يعرض 1 - 10 نتائج من 16 نتيجة بحث عن '"Hoeju Chung"', وقت الاستعلام: 0.85s تنقيح النتائج
  1. 1
    مؤتمر
    A 512 Mbit, 1.6 Gbps/pin DDR3 SDRAM prototype with C/sub 10/ minimization and self-calibration techniques

    المؤلفون: Churoo Park, HoeJu Chung, Yun-Sang Lee, Jae-Kwan Kim, Jae-Jun Lee, Moo-Sung Chae, Dae-Hee Jung, Sung-Ho Choi, Seung-young Seo, Taek-Seon Park, Jun-Ho Shin, Jin-Hyung Cho, Seunghoon Lee, Kyu-hyoun Kim, Jung-Bae Lee, Changhyun Kim, Soo-In Cho

    المصدر: Digest of Technical Papers. 2005 Symposium on VLSI Circuits, 2005. VLSI Circuits VLSI Circuits, 2005. Digest of Technical Papers. 2005 Symposium on. :370-373 2005

    Relation: 2005 Symposium on VLSI Circuits

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  2. 2
    دورية أكاديمية
    A 512-mb DDR3 SDRAM prototype with C/sub IO/ minimization and self-calibration techniques

    المؤلفون: Churoo Park, HoeJu Chung, Yun-Sang Lee, Jaekwan Kim, JaeJun Lee, Moo-Sung Chae, Dae-Hee Jung, Sung-Ho Choi, Seung-young Seo, Taek-Seon Park, Jun-Ho Shin, Jin-Hyung Cho, Seunghoon Lee, Ki-Whan Song, Kyu-Hyoun Kim, Jung-Bae Lee, Changhyun Kim, Soo-In Cho

    المصدر: IEEE Journal of Solid-State Circuits IEEE J. Solid-State Circuits Solid-State Circuits, IEEE Journal of. 41(4):831-838 Apr, 2006

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  3. 3
    مؤتمر
    Channel BER Measurement for a 5.8Gb/s/pin unidirectional differential I/O for DRAM application

    المؤلفون: Hoeju Chung, Youngchan Jang, Youngdon Choi, Park, Hwanwook, Jaekwan Kim, Soouk Lim, Jung Sunwoo, Park, Moonsook, Hyungwsuk Kim, Sang-Yun Kim, Hyun-Kyung Kim, Su-Jin Chung, Eun-Mi Lee, Youngju Kim, Yun-Sang Lee, Woo-Seop Kim, Jung-Bae Lee, Changhyun Kim

    المصدر: 2008 IEEE Asian Solid-State Circuits Conference Solid-State Circuits Conference, 2008. A-SSCC '08. IEEE Asian. :29-32 Nov, 2008

    Relation: 2008 IEEE Asian Solid-State Circuits Conference (A-SSCC)

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  4. 4
    مؤتمر
    SCR-based ESD Protection for High Bandwidth DRAMs

    المؤلفون: Myounggon Kang, Ki-Whan Song, Hoeju Chung, Jinyoung Kim, Yeong-Taek Lee, Changhyun Kim

    المصدر: 2007 IEEE Asian Solid-State Circuits Conference Solid-State Circuits Conference, 2007. ASSCC '07. IEEE Asian. :208-211 Nov, 2007

    Relation: 2007 IEEE Asian Solid-State Circuits Conference

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  5. 5
    مؤتمر
    A 512Mbit, 3.2Gbps/pin packet-based DRAM with cost-efficient clock generation and distribution scheme

    المؤلفون: Young-Soo Sohn, Jung-Hwan Choi, In-Young Chung, HoeJu Chung, Chan-Kyoung Kim, Gyoung-Su Byun, Dae-Woon Kang, Won-Ki Park, In-Soo Park, Hong-Sun Hwang, Chang-Hyun Kim, Soo-In Cho

    المصدر: 2004 Symposium on VLSI Circuits. Digest of Technical Papers (IEEE Cat. No.04CH37525) VLSI circuits VLSI Circuits, 2004. Digest of Technical Papers. 2004 Symposium on. :36-37 2004

    Relation: 2004 Symposium on VLSI Circuits. Digest of Technical Papers

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  6. 6
    Disaster response activities and transformation of the Japanese Self-Defense Forces to the Great Earthquake ― Focusing on coping with the Great Hanshin-Awaji Earthquake and the Great East Japan Earthquake ―

    المؤلفون: Hoeju Chung, Joonyoung Bang

    المصدر: Journal of Korean-Japanese Military and Culture. 33:5-30

    مصطلحات موضوعية: General Medicine

    URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::7a09ba0e140e9348e74d67818a6cb831
    https://doi.org/10.47563/kjmc.33.1

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  7. 7
    HBM3 RAS: Enhancing Resilience at Scale

    المؤلفون: Taekyun Kim, Kyomin Sohn, Sudhanva Gurumurthi, Aaron Nygren, Hoeju Chung, Kijun Lee, Vilas Sridharan, Munseon Jang, Ryu Ye-Sin

    المصدر: IEEE Computer Architecture Letters. 20:158-161

    مصطلحات موضوعية: Hardware_MEMORYSTRUCTURES, Serviceability (computer), Memory errors, Hardware and Architecture, Computer science, Reliability (computer networking), Key (cryptography), Systems design, Use case, Resilience (network), Dram, Reliability engineering

    URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::e58ea21bdb5dbd1a8f36084f7760d006
    https://doi.org/10.1109/lca.2021.3117150

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  8. 8
    Japan’s early confusion patterns and lessons learned from the Great East Japan Earthquake: Mitigating disaster plan for earthquakes happens in Metropolitan Cities

    المؤلفون: Hoeju Chung

    المصدر: Journal of Korean-Japanese Military and Culture. 26:155-183

    مصطلحات موضوعية: History, Economy, medicine, General Medicine, medicine.symptom, Disaster plan, Metropolitan area, Confusion

    URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::e1cbd122ffdff7a4dabbae2132f83bb1
    https://doi.org/10.47563/kjmc.26.6

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  9. 9
    Improving Memory Reliability by Bounding DRAM Faults

    المؤلفون: Jang-ryul Kim, Hoeju Chung, Rajat Agarwal, Terry Grunzke, Kjersten E. Criss, Kuljit S. Bains, Munseon Jang, Tanj Bennett

    المصدر: MEMSYS

    مصطلحات موضوعية: Hardware_MEMORYSTRUCTURES, Computer science, CPU cache, Data integrity, Overhead (computing), DIMM, Fault (power engineering), Error detection and correction, Dram, Reliability (statistics), Reliability engineering

    URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::97636f86048d4c0c4826b7651fba1786
    https://doi.org/10.1145/3422575.3422803

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  10. 10
    مؤتمر
    A 512 Mbit, 1.6 Gbps/pin DDR3 SDRAM prototype with C10 minimization and self-calibration techniques.

    المؤلفون: Churoo Park, HoeJu Chung, Yun-Sang Lee, Jae-Kwan Kim, Jae-Jun Lee, Moo-Sung Chae, Dae-Hee Jung, Sung-Ho Choi, Seung-young Seo, Taek-Seon Park, Jun-Ho Shin, Jin-Hyung Cho, Seunghoon Lee, Kyu-hyoun Kim, Jung-Bae Lee, Changhyun Kim, Soo-In Cho

    المصدر: 2005 Digest of Technical Papers. 2005 Symposium on VLSI Circuits; 2005, p370-373, 4p

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