المؤلفون: Eda, Ryusei, Hisafuru, Kota, Togawa, Nozomu

المصدر: 2024 IEEE 30th International Symposium on On-Line Testing and Robust System Design (IOLTS) On-Line Testing and Robust System Design (IOLTS), 2024 IEEE 30th International Symposium on. :1-3 Jul, 2024

Relation: 2024 IEEE 30th International Symposium on On-Line Testing and Robust System Design (IOLTS)

المؤلفون: Hisafuru, Kota, Togawa, Nozomu

المصدر: 2024 IEEE International Conference on Consumer Electronics (ICCE) Consumer Electronics (ICCE), 2024 IEEE International Conference on. :1-6 Jan, 2024

Relation: 2024 IEEE International Conference on Consumer Electronics (ICCE)

المؤلفون: Hisafuru, Kota, Negishi, Ryotaro, Kawakami, Soma, Sato, Dai, Yamashita, Kazuki, Fukada, Keisuke, Togawa, Nozomu

المصدر: 2022 International Conference on Field-Programmable Technology (ICFPT) Field-Programmable Technology (ICFPT), 2022 International Conference on. :1-4 Dec, 2022

Relation: 2022 International Conference on Field-Programmable Technology (ICFPT)

المؤلفون: Hisafuru, Kota, Takasaki, Kazunari, Togawa, Nozomu

المصدر: 2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design (IOLTS) On-Line Testing and Robust System Design (IOLTS), 2022 IEEE 28th International Symposium on. :1-7 Sep, 2022

Relation: 2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design (IOLTS)

المؤلفون: Takasaki, Kazunari, Hisafuru, Kota, Negishi, Ryotaro, Yamashita, Kazuki, Fukada, Keisuke, Wakaizumi, Tomoya, Togawa, Nozomu

المصدر: 2021 International Conference on Field-Programmable Technology (ICFPT) Field-Programmable Technology (ICFPT), 2021 International Conference on. :1-4 Dec, 2021

Relation: 2021 International Conference on Field-Programmable Technology (ICFPT)

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