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1مؤتمر
المؤلفون: Lee, C. C., Tang, T. K., Ho, M. Y.
المصدر: IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society Industrial Electronics Society , IECON 2017 - 43rd Annual Conference of the IEEE. :8371-8376 Oct, 2017
Relation: IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society
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2دورية أكاديمية
المؤلفون: Ng, J. S., Kiew, P. L.Aff1, IDs13762021032135_cor2, Lam, M. K., Yeoh, W. M., Ho, M. Y.
المصدر: International Journal of Environmental Science and Technology. 19(3):1545-1554
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3دورية أكاديمية
المؤلفون: Fan, Heidi S. L., Ho, M. Y., Ko, Rachel W. T., Kwok, Jojo Y. Y., Chau, P. H., Wong, Janet Y. H., Wang, M. P., Lok, Kris Y. W.Aff1, IDs1300602200535z_cor8
المصدر: International Breastfeeding Journal. 17(1)
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4مؤتمر
المؤلفون: Chong, H. B., Van Leer, Brandon, Narang, V., Ho, M. Y.
المصدر: 2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits Physical and Failure Analysis of Integrated Circuits (IPFA), 2012 19th IEEE International Symposium on the. :1-4 Jul, 2012
Relation: 2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2012)
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5مؤتمر
المؤلفون: Ravikumar, V. K., Wampler, R., Ho, M. Y., Christensen, J., Phoa, S. L.
المصدر: 2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits Physical and Failure Analysis of Integrated Circuits (IPFA), 2012 19th IEEE International Symposium on the. :1-4 Jul, 2012
Relation: 2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2012)
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6مؤتمر
المصدر: 2011 e-Manufacturing & Design Collaboration Symposium & International Symposium on Semiconductor Manufacturing (eMDC & ISSM) Semiconductor Manufacturing (ISSM) and e-Manufacturing and Design Collaboration Symposium (eMDC), 2011 International Symposium on. :0-17 Sep, 2011
Relation: 2011 e-Manufacturing & Design Collaboration Symposium & International Symposium on Semiconductor Manufacturing (eMDC & ISSM)
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7مؤتمر
المؤلفون: Wilk, G.D., Green, M.L., Ho, M.-Y., Busch, B.W., Sorsch, T.W., Klemens, F.P., Brijs, B., van Dover, R.B., Kornblit, A., Gustafsson, T., Garfunkel, E., Hillenius, S., Monroe, D., Kalavade, P., Hergenrother, J.M.
المصدر: 2002 Symposium on VLSI Technology. Digest of Technical Papers (Cat. No.01CH37303) VLSI technology VLSI Technology, 2002. Digest of Technical Papers. 2002 Symposium on. :88-89 2002
Relation: 2002 Symposium on VLSI Technology Digest of Technical Papers
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8دورية أكاديمية
لا يتم عرض هذه النتيجة على الضيوف.
تسجيل الدخول للوصول الكامل. -
9دورية أكاديمية
لا يتم عرض هذه النتيجة على الضيوف.
تسجيل الدخول للوصول الكامل. -
10دورية أكاديمية
لا يتم عرض هذه النتيجة على الضيوف.
تسجيل الدخول للوصول الكامل.