المؤلفون: Mann, R. W., Hook, T. B., Nguyen, P. T., Calhoun, B. H.

المصدر: IEEE Transactions on Very Large Scale Integration (VLSI) Systems IEEE Trans. VLSI Syst. Very Large Scale Integration (VLSI) Systems, IEEE Transactions on. 20(7):1211-1220 Jul, 2012

المؤلفون: Yuan, X., Shimizu, T., Mahalingam, U., Brown, J. S., Habib, K. Z., Tekleab, D. G., Su, T.-C., Satadru, S., Olsen, C. M., Lee, H., Pan, L.-H., Hook, T. B., Han, J.-P., Park, J.-E., Na, M.-H., Rim, K.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 58(2):335-342 Feb, 2011

المؤلفون: Hook, T. B., Johnson, J. B., Han, J.-P., Pond, A., Shimizu, T., Tsutsui, G.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 57(10):2440-2447 Oct, 2010

المؤلفون: Lu, N., Hook, T. B., Johnson, J. B., Wermer, C., Putnam, C., Wachnik, R. A.

المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 34(9):1100-1102 Sep, 2013

المؤلفون: Hook, T. B., Johnson, J. B., Shah, J.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 58(8):2805-2807 Aug, 2011

المؤلفون: Johnson, J. B., Hook, T. B., Lee, Y.-M.

المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 29(7):802-804 Jul, 2008

المؤلفون: Lin, C.-H., Kambhampati, R., Miller, R. J., Hook, T. B., Bryant, A., Haensch, W., Oldiges, P., Lauer, I., Yamashita, T., Basker, V., Standaert, T., Rim, K., Leobandung, E., Bu, H., Khare, M.

المصدر: 2012 Symposium on VLSI Technology (VLSIT) VLSI Technology (VLSIT), 2012 Symposium on. :15-16 Jun, 2012

Relation: 2012 IEEE Symposium on VLSI Technology

المؤلفون: Paul, A., Bryant, A., Hook, T. B., Yeh, C. C., Kamineni, V., Johnson, J. B., Tripathi, N., Yamashita, T., Tsutsui, G., Basker, V., Standaert, T. E., Faltermeier, J., Haran, B. S., Kanakasabapathy, S., Bu, H., Cho, J., Iacoponi, J., Khare, M.

المصدر: 2013 IEEE International Electron Devices Meeting Electron Devices Meeting (IEDM), 2013 IEEE International. :13.5.1-13.5.4 Dec, 2013

Relation: 2013 IEEE International Electron Devices Meeting (IEDM)

المؤلفون: Hook, T. B., Johnson, J. B., Cathignol, A., Cros, A., Ghibaudo, G.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 58(4):1255-1256 Apr, 2011

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