المؤلفون: Hang, C.C., Wong, P.K., Ho, Y.P., Ruan, Y.

المصدر: 2014 IEEE International Conference on Management of Innovation and Technology Management of Innovation and Technology (ICMIT), 2014 IEEE International Conference on. :7-12 Sep, 2014

Relation: 2014 IEEE International Conference on Management of Innovation and Technology (ICMIT)

المؤلفون: Chen, L.P., Ho, Y.P., Lin, D.C., Tseng, B.M., Lee, H.Y., Guan, R.F., Huang, G.W., Chen, Y.C., Wen, W.Y., Chen, C.L.

المصدر: 1998 IEEE Radio Frequency Integrated Circuits (RFIC) Symposium. Digest of Papers (Cat. No.98CH36182) Radio frequency integrated circuits Radio Frequency Integrated Circuits (RFIC) Symposium, 1998 IEEE. :321-324 1998

Relation: 1998 IEEE Radio Frequency Integrated Circuits (RFIC) Symposium. Digest of Papers

المؤلفون: Bailey, V.J., Puleo, C.M., Ho, Y.P., Yeh, H.C., Wang, T.H.

المصدر: 2009 Annual International Conference of the IEEE Engineering in Medicine and Biology Society Engineering in Medicine and Biology Society, 2009. EMBC 2009. Annual International Conference of the IEEE. :4089-4092 Sep, 2009

Relation: 2009 31st Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC)

المؤلفون: Ho, Y.P., Li, H., Chen, Y.J.

المصدر: IEEE Photonics Technology Letters IEEE Photon. Technol. Lett. Photonics Technology Letters, IEEE. 9(3):342-344 Mar, 1997

المؤلفون: Ho, Y.P., Li, H., Chen, Y.J.

المصدر: Conference Proceedings LEOS'96 9th Annual Meeting IEEE Lasers and Electro-Optics Society LEOS '96 Lasers and Electro-Optics Society Annual Meeting, 1996. LEOS 96., IEEE. 2:226-227 vol.2 1996

Relation: Conference Proceedings LEOS'96 9th Annual Meeting IEEE Lasers and Electro-Optics Society

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المؤلفون: Jone, W.B., Ho, Y.P., Das, S.R.

المصدر: Journal of Electronic Testing: Theory and Applications. October 1997 11(2):131-146

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المؤلفون: Su, C.Y., Chen, L.P., Chang, S.J., Tseng, B.M., Lin, D.C., Huang, G.W., Ho, Y.P., Lee, H.Y., Kuan, J.F., Wen, W.Y., Liou, P., Chen, C.L., Leu, L.Y., Wen, K.A., Chang, C.Y.

المصدر: In Solid State Electronics 2002 46(5):759-767

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