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1دورية أكاديمية
المؤلفون: Liang, Y., Liu, Z., Cai, Z., Han, X., Huang, H., Lin, Y., Yi Chang, E., Lin, C., Takenaka, M., Toprasertpong, K., Takagi, S.
المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 45(8):1468-1471 Aug, 2024
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2دورية أكاديمية
المؤلفون: Zhu, X., Zhang, K., Sun, J., Lin, C., Pan, K., Yang, T., Huang, Z., Deng, L., Yan, Z., Liu, Y., Nie, J., Yan, Q.
المصدر: IEEE Transactions on Dielectrics and Electrical Insulation IEEE Trans. Dielect. Electr. Insul. Dielectrics and Electrical Insulation, IEEE Transactions on. 31(4):1659-1665 Aug, 2024
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3دورية أكاديمية
المؤلفون: Kumar, A., Mishra, N., Bulusu, A., Mehrotra, S., Dasgupta, A.
المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 71(7):4015-4020 Jul, 2024
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4دورية أكاديمية
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5مؤتمر
المؤلفون: Rachidi, S., Ramesh, S., Tierno, D., Donadio, G. L., Pacco, A., Maes, J. W., Jeong, Y., Arreghini, A., Van Den Bosch, G., Rosmeulen, M.
المصدر: 2024 IEEE International Memory Workshop (IMW) Memory Workshop (IMW), 2024 IEEE International. :1-4 May, 2024
Relation: 2024 IEEE International Memory Workshop (IMW)
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6دورية أكاديمية
المؤلفون: Chery, E., Croes, K., Nolmans, P., Beyne, E.
المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 71(6):3845-3851 Jun, 2024
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7دورية أكاديميةFrom Accelerated to Operating Conditions: How Trapped Charge Impacts on TDDB in SiO₂ and HfO₂ Stacks
المؤلفون: Vecchi, S., Padovani, A., Pavan, P., Puglisi, F.M.
المصدر: IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 24(2):194-202 Jun, 2024
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8
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9مؤتمر
المؤلفون: Masud Rana, Sk, Roy, Sourodeep, Lederer, Maximilian, Raffel, Yannick, Pirro, Luca, Chohan, Talha, Seidel, Konrad, De, Sourav, Chakrabarti, Bhaswar
المصدر: 2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) Electron Devices Technology & Manufacturing Conference (EDTM), 2024 8th IEEE. :1-3 Mar, 2024
Relation: 2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)
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10مؤتمر
المؤلفون: Chiu, Chui-Yi, De, Sourav, Cho, Chen-Yi, Hou, Tuo-Hung
المصدر: 2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) Electron Devices Technology & Manufacturing Conference (EDTM), 2024 8th IEEE. :1-3 Mar, 2024
Relation: 2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)