يعرض 1 - 10 نتائج من 1,115 نتيجة بحث عن '"Hot carrier degradation"', وقت الاستعلام: 0.84s تنقيح النتائج
  1. 1
    مؤتمر
    Prompt Shift of On-State Resistance in LDMOS Devices: Causes, Recovery, and Reliability Implications

    المؤلفون: Prigann, Sven, Feil, Maximilian W., Reisinger, Hans, Bissinger, Jochen, Strasser, Marc, Waltl, Michael, Schlipf, Johannes, Kaya, Turgay, Bartholomaus, Lars, Gustin, Wolfgang, Basler, Thomas

    المصدر: 2024 36th International Symposium on Power Semiconductor Devices and ICs (ISPSD) Power Semiconductor Devices and ICs (ISPSD), 2024 36th International Symposium on. :394-397 Jun, 2024

    Relation: 2024 36th International Symposium on Power Semiconductor Devices and ICs (ISPSD)

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  2. 2
    مؤتمر
    Impact of Lightly Doped Drain on Hot Carrier Degradation Variability in N-FETs and SRAM Cells

    المؤلفون: Teng, Qiao, Wu, Yongyu, Kang, Junzhe, Xu, Kai, Gao, Dawei

    المصدر: 2024 IEEE International Reliability Physics Symposium (IRPS) International Reliability Physics Symposium (IRPS), 2024 IEEE. :1-4 Apr, 2024

    Relation: 2024 IEEE International Reliability Physics Symposium (IRPS)

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  3. 3
    مؤتمر
    Impact of Hot Carrier Degradation and Bias Temperature Instability on GHz Cycle-to-Cycle Variation in Ultra-Scaled FinFETs

    المؤلفون: Qu, Yiming, Yan, Chu, Ding, Yaru, Zhao, Yi

    المصدر: 2024 IEEE International Reliability Physics Symposium (IRPS) International Reliability Physics Symposium (IRPS), 2024 IEEE. :1-6 Apr, 2024

    Relation: 2024 IEEE International Reliability Physics Symposium (IRPS)

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  4. 4
    مؤتمر
    Influence of Localized Hot Carrier Degradation in DSOI Device Operating in MOSFET and BJT Modes

    المؤلفون: Qian, Yijun, Gao, Yuan, Shukla, Amit Kumar, Wu, Tao, Mu, Zhiqiang, Lu, Kai, Dong, Yemin, Wei, Xing, Yang, Yumeng

    المصدر: 2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) Electron Devices Technology & Manufacturing Conference (EDTM), 2024 8th IEEE. :1-3 Mar, 2024

    Relation: 2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)

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  5. 5
    مؤتمر
    A Comprehensive SPICE Modeling Methodology for Hot-carrier Degradation

    المؤلفون: Monga, Udit, Gogineni, Usha, Hetzel, Ines, Jin, Chong, Steinmair, Alexander

    المصدر: 2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) Electron Devices Technology & Manufacturing Conference (EDTM), 2024 8th IEEE. :1-3 Mar, 2024

    Relation: 2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)

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  6. 6
    دورية أكاديمية
    Cryogenic Body Bias Effect in DRAM Peripheral and Buried-Channel-Array Transistor for Quantum Computing Applications

    المؤلفون: You, H., Nam, K., An, J., Park, C., Kim, D., Lee, S., Lee, N., Baek, R.

    المصدر: IEEE Access Access, IEEE. 12:10988-10994 2024

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  7. 7
    دورية أكاديمية
    A Generic Framework for MOSFET Reliability—Part II: Gate and Drain Stress—HCD

    المؤلفون: Mahapatra, S., Diwakar, H., Thakor, K., Choudhury, N., Chatterjee, P., Kumar, S., Singhal, U., Sharma, U.

    المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 71(1):126-137 Jan, 2024

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  8. 8
    مؤتمر
    Hot-carrier-degradation measured with charge-pumping in trench devices despite deep contacts

    المؤلفون: Susnik, Sabina, Pobegen, Gregor, Grasser, Tibor

    المصدر: 2023 IEEE International Integrated Reliability Workshop (IIRW) Integrated Reliability Workshop (IIRW), 2023 IEEE International. :1-4 Oct, 2023

    Relation: 2023 IEEE International Integrated Reliability Workshop (IIRW)

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  9. 9
    مؤتمر
    Hot-Carrier Degradation modeling of DCR drift in SPADs

    المؤلفون: Sicre, Mathieu, Roy, David, Calmon, Francis

    المصدر: ESSDERC 2023 - IEEE 53rd European Solid-State Device Research Conference (ESSDERC) Solid-State Device Research Conference (ESSDERC), ESSDERC 2023 - IEEE 53rd European. :61-64 Sep, 2023

    Relation: ESSDERC 2023 - IEEE 53rd European Solid-State Device Research Conference (ESSDERC)

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  10. 10
    مؤتمر
    Ring Oscillator Aging Characterization in Conventional CMOS Technologies

    المؤلفون: Kerber, Andreas, Kliza, Phil, Beckmeier, Daniel, Ravindranath, Abhimanyu, Yuan, Luo, Liu, Yun, Jungroth, Owen W.

    المصدر: 2023 37th Symposium on Microelectronics Technology and Devices (SBMicro) Microelectronics Technology and Devices (SBMicro), 2023 37th Symposium on. :1-5 Aug, 2023

    Relation: 2023 37th Symposium on Microelectronics Technology and Devices (SBMicro)

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