نتائج البحث - "Hiroshi Nohira"

1

مؤتمر

Hard and soft X-ray excited photoelectron spectroscopy study on high-κ gate insulators

المؤلفون: Hiroshi Nohira, Takeo Hattori

المصدر: 2006 International Workshop on Nano CMOS Nano CMOS, 2006 International Workshop on. :69-88 Jan, 2006

Relation: 2006 International Workshop on Nano CMOS (IWNC)

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2

Fabrication of metal/oxide/fluorographene/oxide/silicon capacitors and their charge trapping properties

المؤلفون: Rino Kawashima, Hiroshi Nohira, Ryousuke Ishikawa, Yuichiro Mitani

المصدر: Japanese Journal of Applied Physics. 62:SG1035

مصطلحات موضوعية: General Engineering, General Physics and Astronomy

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::8eb551d5855501c9c813fd2c7411adcc
https://doi.org/10.35848/1347-4065/acbeb9

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3

Using hard X-ray photoelectron spectroscopy to study a SiO2/HfO2-based interface dipole modulation stack embedded in a metal–insulator-metal structure

المؤلفون: Yoshiharu Kirihara, Ryota Tsujiguchi, Shunichi Ito, Akira Yasui, Noriyuki Miyata, Hiroshi Nohira

المصدر: Applied Physics Express. 15:111003

مصطلحات موضوعية: General Engineering, General Physics and Astronomy

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::9ec45dcd21f08ce488960ff03113911b
https://doi.org/10.35848/1882-0786/ac9ae6

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4

Resistive switching in two-terminal HfO2/SiO2 stack with interface dipole modulation

المؤلفون: Noriyuki Miyata, Kyoko Sumita, Akira Yasui, Reito Wada, Hiroshi Nohira

المصدر: Extended Abstracts of the 2020 International Conference on Solid State Devices and Materials.

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::731c461b9bc696f33b6ed4b862f2f748
https://doi.org/10.7567/ssdm.2020.b-2-02

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Photoelectron Nano-spectroscopy of Reactive Ion Etching-Induced Damages to the Trench Sidewalls and Bottoms of 4H-SiC Trench-MOSFETs

المؤلفون: Naoka Nagamura, Yoshinobu Takahashi, Akihiko Otsuki, Hiroshi Nohira, Masaharu Oshima, Aki Takigawa, Shun Konno, Daisuke Mori, Masato Kotsugi

المصدر: e-Journal of Surface Science and Nanotechnology. 16:257-261

مصطلحات موضوعية: Materials science, business.industry, Bioengineering, Surfaces and Interfaces, Condensed Matter Physics, Surfaces, Coatings and Films, Band bending, Mechanics of Materials, Nano, Trench, Optoelectronics, Reactive-ion etching, business, Spectroscopy, Biotechnology

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::cae8d3050ca69661594e7b1d4cf63c45
https://doi.org/10.1380/ejssnt.2018.257

6

Electrical properties of epitaxial Lu- or Y-doped La 2 O 3 /La 2 O 3 /Ge high- k gate-stacks

المؤلفون: J. Tadano, Keisuke Yamamoto, R. Yamashiro, Kohei Hamaya, Dong Wang, Masato Zenitaka, Hiroshi Nakashima, Takeshi Kanashima, Hiroshi Nohira, Shinya Yamada

المصدر: Materials Science in Semiconductor Processing. 70:260-264

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::5235c0e1cae67b0c2d108a06a15c57e3
https://doi.org/10.1016/j.mssp.2016.11.016

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7

Electrically induced change in HfO2/1-monolayer TiO2/SiO2 metal-oxide-semiconductor stacks: capacitance–voltage and hard X-ray photoelectron spectroscopy studies

المؤلفون: Akira Yasui, Hiroshi Nohira, Kyoko Sumita, Ryousuke Sano, Noriyuki Miyata, Reito Wada

المصدر: Applied Physics Express. 14:071005

مصطلحات موضوعية: Metal, Capacitance voltage, Oxide semiconductor, Materials science, X-ray photoelectron spectroscopy, business.industry, visual_art, Monolayer, General Engineering, visual_art.visual_art_medium, General Physics and Astronomy, Optoelectronics, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::f65e6fbfca256f85c3c7e114fc7be5d7
https://doi.org/10.35848/1882-0786/ac0b08

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8

Angle-Resolved Photoelectron Spectroscopy Studies of Initial Stage of Thermal Oxidation on 4H-SiC (0001) on-Axis and 4° Off-Axis Substrates

المؤلفون: Ryoma Toyoda, Ai Ishohashi, Hiroshi Nohira, Yasuhisa Sano, Hitoshi Arai

المصدر: ECS Transactions. 77:51-57

مصطلحات موضوعية: Thermal oxidation, Materials science, X-ray photoelectron spectroscopy, Chemical bond, MOSFET, Analytical chemistry, Spectral line, Oxidation rate

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::392f6ed465ffa504d4cbc0070d3f010a
https://doi.org/10.1149/07706.0051ecst

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9

Interface Dipole Modulation in HfO2/SiO2 MOS Stack Structures

المؤلفون: Kyoko Sumita, Jun Nara, Hiroshi Nohira, Ryousuke Sano, Takahiro Yamasaki, Noriyuki Miyata

المصدر: 2018 IEEE International Electron Devices Meeting (IEDM).

مصطلحات موضوعية: 010302 applied physics, Materials science, business.industry, Interface (computing), Process (computing), 02 engineering and technology, 021001 nanoscience & nanotechnology, 01 natural sciences, Dipole, Stack (abstract data type), Modulation, Electric field, 0103 physical sciences, Memory window, Optoelectronics, 0210 nano-technology, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::42de225b1a3f002b10531ac41f2f9c39
https://doi.org/10.1109/iedm.2018.8614674

10

Formation and Evaluation of Al2O3 Layer By Direct ALD on Epitaxial SiGe

المؤلفون: Eriko Shigesawa, K. Sawano, Hiroshi Nohira

المصدر: ECS Meeting Abstracts. :1388-1388

مصطلحات موضوعية: Materials science, business.industry, Optoelectronics, Epitaxy, business, Layer (electronics)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::fe288aa250fc997a0e365127b213309e
https://doi.org/10.1149/ma2020-02141388mtgabs

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