المؤلفون: Stepicheva, N. A.^{Aff4, Aff5}, Shang, P.^{Aff4, Aff6}, Ghosh, S.^Aff4, Koontz, V.^Aff4, Hose, S.^Aff4, Zigler, J. S., Jr^Aff7, Sinha, D.^{Aff4, Aff7}

المساهمون: Singh, Arun D., Series Editor^Aff1, Prakash, Gyan, editor^Aff2, Iwata, Takeshi, editor^Aff3

المصدر: Advances in Vision Research, Volume IV : From Basic to Translational Research — Developing Diagnostics and Therapeutics for Genetic Eye Diseases. :131-143

المؤلفون: McGlone, J. M., Brizar, G., Vanderstraeten, D., Iyer, D., Hose, S., Gambino, J.P.

المصدر: 2020 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2020 IEEE International. :1-5 Apr, 2020

Relation: 2020 IEEE International Reliability Physics Symposium (IRPS)

المؤلفون: Greenwood, B., Suhwanov, A., Daniel, D., Menon, S., Price, D., Hose, S., Guo, J., Piatt, G., Lu, M., Watanabe, Y., Kanuma, Y., Takada, R., Sheng, L., Gambino, J. P., Whear, Oli

المصدر: 2017 28th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) Advanced Semiconductor Manufacturing Conference (ASMC), 2017 28th Annual SEMI. :346-351 May, 2017

Relation: 2017 28th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC)

المؤلفون: Gambino, J. P., Watanabe, Y., Kanuma, Y., Greenwood, B., Price, D., Suwhanov, A., Hose, S., Whear, O.

المصدر: 2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2016 IEEE 23rd International Symposium on the. :321-325 Jul, 2016

Relation: 2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

المؤلفون: Biglarbegian, B., Nezhad-Ahmadi, M. R., Hoggat, C., Hose, S., Fakharzadeh, M., Safavi-Naeini, S.

المصدر: 2010 IEEE Antennas and Propagation Society International Symposium Antennas and Propagation Society International Symposium (APSURSI), 2010 IEEE. :1-4 Jul, 2010

Relation: 2010 IEEE International Symposium Antennas and Propagation and CNC/USNC/URSI Radio Science Meeting

المؤلفون: Austin, D.Z., Allman, D., Price, D., Hose, S., Conley, J.F.

المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 36(5):496-498 May, 2015

المؤلفون: Hose, S., DortmundKramer, Walter, Borken bei Kassel (GewährspersonGewährsperson), Hose, S., DortmundKramer, Walter, Borken near Kassel (guarantor)

المصدر: LWL-Volkskundlichen Kommission für Westfalen
LWL-Volkskunde Commission for Westphalia

الإتاحة: http://data.europeana.eu/aggregation/europeana/2023846/medienarchiv_web_detailansicht_id_173925

المؤلفون: Hose, S., DortmundKramer, Walter, Borken near Kassel (guarantor), Hose, S., DortmundKramer, Walter, Borken bei Kassel (GewährspersonGewährsperson)

المصدر: LWL-Volkskunde Commission for Westphalia
LWL-Volkskundlichen Kommission für Westfalen

الإتاحة: http://data.europeana.eu/aggregation/europeana/2023846/medienarchiv_web_detailansicht_id_173924

المؤلفون: Schultze, W.^Aff2, Hose, S.^Aff3, Abou-Mandour, A.^Aff3, Czygan, F.-C.^Aff3

المساهمون: Bajaj, Y. P. S., editor^Aff1

المصدر: Medicinal and Aromatic Plants V. 24:242-268

المؤلفون: Hoses, S., DortmundStrose, Dortmund (guarantor), Hose, S., DortmundStrose,, Dortmund (GewährspersonGewährsperson)

المصدر: LWL-Volkskunde Commission for Westphalia
LWL-Volkskundlichen Kommission für Westfalen

الإتاحة: http://data.europeana.eu/aggregation/europeana/2023846/medienarchiv_web_detailansicht_id_173920