert L. Ho, Norbert Arnold, Elizabeth L. Gerhard, Rajesh R. Tummuru, Dinesh Kannambadi, Michael Whalen, Steven Burns, Kenneth J. Reyer, Dongho Lee, Thomas J. Knips
المصدر: IEEE Journal of Solid-State Circuits. 51:230-239
مصطلحات موضوعية: Engineering, Hardware_MEMORYSTRUCTURES, business.industry, Sense amplifier, 020208 electrical & electronic engineering, 02 engineering and technology, eDRAM, 020202 computer hardware & architecture, Process variation, Phase-locked loop, Logic gate, Hardware_INTEGRATEDCIRCUITS, 0202 electrical engineering, electronic engineering, information engineering, Electronic engineering, Inverter, Electrical and Electronic Engineering, business, Low voltage, Computer hardware, Dram
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المؤلفون: Xiaohu Tang, Herbert L. Ho, Brian Yueh-Ling Hsieh, K. Stein, Shuen-Cheng Chris Lei, Oliver D. Patterson, Surbhi Mittal, Richard F. Hafer, William Davies, Ankur Arya
المصدر: 2016 27th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC).
مصطلحات موضوعية: 0209 industrial biotechnology, Engineering, Ground, business.industry, Process (computing), 02 engineering and technology, eDRAM, Line (electrical engineering), law.invention, Capacitor, 020901 industrial engineering & automation, law, Logic gate, Electronic engineering, Key (cryptography), Static random-access memory, business
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::a4db98555beec8dab81ee18303f94a03
https://doi.org/10.1109/asmc.2016.7491150 -
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المؤلفون: E. Engbrecht, Edward P. Maciejewski, Christopher D. Sheraw, R. Divakaruni, Zhengwen Li, Allen H. Gabor, L. Economikos, Fernando Guarin, N. Zhan, H-K Lee, MaryJane Brodsky, Kenneth J. Stein, Siyuranga O. Koswatta, Y. Yang, Byeong Y. Kim, J. Hong, A. Bryant, Herbert L. Ho, Ruqiang Bao, Nicolas Breil, Babar A. Khan, E. Woodard, W-H. Lee, C-H. Lin, A. Levesque, Kevin McStay, V. Basker, Viraj Y. Sardesai, C. Tran, A. Ogino, Reinaldo A. Vega, C. DeWan, Shreesh Narasimha, J-J. An, Amit Kumar, A. Aiyar, Ravikumar Ramachandran, W. Wang, X. Wang, W. Nicoll, D. Hoyos, A. Friedman, Barry Linder, Yongan Xu, E. Alptekin, Cathryn Christiansen, S. Polvino, Han Wang, Scott R. Stiffler, G. Northrop, S. Saudari, J. Rice, Saraf Iqbal Rashid, Sunfei Fang, Michael V. Aquilino, Z. Ren, B. Kannan, Geng Wang, Noah Zamdmer, T. Kwon, Paul D. Agnello, Hasan M. Nayfeh, S. Jain, Robert R. Robison, M. Hasanuzzaman, J. Cai, L. Lanzerotti, D. Wehelle-Gamage, Basanth Jagannathan, J. Johnson, E. Kaste, Kai Zhao, Huiling Shang, Carl J. Radens, Shariq Siddiqui, Y. Ke, D. Ferrer, Ximeng Guan, D. Conklin, K. Boyd, K. Henson, Siddarth A. Krishnan, Bernard A. Engel, H. Dong, S. Mahajan, Unoh Kwon, Dominic J. Schepis, William Y. Chang, Liyang Song, Brian J. Greene, Chengwen Pei, S.-J. Jeng, Clevenger Leigh Anne H, Vijay Narayanan, C. Zhu, Wai-kin Li, Henry K. Utomo, Wei Liu, Dureseti Chidambarrao
المصدر: 2014 IEEE International Electron Devices Meeting.
مصطلحات موضوعية: Engineering, Subthreshold conduction, business.industry, Processor design, Copper interconnect, Soi finfet, Hardware_PERFORMANCEANDRELIABILITY, Thread (computing), Planar, CMOS, Hardware_INTEGRATEDCIRCUITS, Electronic engineering, business, Dram
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::6233530b0b3fd6ddc14276a018716523
https://doi.org/10.1109/iedm.2014.7046977 -
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المؤلفون: Hani Herbert L. Ho, Joseph Leandro B. Peje, Floro Barot, Maria Fe G. Bautista, John Richard E. Hizon, Carl Christian E. Misagal, Louis P. Alarcon
المصدر: TENCON 2014 - 2014 IEEE Region 10 Conference.
مصطلحات موضوعية: Standard cell, Engineering, business.industry, Logical conjunction, Hardware_INTEGRATEDCIRCUITS, Electronic engineering, Schematic, business, Cmos process, Low voltage, Electronic circuit, Power (physics), Voltage
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::890983422686d77c2d05332898fee562
https://doi.org/10.1109/tencon.2014.7022443 -
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المؤلفون: Herbert L. Ho, David E. Laughlin, Subhash Mahajan, C. L. Bauer, A. G. Milnes
المصدر: Journal of Materials Research. 11:904-911
مصطلحات موضوعية: Materials science, Silicon, Annealing (metallurgy), Mechanical Engineering, chemistry.chemical_element, Context (language use), Condensed Matter Physics, Epitaxy, Nickel, Crystallography, chemistry, Mechanics of Materials, Transmission electron microscopy, Phase (matter), Diffusionless transformation, General Materials Science
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المؤلفون: Rajeev Malik, Rishikesh Krishnan, Sunfei Fang, Bernhard Wunder, Kevin McStay, Yanli Zhang, Sadanand V. Deshpande, Douglas Daley, Herbert L. Ho, Sneha Gupta, Paul C. Parries, Balaji Jayaraman, Sungjae Lee, Puneet Goyal, John E. Barth, Scott R. Stiffler, Paul D. Agnello, Subramanian S. Iyer
المصدر: ICICDT
مصطلحات موضوعية: Materials science, Equivalent series resistance, business.industry, Electrical engineering, Silicon on insulator, Hardware_PERFORMANCEANDRELIABILITY, eDRAM, Decoupling capacitor, Capacitance, law.invention, Capacitor, Hardware_GENERAL, law, Trench, Hardware_INTEGRATEDCIRCUITS, Electronic engineering, business, Metal gate
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::83d6b2dd06f89254c9ba9a3578b0ab30
https://doi.org/10.1109/icicdt.2012.6232872 -
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المؤلفون: Herbert L. Ho, Tue Nguyen, David E. Kotecki, Tai D. Nguyen
المصدر: Journal of Materials Research. 8:2354-2361
مصطلحات موضوعية: Materials science, Hydrogen, Annealing (metallurgy), Mechanical Engineering, Inorganic chemistry, chemistry.chemical_element, Chemical vapor deposition, Nitride, Condensed Matter Physics, Chemical reaction, Surface coating, chemistry.chemical_compound, chemistry, Silicon nitride, Mechanics of Materials, General Materials Science, Cobalt
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المؤلفون: Tue Nguyen, Julius C. Chang, Herbert L. Ho, Brian John Machesney, Peter J. Geiss
المصدر: Journal of Materials Research. 8:467-472
مصطلحات موضوعية: Controlled atmosphere, Materials science, Silicon dioxide, Scanning electron microscope, Mechanical Engineering, Mineralogy, chemistry.chemical_element, Condensed Matter Physics, Microstructure, chemistry.chemical_compound, chemistry, Chemical engineering, Mechanics of Materials, Transmission electron microscopy, General Materials Science, Thin film, Cobalt oxide, Cobalt
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المؤلفون: Herbert L. Ho, Jinping Liu, Paul C. Parries, Norman Robson, Jing Li, Puneet Goyal, S.S. Iyer, Ming Yin, Babar A. Khan, Zhengwen Li, Paul D. Agnello, K. V. Hawkins, Sunfei Fang, T. Weaver, Scott R. Stiffler, Kevin McStay, Rishikesh Krishnan, W. Davies, R. Takalkar, T. Kirihata, Sami Rosenblatt, S. Galis, A. Blauberg, Shreesh Narasimha, Michael P. Chudzik, Amanda L. Tessier, William K. Henson, W. Kong, Edward P. Maciejewski, Alberto Cestero, Nauman Zafar Butt, Joseph Ervin, S. Gupta, Jeyaraj Antony Johnson, S. Rombawa, Sungjae Lee, J. Barth, Ying Zhang
المصدر: 2010 International Electron Devices Meeting.
مصطلحات موضوعية: Engineering, business.industry, Transistor, Silicon on insulator, eDRAM, law.invention, Threshold voltage, Capacitor, Hardware_GENERAL, law, Logic gate, Hardware_INTEGRATEDCIRCUITS, Electronic engineering, business, Metal gate, Leakage (electronics)
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::324242387bfae4ae688888a5d8ad886a
https://doi.org/10.1109/iedm.2010.5703434 -
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المؤلفون: Russell H. Arndt, Ashima B. Chakravarti, Anthony G. Domenicucci, Amanda L. Tessier, Jinping Liu, Sunfei Fang, Kevin McStay, Zhengwen Li, Randolph F. Knarr, S. Lee, Joseph F. Shepard, Herbert L. Ho, A. Arya, R. Venigalla, W. Davies, R. Takalkar, Rishikesh Krishnan, Paul C. Parries, B. Morgenfeld, Xin Li, S. Gupta, Michael P. Chudzik, Scott R. Stiffler, Puneet Goyal, Babar A. Khan, Sadanand V. Deshpande, J. Dadson, Scott D. Allen
المصدر: 2010 IEEE International SOI Conference (SOI).
مصطلحات موضوعية: Materials science, business.industry, chemistry.chemical_element, eDRAM, Capacitance, Engineering physics, law.invention, Capacitor, Semiconductor, chemistry, Hardware_GENERAL, law, Shallow trench isolation, Trench, Hardware_INTEGRATEDCIRCUITS, Electronic engineering, business, Tin, Leakage (electronics)
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::923f4cfd581d96da2ab4d0cb5f97f7c8
https://doi.org/10.1109/soi.2010.5641378