-
1مؤتمر
المؤلفون: Cheng, H. Y., Grun, A., Chien, W C., Yeh, C. W., Ray, A., Cheng, C. W., Lai, E. K., Lavoie, C., Gignac, L., Hopstaken, M., Kuo, I. T., Hsu, C. S., Buzi, L., Bruce, R. L., Lee, D. Y., Gong, N., Bishop, D., BrightSky, M., Lung, H. L.
المصدر: 2022 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2022 International. :18.5.1-18.5.4 Dec, 2022
Relation: 2022 IEEE International Electron Devices Meeting (IEDM)
-
2مؤتمر
المؤلفون: Cartier, E., Majumdar, A., Lee, K.-T., Ando, T., Frank, M. M., Rozen, J., Jenkins, K. A., Liang, C., Cheng, C.-W., Bruley, J., Hopstaken, M., Kerber, P., Yau, J.-B., Sun, X., Mo, R. T., Yeh, C.-C., Leobandung, E., Narayanan, V.
المصدر: 2017 47th European Solid-State Device Research Conference (ESSDERC) Solid-State Device Research Conference (ESSDERC), 2017 47th European. :292-295 Sep, 2017
Relation: ESSDERC 2017 - 47th IEEE European Solid-State Device Research Conference (ESSDERC)
-
3مؤتمر
المؤلفون: Cheng, H. Y., Kuo, I. T., Chien, W. C., Yeh, C. W., Chou, Y. C., Gong, N., Gignac, L., Yang, C. H., Cheng, C. W., Lavoie, C., Hopstaken, M., Bruce, R. L., Buzi, L., Lai, E. K., Carta, F., Ray, A., Lee, M. H., Ho, H. Y., Kim, W., BrightSky, M., Lung, H. L.
المصدر: 2020 IEEE Symposium on VLSI Technology VLSI Technology, 2020 IEEE Symposium on. :1-2 Jun, 2020
Relation: 2020 IEEE Symposium on VLSI Technology
-
4مؤتمر
المؤلفون: Zhang, Z., Hengstebeck, B., Stevie, F. A., Hopstaken, M.
المصدر: 2016 27th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) Advanced Semiconductor Manufacturing Conference (ASMC), 2016 27th Annual SEMI. :172-175 May, 2016
Relation: 2016 27th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC)
-
5مؤتمر
المؤلفون: Cowern, N., Colombeau, B., Roozeboom, F., Hopstaken, M., Snijders, H., Meunier-Beillard, P., Lerch, W.
المصدر: 32nd European Solid-State Device Research Conference Solid-State Device Research Conference, 2002. Proceeding of the 32nd European. :203-206 2002
Relation: 32nd European Solid-State Device Research Conference
-
6دورية أكاديمية
المؤلفون: Zhang, Z., Atkin, J., Hopstaken, M., Hatzistergos, M., Ronsheim, P., Liniger, E., Laibowitz, R., Solomon, P. M.
المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 59(8):2027-2032 Aug, 2012
-
7مؤتمر
المؤلفون: Yamashita, T., Mehta, S., Basker, V.S., Southwick, R., Kumar, A., Kambhampati, R., Sathiyanarayanan, R., Johnson, J., Hook, T., Cohen, S., Li, J., Madan, A., Zhu, Z., Tai, L., Yao, Y., Chinthamanipeta, P., Hopstaken, M., Liu, Z., Lu, D., Chen, F., Khan, S., Canaperi, D., Haran, B., Stathis, J., Oldiges, P., Lin, C-H., Narasimha, S., Bryant, A., Henson, W.K., Kanakasabapathy, S., Murali, K.V.R.M., Gow, T., McHerron, D., Bu, H., Khare, M.
المصدر: 2015 Symposium on VLSI Technology (VLSI Technology) VLSI Technology (VLSI Technology), 2015 Symposium on. :T154-T155 Jun, 2015
Relation: 2015 Symposium on VLSI Technology
-
8دورية أكاديمية
المؤلفون: Majumdar, A., Sun, Y., Cheng, C., Kim, Y., Rana, U., Martin, R.M., Bruce, R.L., Shiu, K., Zhu, Y., Farmer, D.B., Hopstaken, M., Joseph, E.A., de Souza, J.P., Frank, M.M., Cheng, S., Kobayashi, M., Duch, E.A., Sadana, D.K., Park, D., Leobandung, E.
المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 61(10):3399-3404 Oct, 2014
-
9مؤتمر
المؤلفون: Linder, Barry P., Dasgupta, A., Ando, T., Cartier, E., Kwon, U., Southwick, R., Wang, M., Krishnan, S. A., Hopstaken, M., Bajaj, M., Pandey, R., Chang, W., Yamashita, T., Gluschenkov, O., Narayanan, V., Stathis, J., Ray, S., Liu, J.
المصدر: 2016 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2016 IEEE International. :4B-1-1-4B-1-5 Apr, 2016
Relation: 2016 IEEE International Reliability Physics Symposium (IRPS)
-
10دورية أكاديمية
المؤلفون: Zhang, Z., Koswatta, S. O., Bedell, S. W., Baraskar, A., Guillorn, M., Engelmann, S. U., Zhu, Y., Gonsalves, J., Pyzyna, A., Hopstaken, M., Witt, C., Yang, L., Liu, F., Newbury, J., Song, W., Cabral, C., Lofaro, M., Ozcan, A. S., Raymond, M., Lavoie, C., Sleight, J. W., Rodbell, K. P., Solomon, P. M.
المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 34(6):723-725 Jun, 2013