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1
المؤلفون: Ho Chan Ham, Kwang-Salk Kim, Bo-Young Lee, Don-Ha Hwang
المصدر: ECS Transactions. 11:213-217
مصطلحات موضوعية: Materials science, Analytical chemistry, Cu deposition, Wafer, Electrochemistry
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2
المؤلفون: Kwang-Salk Kim, Ho Chan Ham, Don-Ha Hwang, Bo-Young Lee, Su-Moon Park
المصدر: ECS Meeting Abstracts. :1082-1082
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3
المؤلفون: Kye Won Lee, Ilsub Chung, Taewan Kim, Soon-yeon Park, Ho Chan Ham
المصدر: Japanese Journal of Applied Physics. 43:2235
مصطلحات موضوعية: Materials science, business.industry, General Engineering, Oxide, Analytical chemistry, General Physics and Astronomy, Equivalent oxide thickness, chemistry.chemical_compound, Scanning probe microscopy, chemistry, Current conduction, Optoelectronics, Thin film, Current (fluid), business, Aluminum oxide, Quantum tunnelling