المؤلفون: Liu, W., Lim, Y.K., Zhang, F., Liu, H., Zhao, Y.H., Du, A.Y., Zhang, B.C., Tan, J.B., Sohn, D.K., Hsia, L.C.

المصدر: 2010 IEEE International Reliability Physics Symposium Reliability Physics Symposium (IRPS), 2010 IEEE International. :906-910 May, 2010

Relation: 2010 IEEE International Reliability Physics Symposium (IRPS)

المؤلفون: Lim, Y.K., Pey, K.L., Tan, J.B., Lee, T.J., Vigar, D., Hsia, L.C., Lim, Y.H., Kamat, N.R.

المصدر: IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. International Electron Devices Meeting 2005 Electron Devices Meeting, 2005. IEDM Technical Digest. IEEE International. :179-182 2005

Relation: International Electron Devices Meeting 2005

المؤلفون: Lim, Y.K., Lim, Y.H., Seet, C.S., Zhang, B.C., Chok, K.L., See, K.H., Lee, T.J., Hsia, L.C., Pey, K.L.

المصدر: 2004 IEEE International Reliability Physics Symposium. Proceedings Reliability physics Reliability Physics Symposium Proceedings, 2004. 42nd Annual. 2004 IEEE International. :240-245 2004

Relation: 2004 IEEE International Reliability Physics Symposium. Proceedings

المؤلفون: Ang, C.H., Lu, W.H., Yap, A.K.L., Goh, L.C., Goh, L.N.L., Lim, Y.K., Chua, C.S., Ko, L.H., Tan, T.H.S., Toh, S.L., Hsia, L.C.

المصدر: 2004 International Conference on Integrated Circuit Design and Technology (IEEE Cat. No.04EX866) Integrated circuit design and technology Integrated Circuit Design and Technology, 2004. ICICDT '04. International Conference on. :119-122 2004

Relation: 2004 International Conference on Integrated Circuit Design and Technology

المؤلفون: Tsai, C.W., Gu, S.H., Chiang, L.P., Wang, T., Liu, Y.C., Huang, L.S., Wang, M.C., Hsia, L.C.

المصدر: International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138) Electron devices meeting Electron Devices Meeting, 2000. IEDM '00. Technical Digest. International. :139-142 2000

Relation: International Electron Devices Meeting. Technical Digest. IEDM

المؤلفون: Tan, J.B., Zhang, B.C., Tang, T.J., Perera, C., Lim, Y.K., Siew, Y.K., Ee, Y.C., Lu, W., Liu, H., Seet, C.S., Zhang, H., Lim, S.K., Chua, S.T., Ismail, Z., Seah, B.M., Ee, P.Y., Vigar, D., Hsia, L.C.

المصدر: 2006 International Interconnect Technology Conference Interconnect Technology Conference, 2006 International. :6-8 2006

Relation: 2006 International Interconnect Technology Conference

المؤلفون: Hsia, L.C., Chang, T., Chang, S.J., Fan, D., Wei, H.Y., Jan, J.

المصدر: Proceedings of Technical Papers. International Symposium on VLSI Technology, Systems, and Applications VLSI Technology, Systems, and Applications, 1997. Proceedings of Technical Papers. 1997 International Symposium on. :142-147 1997

Relation: International Symposium on VLSI Technology, Systems, and Applications

المؤلفون: Toh, S.L., Tan, P.K., Hendarto, E., Deng, Q., Lin, H.B., Goh, Y.W., Zhu, L., Tan, H., Wang, Q.F., He, R., Lam, J., Hsia, L.C., Mai, Z.H.

المصدر: 2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits Physical and Failure Analysis of Integrated Circuits, 2009. IPFA 2009. 16th IEEE International Symposium on the. :195-199 Jul, 2009

Relation: 2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

المؤلفون: Tong, Y., Lim, Y.K., Chen, C.Q., Zhang, W.Y., Tan, J.B., Sohn, D.K., Hsia, L.C.

المصدر: 2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits Physical and Failure Analysis of Integrated Circuits, 2009. IPFA 2009. 16th IEEE International Symposium on the. :719-722 Jul, 2009

Relation: 2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

المؤلفون: Heryanto, A., Lim, Y.K., Pey, K.L., Liu, W., Tan, J.B., Sohn, D.K., Hsia, L.C.

المصدر: 2009 IEEE International Interconnect Technology Conference Interconnect Technology Conference, 2009. IITC 2009. IEEE International. :92-94 Jun, 2009

Relation: 2009 IEEE International Interconnect Technology Conference - IITC