المؤلفون: Hsia, H., Tsai, C.H., Ting, K.C., Kuo, F.W., Lin, C.C., Wang, C.T., Hou, S.Y., Chiou, W.C., Yu, Douglas C.H.

المصدر: 2021 IEEE 71st Electronic Components and Technology Conference (ECTC) ECTC Electronic Components and Technology Conference (ECTC), 2021 IEEE 71st. :263-268 Jun, 2021

Relation: 2021 IEEE 71st Electronic Components and Technology Conference (ECTC)

المؤلفون: Hou, S.Y., Chen, W.C., Hu, C., Chiu, C., Ting, K.C., Lin, T.S., Wei, W.H., Chiou, W.C., Lin, V.J.C., Chang, V.C.Y., Wang, C.T., Wu, C.H., Yu, D.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 64(10):4071-4077 Oct, 2017

المؤلفون: Hou, S.Y., Hsia, H., Tsai, C.H., Ting, K.C., Yu, T.H., Lee, Y.W., Chen, F.C., Chiou, W.C., Wang, C.T., Wu, C.H., Yu, Douglas

المصدر: 2019 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2019 IEEE International. :19.5.1-19.5.4 Dec, 2019

Relation: 2019 IEEE International Electron Devices Meeting (IEDM)

المؤلفون: Hou, S.Y., Shih, C.W., Wu, W.C., Hsieh, C.H., Su, A.J., Tung, C.H., Jeng, S.P., Li, M.J., Yu, Doug. C.H.

المصدر: 2010 IEEE International Interconnect Technology Conference Interconnect Technology Conference (IITC), 2010 International. :1-3 Jun, 2010

Relation: 2010 IEEE International Interconnect Technology Conference - IITC

المؤلفون: Young, K.K., Wu, S.Y., Wu, C.C., Wang, C.H., Lin, C.T., Cheng, J.Y., Chiang, M., Chen, S.H., Lo, T.C., Chen, Y.S., Chen, J.H., Chen, L.J., Hou, S.Y., Law, J.J., Chang, T.E., Hou, C.S., Shih, J., Jeng, S.M., Hsieh, H.C., Ku, Y., Yen, T., Tao, H., Chao, L.C., Shue, S., Jang, S.M., Ong, T.C., Yu, C.H., Liang, M.S., Diaz, C.H., Sun, J.Y.C.

المصدر: International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138) Electron devices meeting Electron Devices Meeting, 2000. IEDM '00. Technical Digest. International. :563-566 2000

Relation: International Electron Devices Meeting. Technical Digest. IEDM

المؤلفون: Liao, W.S., Chiang, C.C., Wu, W.M., Fan, C. H., Chiu, S.L., Chiu, C.C., Chen, T.Y., Hsieh, C.C., Chen, H.Y., Lo, H.Y., Huang, L.C., Wu, T.J., Chiou, W.C., Hou, S.Y., Jeng, S.P., Doug Yu

المصدر: 2014 Symposium on VLSI Technology (VLSI-Technology): Digest of Technical Papers VLSI Technology (VLSI-Technology): Digest of Technical Papers, 2014 Symposium on. :1-2 Jun, 2014

Relation: 2014 IEEE Symposium on VLSI Technology

المؤلفون: Zhongyang, L. (identifier), Hou, S.Y. (collector) (field number: 1695)

URL الوصول: https://www.europeana.eu/item/11614/KXHERBARIUMXK000951616?utm_source=api&utm_medium=api&utm_campaign=YuvuWBeCa

المؤلفون: Liao, W.S., Chang, C.H., Huang, S.W., Liu, T.H., Hu, H.P., Lin, H.L., Tsai, C.Y., Tsai, C.S., Chu, H.C., Pai, C.Y., Chiang, W.C., Hou, S.Y., Jeng, S.P., Yu, Doug

المصدر: 2014 IEEE International Electron Devices Meeting Electron Devices Meeting (IEDM), 2014 IEEE International. :27.3.1-27.3.4 Dec, 2014

Relation: 2014 IEEE International Electron Devices Meeting (IEDM)

المؤلفون: Liao, W.S., Chen, H.N., Yen, K.K., Yeh, E.H., Kuo, F.W., Yeh, T.J., Kuo, F., Jou, C.P., Liu, S., Hsueh, F.L., Lin, H.C., Peng, C.N., Wang, M.J., Wu, W.C., Hu, S.P., Chen, M.F., Hou, S.Y., Jeng, S.P., Yu, C.H., Yee, K.C., Yu, Doug

المصدر: 2013 Symposium on VLSI Technology VLSI Technology (VLSIT), 2013 Symposium on. :C18-C19 Jun, 2013

Relation: 2013 Symposium on VLSI Technology

المؤلفون: Ibbotson, D., Rahman, A., Xie, J., Chanda, K., Lee, M.J., Ratakonda, D., Li, Z., Hsu, K.C., Jeng, S.P., Hou, S.Y., Yu, Douglas C.H.

المصدر: 2013 Symposium on VLSI Technology VLSI Technology (VLSIT), 2013 Symposium on. :T38-T39 Jun, 2013

Relation: 2013 Symposium on VLSI Technology