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1مؤتمرPrompt Shift of On-State Resistance in LDMOS Devices: Causes, Recovery, and Reliability Implications
المؤلفون: Prigann, Sven, Feil, Maximilian W., Reisinger, Hans, Bissinger, Jochen, Strasser, Marc, Waltl, Michael, Schlipf, Johannes, Kaya, Turgay, Bartholomaus, Lars, Gustin, Wolfgang, Basler, Thomas
المصدر: 2024 36th International Symposium on Power Semiconductor Devices and ICs (ISPSD) Power Semiconductor Devices and ICs (ISPSD), 2024 36th International Symposium on. :394-397 Jun, 2024
Relation: 2024 36th International Symposium on Power Semiconductor Devices and ICs (ISPSD)
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2مؤتمر
المؤلفون: Teng, Qiao, Wu, Yongyu, Kang, Junzhe, Xu, Kai, Gao, Dawei
المصدر: 2024 IEEE International Reliability Physics Symposium (IRPS) International Reliability Physics Symposium (IRPS), 2024 IEEE. :1-4 Apr, 2024
Relation: 2024 IEEE International Reliability Physics Symposium (IRPS)
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3مؤتمر
المؤلفون: Qu, Yiming, Yan, Chu, Ding, Yaru, Zhao, Yi
المصدر: 2024 IEEE International Reliability Physics Symposium (IRPS) International Reliability Physics Symposium (IRPS), 2024 IEEE. :1-6 Apr, 2024
Relation: 2024 IEEE International Reliability Physics Symposium (IRPS)
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4مؤتمر
المؤلفون: Qian, Yijun, Gao, Yuan, Shukla, Amit Kumar, Wu, Tao, Mu, Zhiqiang, Lu, Kai, Dong, Yemin, Wei, Xing, Yang, Yumeng
المصدر: 2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) Electron Devices Technology & Manufacturing Conference (EDTM), 2024 8th IEEE. :1-3 Mar, 2024
Relation: 2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)
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5مؤتمر
المؤلفون: Monga, Udit, Gogineni, Usha, Hetzel, Ines, Jin, Chong, Steinmair, Alexander
المصدر: 2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) Electron Devices Technology & Manufacturing Conference (EDTM), 2024 8th IEEE. :1-3 Mar, 2024
Relation: 2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)
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6دورية أكاديمية
المصدر: IEEE Access Access, IEEE. 12:10988-10994 2024
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7دورية أكاديمية
المؤلفون: Mahapatra, S., Diwakar, H., Thakor, K., Choudhury, N., Chatterjee, P., Kumar, S., Singhal, U., Sharma, U.
المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 71(1):126-137 Jan, 2024
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8مؤتمر
المؤلفون: Susnik, Sabina, Pobegen, Gregor, Grasser, Tibor
المصدر: 2023 IEEE International Integrated Reliability Workshop (IIRW) Integrated Reliability Workshop (IIRW), 2023 IEEE International. :1-4 Oct, 2023
Relation: 2023 IEEE International Integrated Reliability Workshop (IIRW)
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9مؤتمر
المؤلفون: Sicre, Mathieu, Roy, David, Calmon, Francis
المصدر: ESSDERC 2023 - IEEE 53rd European Solid-State Device Research Conference (ESSDERC) Solid-State Device Research Conference (ESSDERC), ESSDERC 2023 - IEEE 53rd European. :61-64 Sep, 2023
Relation: ESSDERC 2023 - IEEE 53rd European Solid-State Device Research Conference (ESSDERC)
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10مؤتمر
المؤلفون: Kerber, Andreas, Kliza, Phil, Beckmeier, Daniel, Ravindranath, Abhimanyu, Yuan, Luo, Liu, Yun, Jungroth, Owen W.
المصدر: 2023 37th Symposium on Microelectronics Technology and Devices (SBMicro) Microelectronics Technology and Devices (SBMicro), 2023 37th Symposium on. :1-5 Aug, 2023
Relation: 2023 37th Symposium on Microelectronics Technology and Devices (SBMicro)