المؤلفون: Pan, Wenwu^Aff3, Faraone, Lorenzo^Aff3, Lei, Wen^Aff3

المساهمون: Krishnamoorthy, Sivashankar, editor^Aff1, Iniewski, Krzysztof (Kris), editor^Aff2

المصدر: Advances in Fabrication and Investigation of Nanomaterials for Industrial Applications. :205-221

المؤلفون: Nizovskii, A. I.^{Aff1, IDS1027451023060162_cor1}, Shmakov, A. N.^{Aff1, Aff2}, Kulikov, A. V., Suprun, E. A., Bukhtiyarov, V. I.

المصدر: Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques. 17(6):1186-1191

المؤلفون: Sivaraj, Reena Devi^{Aff1, IDs12596023011210_cor1}, Panneer Selvam, Rekha, Rangasamy, Mohan Kumar

المصدر: Journal of Optics. 52(4):1990-1999

المؤلفون: Zhe Chuan Feng, Jiamin Liu, Deng Xie, Manika Tun Nafisa, Chuanwei Zhang, Lingyu Wan, Beibei Jiang, Hao-Hsiung Lin, Zhi-Ren Qiu, Weijie Lu, Benjamin Klein, Ian T. Ferguson, Shiyuan Liu

المصدر: Materials, Vol 17, Iss 12, p 2921 (2024)

مصطلحات موضوعية: gallium nitride (GaN), molecular beam epitaxy (MBE), high-resolution X-ray diffraction (HR-XRD), Nomarski microscopy (NM), Raman scattering, photoluminescence (PL), Technology, Electrical engineering. Electronics. Nuclear engineering, TK1-9971, Engineering (General). Civil engineering (General), TA1-2040, Microscopy, QH201-278.5, Descriptive and experimental mechanics, QC120-168.85

وصف الملف: electronic resource

Relation: https://www.mdpi.com/1996-1944/17/12/2921; https://doaj.org/toc/1996-1944

URL الوصول: https://doaj.org/article/ba9752e518824bcc952da569dc862ff4

المؤلفون: Sharma, Vishal, Arora, Sunil K., Sunidhi, Sanchez, Florencio

المصدر: 2020 5th IEEE International Conference on Emerging Electronics (ICEE) Emerging Electronics (ICEE), 2020 5th IEEE International Conference on. :1-3 Nov, 2020

Relation: 2020 5th IEEE International Conference on Emerging Electronics (ICEE)

المؤلفون: Sondes Bauer, Berkin Nergis, Xiaowei Jin, Reinhard Schneider, Di Wang, Christian Kübel, Petr Machovec, Lukas Horak, Vaclav Holy, Klaus Seemann, Tilo Baumbach, Sven Ulrich

المصدر: Nanomaterials, Vol 14, Iss 8, p 711 (2024)

مصطلحات موضوعية: heterostructures, temperature-dependent magnetic properties, pulsed laser deposition, interfacial quality, high-resolution transmission electron microscopy, high-resolution X-ray diffraction reciprocal space mapping, Chemistry, QD1-999

وصف الملف: electronic resource

Relation: https://www.mdpi.com/2079-4991/14/8/711; https://doaj.org/toc/2079-4991

URL الوصول: https://doaj.org/article/96164670925e404c825a7c2e0389bd67

المؤلفون: Roul, B., Pant, R., Chowdhury, A.M., Chandan, G., Singh, D.K., Chirakkara, S., Nanda, K.K., Krupanidhi, S.B.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 66(3):1345-1352 Mar, 2019

المؤلفون: Aggarwal, V.^{Aff1, Aff2}, Gautam, Sudhanshu^{Aff1, Aff2}, Varshney, Urvashi^{Aff1, Aff2}, Mauraya, A. K.^{Aff1, Aff2}, Kumar, Rahul^{Aff1, Aff2}, Gupta, G.^{Aff1, Aff2}, Ganesan, Ramakrishnan, Senthil Kumar, M.^{Aff1, Aff2}, Kushvaha, S. S.^{Aff1, Aff2, IDs43578022008283_cor9}

المصدر: Journal of Materials Research. 38(2):429-438

المؤلفون: El Khalidi, Zahira^{Aff1, IDs11664022099526_cor1}, Grein, Christoph H., Ciani, Anthony, Sivananthan, Sivalingam^{Aff1, Aff2}

المصدر: Journal of Electronic Materials. 51(12):6784-6791

المؤلفون: Zouaghi, S., Fitouri, H., Habchi, M. M., Ashaya, E. Abdullah, Rebey, A.^{Aff1, Aff2, IDS1027451022050226_cor5}

المصدر: Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques. 16(5):783-788