المؤلفون: Lu, L., Bian, J., Ma, S., Liu, Y., Dai, Y., Zhu, Z., Liu, S., Sun, W., Lin, F., Xu, C., Xu, P.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 71(1):935-939 Jan, 2024

المؤلفون: Ioannou, Dimitris P., Gebreselasie, Ephrem, Pham, Vinh, Raghunathan, Uppili S.

المصدر: 2023 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS) BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS), 2023 IEEE. :245-248 Oct, 2023

Relation: 2023 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS)

المؤلفون: Lu, L., Zhu, Z., Dai, Y., Liu, S., Sun, W., Zhang, L., Lin, F., Xiao, J., Sun, J.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 70(9):4547-4553 Sep, 2023

المؤلفون: Basak, Arighna, Deyasi, Arpan, Sarkar, Angsuman

المصدر: 2023 IEEE Devices for Integrated Circuit (DevIC) Devices for Integrated Circuit (DevIC), 2023 IEEE. :516-521 Apr, 2023

Relation: 2023 IEEE Devices for Integrated Circuit (DevIC)

المؤلفون: Zhang, Xinyi, Wang, Kewei, Wang, Fang, Li, Jiangjiang, Wu, Zhicheng, Li, Duoli, Li, Bo, Bu, Jianhui, Han, Zhengsheng

المصدر: 2023 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2023 IEEE International. :1-5 Mar, 2023

Relation: 2023 IEEE International Reliability Physics Symposium (IRPS)

المؤلفون: Kaushal, K.N., Mohapatra, N.R.

المصدر: IEEE Journal of the Electron Devices Society IEEE J. Electron Devices Soc. Electron Devices Society, IEEE Journal of the. 9:334-341 2021

المؤلفون: Lu, L., Lin, F., Ma, S., Yin, Z., Sang, Y., Sun, W., Liu, S., Su, W.

المصدر: IEEE Journal of the Electron Devices Society IEEE J. Electron Devices Soc. Electron Devices Society, IEEE Journal of the. 9:1188-1193 2021

المؤلفون: Mahmud, Md Iqbal, Ranjan, Rakesh, Lee, Ki-Don, Perepa, Pavitra Ramadevi, Dongkyun Kwon, Caleb, Choo, Seungjin, Choi, Kihyun

المصدر: 2022 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2022 IEEE International. :P58-1-P58-4 Mar, 2022

Relation: 2022 IEEE International Reliability Physics Symposium (IRPS)

المؤلفون: Zhang, C., Li, Y., Li, Z., Fu, X., Chen, Z.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 65(8):3567-3571 Aug, 2018

المؤلفون: Soman, Sajitha, Nirmal, D., Nair, Prabha. P., Ramya, M S Annie, Jeba, I. Kingsly

المصدر: 2013 International Mutli-Conference on Automation, Computing, Communication, Control and Compressed Sensing (iMac4s) Automation, Computing, Communication, Control and Compressed Sensing (iMac4s), 2013 International Multi-Conference on. :494-497 Mar, 2013

Relation: 2013 International Multi-Conference on Automation, Computing, Communication, Control and Compressed Sensing (iMac4s)