المؤلفون: Huang, B., Hsieh, W., Tu, C., Liu, Y., Chen, Y., Chen, W., Cheng, C., Chou, H., Liu, C.W.

المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 45(6):956-959 Jun, 2024

المؤلفون: Hsieh, W., Tu, C., Chen, Y., Huang, B., Chen, W., Liu, Y., Cheng, C., Chou, H., Liu, C.W.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 71(5):3383-3389 May, 2024

المؤلفون: Hsieh, W., Chen, Y., Liu, Y., Zhao, Z., Lee, J., Tu, C., Huang, B., Wang, J., Lee, M.H., Liu, C.W.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 71(3):1758-1763 Mar, 2024

المؤلفون: Wang, S.‑H.^{Aff1, Aff2}, Lee, C.-Y.^{Aff3, Aff4}, Hsieh, W.-C., Yen, J.-B., Tseng, I.-M., Wong, C.-H.^{Aff8, IDs10029024030553_cor6}, Ho, D.-R.^{Aff2, Aff9, Aff10, IDs10029024030553_cor7}

المصدر: Hernia: The World Journal of Hernia and Abdominal Wall Surgery. 28(4):1365-1372

المؤلفون: Huang, C., Hsieh, W., Shao, T., Wu, C., Lu, T.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 70(6):3166-3171 Jun, 2023

المؤلفون: Hsieh, W., Ku, C.C., Hwang, H.P., Tsai, M., Chen, Z.

المصدر: IEEE Journal of Translational Engineering in Health and Medicine IEEE J. Transl. Eng. Health Med. Translational Engineering in Health and Medicine, IEEE Journal of. 11:375-383 2023

المؤلفون: Chen, Y., Huang, B., Cheng, C., Hsieh, W., Tsai, C., Tu, C., Liu, Y., Liu, C.W.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 69(7):3611-3616 Jul, 2022

المؤلفون: Tu, C., Hsieh, W., Huang, B., Chen, Y., Liu, Y., Tsai, C., Chueh, S., Liu, C.W.

المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 43(5):682-685 May, 2022

المؤلفون: Su, Frank, Hsieh, W. F., Lin, Henry, Chen, Vincent, Lou, Y. S.

المصدر: 2021 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2021 IEEE International Symposium on the. :1-4 Sep, 2021

Relation: 2021 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

المؤلفون: Huang, B., Tsai, C., Liu, Y., Tu, C., Hsieh, W., Jan, S., Chen, Y., Chueh, S., Cheng, C., Liu, C.W.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 69(4):2130-2136 Apr, 2022