-
1مؤتمر
المؤلفون: Seong Geon Park, Beom Jun Jin, Hye Lan Lee, Hong Bae Park, Taek Soo Jeon, Hag-Ju Cho, Sang Yong Kim, Soo Ik Jang, Sang Bom Kang, Yu Gyun Shin, U-In Chung, Joo Tae Moon
المصدر: IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. Electron devices meeting Electron Devices Meeting, 2004. IEDM Technical Digest. IEEE International. :515-518 2004
Relation: 2004 International Electron Devices Meeting
-
2مؤتمر
المؤلفون: Jong-Wook Lee, Sun-Ghil Lee, Young-Pil Kimx, Young-Pil Kim, Chul-Sung Kim, Hag-Ju Cho, Seung-Beom Kim, In-Soo Jung, Deok-Hyung Lee, Dong-Chan Kim, Taek-Soo Jeon, Seong-Geon Park, Hong-Bae Park, Yong-Hoon Son, Young-Eun Lee, Beom-Jun Jin, Hye-Lan Lee, Bon-Young Koo, Sang-Bom Kang, Yu Gyun Shin, U-In Chung, Joo-Tae Moon, Byung-Il Ryu
المصدر: IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. Electron devices meeting Electron Devices Meeting, 2004. IEDM Technical Digest. IEEE International. :1047-1050 2004
Relation: 2004 International Electron Devices Meeting
-
3مؤتمر
المؤلفون: Sang Hyun Cho, Hong Bae Park
المصدر: IEEE 2002 28th Annual Conference of the Industrial Electronics Society. IECON 02 Industrial electronics society IECON 02 [Industrial Electronics Society, IEEE 2002 28th Annual Conference of the]. 2:1624-1629 vol.2 2002
Relation: 28th Annual Conference of the IEEE Industrial Electronics Society
-
4مؤتمر
المؤلفون: Jong Hae Kim, Do Chang Oh, Hong Bae Park
المصدر: Proceedings of the 2001 American Control Conference. (Cat. No.01CH37148) American control conference American Control Conference, 2001. Proceedings of the 2001. 5:4014-4019 vol.5 2001
Relation: Proceedings of American Control Conference
-
5مؤتمر
المؤلفون: Ki Tae Kim, Sang Hyun Cho, Kyung Ho Bang, Hong Bae Park
المصدر: IECON'01. 27th Annual Conference of the IEEE Industrial Electronics Society (Cat. No.37243) Industrial electronics - Denver Industrial Electronics Society, 2001. IECON '01. The 27th Annual Conference of the IEEE. 1:707-711 vol.1 2001
Relation: IECON'01. 27th Annual Conference of the IEEE Industrial Electronics Society
-
6مؤتمر
المؤلفون: Yeong Kwan Kim, Seung Hwan Lee, Sung Je Choi, Hong Bae Park, Young Dong Seo, Kwang Hyun Chin, Dongchan Kim, Jae Soon Lim, Wan Don Kim, Kab Jin Nam, Man-Ho Cho, Ki Hyun Hwang, Young Sun Kim, Seok Sik Kim, Young Wook Park, Joo Tae Moon, Sang In Lee, Moon Yong Lee
المصدر: International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138) Electron devices meeting Electron Devices Meeting, 2000. IEDM '00. Technical Digest. International. :369-372 2000
Relation: International Electron Devices Meeting. Technical Digest. IEDM
-
7مؤتمر
المؤلفون: Jong Hae Kim, Kap Rai Lee, Yong Chul Cho, Hyung Ho Lee, Hong Bae Park
المصدر: Proceedings of the 2000 American Control Conference. ACC (IEEE Cat. No.00CH36334) American control conference American Control Conference, 2000. Proceedings of the 2000. 1(6):80-84 vol.1 2000
Relation: Proceedings of 2000 American Control Conference (ACC 2000)
-
8مؤتمر
المؤلفون: Sang Hynn Cho, Ki Tae Kim, Hong Bae Park
المصدر: Proceedings of the 39th IEEE Conference on Decision and Control (Cat. No.00CH37187) Decision and control Decision and Control, 2000. Proceedings of the 39th IEEE Conference on. 4:3224-3229 vol.4 2000
Relation: Proceedings of the 39th IEEE Conference on Decision and Control
-
9مؤتمر
المؤلفون: Chang-Su Kim, Hong-Bae Park, Bung-Gwan Kim, Dae-Gwan Kang, Myoung-Goo Lee, Si-Woo Lee, Chan-Hee Jeon, Wan-Gu Kim, Young-Jae Yoo, Han-Sub Yoon
المصدر: Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 (IEEE Cat. No.00TH8476) Electrical overstress/electrostatic discharge symposium Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000. :407-412 2000
Relation: Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000
-
10مؤتمر
المؤلفون: Kap Rai Lee, Jong Hae Kim, Eun Tae Jeung, Han O Yun, Hong Bae Park
المصدر: Proceedings of the 1999 American Control Conference (Cat. No. 99CH36251) American control conference American Control Conference, 1999. Proceedings of the 1999. 2:1269-1273 vol.2 1999
Relation: Proceedings of the 1999 American Control Conference