يعرض 1 - 10 نتائج من 564 نتيجة بحث عن '"Hogan, K. A."', وقت الاستعلام: 1.56s تنقيح النتائج
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    دورية أكاديمية

    المصدر: IEEE Transactions on Applied Superconductivity IEEE Trans. Appl. Supercond. Applied Superconductivity, IEEE Transactions on. 33(5):1-5 Aug, 2023

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    دورية أكاديمية

    المؤلفون: Nievergelt, CM, Maihofer, AX, Atkinson, EG, Chen, CY, Choi, KW, Coleman, JRI, Daskalakis, NP, Duncan, LE, Polimanti, R, Aaronson, C, Ananda, BA, Andersen, SB, Andreassen, OA, Arbisi, PA, Ashley-Koch, AE, Austin, SB, Avdibegovic, E, Babic, D, Bacanu, SA, Baker, DG, Batzler, A, Beckham, JC, Belangero, S, Benjet, C, Bergner, C, Bierer, LM, Biernacka, JM, Bierut, LJ, Bisson, JI, Boks, MP, Bolger, EA, Brandolino, A, Breen, G, Bressan, RA, Bryant, RA, Bustamante, AC, Bybjerg-Grauholm, J, Baekvad-Hansen, M, Borglum, AD, Borte, S, Cahn, L, Calabrese, JR, Caldas-De-Almeida, JM, Chatzinakos, C, Cheema, S, Clouston, SAP, Colodro-Conde, L, Coombes, BJ, Cruz-Fuentes, CS, Dale, AM, Dalvie, S, Davis, LK, Deckert, J, Delahanty, DL, Dennis, MF, Desarnaud, F, DiPietro, CP, Disner, SG, Docherty, AR, Domschke, K, Dyb, G, Kulenovic, AD, Edenberg, HJ, Evans, A, Fabbri, C, Fani, N, Farrer, LA, Feder, A, Feeny, NC, Flory, JD, Forbes, D, Franz, CE, Galea, S, Garrett, ME, Gelaye, B, Gelernter, J, Geuze, E, Gillespie, CF, Goleva, SB, Gordon, SD, Goci, A, Grasser, LR, Guindalini, C, Haas, M, Hagenaars, S, Hauser, MA, Heath, AC, Hemmings, SMJ, Hesselbrock, V, Hickie, IB, Hogan, K, Hougaard, DM, Huang, H, Huckins, LM, Hveem, K, Jakovljevic, M, Javanbakht, A, Jenkins, GD, Johnson, J, Jones, I, Jovanovic, T, Karstoft, KI, Kaufman, ML, Kennedy, JL, Kessler, RC, Khan, A, Kimbrel, NA, King, AP, Koen, N, Kotov, R, Kranzler, HR, Krebs, K, Kremen, WS, Kuan, PF, Lawford, BR, Lebois, LAM, Lehto, K, Levey, DF, Lewis, C, Liberzon, I, Linnstaedt, SD, Logue, MW, Lori, A, Lu, Y, Luft, BJ, Lupton, MK, Luykx, JJ, Makotkine, I, Maples-Keller, JL, Marchese, S, Marmar, C, Martin, NG, Martinez-Levy, GA, McAloney, K, McFarlane, A, McLaughlin, KA, McLean, SA, Medland, SE, Mehta, D, Meyers, J, Michopoulos, V, Mikita, EA, Milani, L, Milberg, W, Miller, MW, Morey, RA, Morris, CP, Mors, O, Mortensen, PB, Mufford, MS, Nelson, EC, Nordentoft, M, Norman, SB, Nugent, NR, O'Donnell, M, Orcutt, HK, Pan, PM, Panizzon, MS, Pathak, GA, Peters, ES, Peterson, AL, Peverill, M, Pietrzak, RH, Polusny, MA, Porjesz, B, Powers, A, Qin, XJ, Ratanatharathorn, A, Risbrough, VB, Roberts, AL, Rothbaum, AO, Rothbaum, BO, Roy-Byrne, P, Ruggiero, KJ, Rung, A, Runz, H, Rutten, BPF, de Viteri, SS, Salum, GA, Sampson, L, Sanchez, SE, Santoro, M, Seah, C, Seedat, S, Seng, JS, Shabalin, A, Sheerin, CM, Silove, D, Smith, AK, Smoller, JW, Sponheim, SR, Stein, DJ, Stensland, S, Stevens, JS, Sumner, JA, Teicher, MH, Thompson, WK, Tiwari, AK, Trapido, E, Uddin, M, Ursano, RJ, Valdimarsdottir, U, Van Hooff, M, Vermetten, E, Vinkers, CH, Voisey, J, Wang, YP, Wang, ZW, Waszczuk, M, Weber, H, Wendt, FR, Werge, T, Williams, MA, Williamson, DE, Winsvold, BS, Winternitz, S, Wolf, C, Wolf, EJ, Xia, Y, Xiong, Y, Yehuda, R, Young, KA, Young, RM, Zai, CC, Zai, GC, Zervas, M, Zhao, HY, Zoellner, LA, Zwart, JA, DeRoon-Cassini, T, Van Rooij, SJH, van den Heuvel, LL, Stein, MB, Ressler, KJ, Koenen, KC

    المصدر: Nature genetics. 56(5):792-808

    مصطلحات موضوعية: Medicin och hälsovetenskap

  3. 3
    دورية أكاديمية
  4. 4
    دورية أكاديمية

    المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 67(10):3983-3987 Oct, 2020

  5. 5
    مؤتمر

    المصدر: 2019 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2019 IEEE International. :1-6 Mar, 2019

    Relation: 2019 IEEE International Reliability Physics Symposium (IRPS)

  6. 6
    دورية أكاديمية

    المصدر: IEEE Transactions on Applied Superconductivity IEEE Trans. Appl. Supercond. Applied Superconductivity, IEEE Transactions on. 29(3):1-9 Apr, 2019

  7. 7
    دورية أكاديمية

    المصدر: IEEE Journal of the Electron Devices Society IEEE J. Electron Devices Soc. Electron Devices Society, IEEE Journal of the. 7:581-588 2019

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