المؤلفون: Piadena, Alberto, Quarantelli, Michele, Brozek, Tomasz, Saxena, Sharad, Hess, Christopher, Weiland, Larg, Vallishayee, Rakesh, Yu, Yuan, Strojwas, Andrzej

المصدر: 2024 IEEE 74th Electronic Components and Technology Conference (ECTC) ECTC Electronic Components and Technology Conference (ECTC), 2024 IEEE 74th. :996-1002 May, 2024

Relation: 2024 IEEE 74th Electronic Components and Technology Conference (ECTC)

المؤلفون: Brozek, Tomasz, Piadena, Alberto, Quarantelli, Michele, Weiland, Larg, Hess, Christopher, Saxena, Sharad, Yu, Yuan, Vallishayee, Rakesh, Strojwas, Andrzej

المصدر: 2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) Electron Devices Technology & Manufacturing Conference (EDTM), 2024 8th IEEE. :1-3 Mar, 2024

Relation: 2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)

المؤلفون: de Verdier, Maria Correia, Saluja, Rachit, Gagnon, Louis, LaBella, Dominic, Baid, Ujjwall, Tahon, Nourel Hoda, Foltyn-Dumitru, Martha, Zhang, Jikai, Alafif, Maram, Baig, Saif, Chang, Ken, D'Anna, Gennaro, Deptula, Lisa, Gupta, Diviya, Haider, Muhammad Ammar, Hussain, Ali, Iv, Michael, Kontzialis, Marinos, Manning, Paul, Moodi, Farzan, Nunes, Teresa, Simon, Aaron, Sollmann, Nico, Vu, David, Adewole, Maruf, Albrecht, Jake, Anazodo, Udunna, Chai, Rongrong, Chung, Verena, Faghani, Shahriar, Farahani, Keyvan, Kazerooni, Anahita Fathi, Iglesias, Eugenio, Kofler, Florian, Li, Hongwei, Linguraru, Marius George, Menze, Bjoern, Moawad, Ahmed W., Velichko, Yury, Wiestler, Benedikt, Altes, Talissa, Basavasagar, Patil, Bendszus, Martin, Brugnara, Gianluca, Cho, Jaeyoung, Dhemesh, Yaseen, Fields, Brandon K. K., Garrett, Filip, Gass, Jaime, Hadjiiski, Lubomir, Hattangadi-Gluth, Jona, Hess, Christopher, Houk, Jessica L., Isufi, Edvin, Layfield, Lester J., Mastorakos, George, Mongan, John, Nedelec, Pierre, Nguyen, Uyen, Oliva, Sebastian, Pease, Matthew W., Rastogi, Aditya, Sinclair, Jason, Smith, Robert X., Sugrue, Leo P., Thacker, Jonathan, Vidic, Igor, Villanueva-Meyer, Javier, White, Nathan S., Aboian, Mariam, Conte, Gian Marco, Dale, Anders, Sabuncu, Mert R., Seibert, Tyler M., Weinberg, Brent, Abayazeed, Aly, Huang, Raymond, Turk, Sevcan, Rauschecker, Andreas M., Farid, Nikdokht, Vollmuth, Philipp, Nada, Ayman, Bakas, Spyridon, Calabrese, Evan, Rudie, Jeffrey D.

مصطلحات موضوعية: Computer Science - Computer Vision and Pattern Recognition

URL الوصول: http://arxiv.org/abs/2405.18368

المؤلفون: LaBella, Dominic, Baid, Ujjwal, Khanna, Omaditya, McBurney-Lin, Shan, McLean, Ryan, Nedelec, Pierre, Rashid, Arif, Tahon, Nourel Hoda, Altes, Talissa, Bhalerao, Radhika, Dhemesh, Yaseen, Godfrey, Devon, Hilal, Fathi, Floyd, Scott, Janas, Anastasia, Kazerooni, Anahita Fathi, Kirkpatrick, John, Kent, Collin, Kofler, Florian, Leu, Kevin, Maleki, Nazanin, Menze, Bjoern, Pajot, Maxence, Reitman, Zachary J., Rudie, Jeffrey D., Saluja, Rachit, Velichko, Yury, Wang, Chunhao, Warman, Pranav, Adewole, Maruf, Albrecht, Jake, Anazodo, Udunna, Anwar, Syed Muhammad, Bergquist, Timothy, Chen, Sully Francis, Chung, Verena, Conte, Gian-Marco, Dako, Farouk, Eddy, James, Ezhov, Ivan, Khalili, Nastaran, Iglesias, Juan Eugenio, Jiang, Zhifan, Johanson, Elaine, Van Leemput, Koen, Li, Hongwei Bran, Linguraru, Marius George, Liu, Xinyang, Mahtabfar, Aria, Meier, Zeke, Moawad, Ahmed W., Mongan, John, Piraud, Marie, Shinohara, Russell Takeshi, Wiggins, Walter F., Abayazeed, Aly H., Akinola, Rachel, Jakab, András, Bilello, Michel, de Verdier, Maria Correia, Crivellaro, Priscila, Davatzikos, Christos, Farahani, Keyvan, Freymann, John, Hess, Christopher, Huang, Raymond, Lohmann, Philipp, Moassefi, Mana, Pease, Matthew W., Vollmuth, Phillipp, Sollmann, Nico, Diffley, David, Nandolia, Khanak K., Warren, Daniel I., Hussain, Ali, Fehringer, Pascal, Bronstein, Yulia, Deptula, Lisa, Stein, Evan G., Taherzadeh, Mahsa, de Oliveira, Eduardo Portela, Haughey, Aoife, Kontzialis, Marinos, Saba, Luca, Turner, Benjamin, Brüßeler, Melanie M. T., Ansari, Shehbaz, Gkampenis, Athanasios, Weiss, David Maximilian, Mansour, Aya, Shawali, Islam H., Yordanov, Nikolay, Stein, Joel M., Hourani, Roula, Moshebah, Mohammed Yahya, Abouelatta, Ahmed Magdy, Rizvi, Tanvir, Willms, Klara, Martin, Dann C., Okar, Abdullah, D'Anna, Gennaro, Taha, Ahmed, Sharifi, Yasaman, Faghani, Shahriar, Kite, Dominic, Pinho, Marco, Haider, Muhammad Ammar, Aristizabal, Alejandro, Karargyris, Alexandros, Kassem, Hasan, Pati, Sarthak, Sheller, Micah, Alonso-Basanta, Michelle, Villanueva-Meyer, Javier, Rauschecker, Andreas M., Nada, Ayman, Aboian, Mariam, Flanders, Adam E., Wiestler, Benedikt, Bakas, Spyridon, Calabrese, Evan

مصطلحات موضوعية: Electrical Engineering and Systems Science - Image and Video Processing, Computer Science - Computer Vision and Pattern Recognition, Computer Science - Machine Learning

URL الوصول: http://arxiv.org/abs/2405.09787

المؤلفون: Rudie, Jeffrey, Saluja, Rachit, Weiss, David, Nedelec, Pierre, Calabrese, Evan, Colby, John, Laguna, Benjamin, Rauschecker, Andreas, Sugrue, Leo, Hess, Christopher, Mongan, John, Braunstein, Steve, Villanueva-Meyer, Javier

المصدر: Radiology: Artificial Intelligence. 6(2)

مصطلحات موضوعية: Artificial Intelligence, Brain Metastases, MRI, Public Datasets, Humans, Radiosurgery, San Francisco, Brain Neoplasms, Magnetic Resonance Imaging

وصف الملف: application/pdf

URL الوصول: https://escholarship.org/uc/item/7cd1w76h

المؤلفون: Brozek, Tomasz, Piadena, Alberto, Weiland, Larg, Quarantelli, Michele, Coccoli, Alberto, Saxena, Sharad, Hess, Christopher, Strojwas, Andrzej

المصدر: 2023 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2023 IEEE International. :1-4 Mar, 2023

Relation: 2023 IEEE International Reliability Physics Symposium (IRPS)

المؤلفون: Li, Hongwei Bran, Conte, Gian Marco, Anwar, Syed Muhammad, Kofler, Florian, Ezhov, Ivan, van Leemput, Koen, Piraud, Marie, Diaz, Maria, Cole, Byrone, Calabrese, Evan, Rudie, Jeff, Meissen, Felix, Adewole, Maruf, Janas, Anastasia, Kazerooni, Anahita Fathi, LaBella, Dominic, Moawad, Ahmed W., Farahani, Keyvan, Eddy, James, Bergquist, Timothy, Chung, Verena, Shinohara, Russell Takeshi, Dako, Farouk, Wiggins, Walter, Reitman, Zachary, Wang, Chunhao, Liu, Xinyang, Jiang, Zhifan, Familiar, Ariana, Johanson, Elaine, Meier, Zeke, Davatzikos, Christos, Freymann, John, Kirby, Justin, Bilello, Michel, Fathallah-Shaykh, Hassan M., Wiest, Roland, Kirschke, Jan, Colen, Rivka R., Kotrotsou, Aikaterini, Lamontagne, Pamela, Marcus, Daniel, Milchenko, Mikhail, Nazeri, Arash, Weber, Marc André, Mahajan, Abhishek, Mohan, Suyash, Mongan, John, Hess, Christopher, Cha, Soonmee, Villanueva, Javier, Colak, Meyer Errol, Crivellaro, Priscila, Jakab, Andras, Albrecht, Jake, Anazodo, Udunna, Aboian, Mariam, Yu, Thomas, Baid, Ujjwal, Bakas, Spyridon, Linguraru, Marius George, Menze, Bjoern, Iglesias, Juan Eugenio, Wiestler, Benedikt

مصطلحات موضوعية: Electrical Engineering and Systems Science - Image and Video Processing, Computer Science - Computer Vision and Pattern Recognition

URL الوصول: http://arxiv.org/abs/2305.09011

المؤلفون: Kofler, Florian, Meissen, Felix, Steinbauer, Felix, Graf, Robert, Oswald, Eva, de da Rosa, Ezequiel, Li, Hongwei Bran, Baid, Ujjwal, Hoelzl, Florian, Turgut, Oezguen, Horvath, Izabela, Waldmannstetter, Diana, Bukas, Christina, Adewole, Maruf, Anwar, Syed Muhammad, Janas, Anastasia, Kazerooni, Anahita Fathi, LaBella, Dominic, Moawad, Ahmed W, Farahani, Keyvan, Eddy, James, Bergquist, Timothy, Chung, Verena, Shinohara, Russell Takeshi, Dako, Farouk, Wiggins, Walter, Reitman, Zachary, Wang, Chunhao, Liu, Xinyang, Jiang, Zhifan, Familiar, Ariana, Conte, Gian-Marco, Johanson, Elaine, Meier, Zeke, Davatzikos, Christos, Freymann, John, Kirby, Justin, Bilello, Michel, Fathallah-Shaykh, Hassan M, Wiest, Roland, Kirschke, Jan, Colen, Rivka R, Kotrotsou, Aikaterini, Lamontagne, Pamela, Marcus, Daniel, Milchenko, Mikhail, Nazeri, Arash, Weber, Marc-André, Mahajan, Abhishek, Mohan, Suyash, Mongan, John, Hess, Christopher, Cha, Soonmee, Villanueva-Meyer, Javier, Colak, Errol, Crivellaro, Priscila, Jakab, Andras, Albrecht, Jake, Anazodo, Udunna, Aboian, Mariam, Iglesias, Juan Eugenio, Van Leemput, Koen, Bakas, Spyridon, Rueckert, Daniel, Wiestler, Benedikt, Ezhov, Ivan, Piraud, Marie, Menze, Bjoern

مصطلحات موضوعية: Electrical Engineering and Systems Science - Image and Video Processing, Computer Science - Computer Vision and Pattern Recognition, Computer Science - Machine Learning

URL الوصول: http://arxiv.org/abs/2305.08992

المؤلفون: Majumdar, Sharmila, Crane, Jason, Hawkins, James, Olson, Marram, Harouni, Ahmed, Qin, Ming, Hess, Christopher

المصدر: PLOS Digital Health. 2(8)

وصف الملف: application/pdf

URL الوصول: https://escholarship.org/uc/item/2sh6x6bz

المؤلفون: Saxena, Sharad, Hess, Christopher, Quarantelli, Michele, Piadena, Alberto, Weiland, Larg, Vallishayee, Rakesh, Yu, Yuan, Ciplickas, Dennis, Brozek, Tomasz, Strojwas, Andrzej

المصدر: 2022 IEEE 72nd Electronic Components and Technology Conference (ECTC) ECTC Electronic Components and Technology Conference (ECTC), 2022 IEEE 72nd. :723-728 May, 2022

Relation: 2022 IEEE 72nd Electronic Components and Technology Conference (ECTC)