المؤلفون: Fan Weifeng, Te-Chen Chung, Chiamin Yu, Pei-Yang Lin, Hsin-Chieh Lai, Yanbing Qiao, Shih-Bin Liu

المصدر: SID Symposium Digest of Technical Papers. 50:669-672

مصطلحات موضوعية: Computer science, Luminance, Reliability (statistics), Reliability engineering

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::357170b8b727331891e46c0326b3fe74
https://doi.org/10.1002/sdtp.13606

المؤلفون: Wen-Hai Chih, Yu-An Lin, Hsin-Chieh Lai

المصدر: Marketing Review / Xing Xiao Ping Lun; 2010, Vol. 7 Issue 3, p357-379, 23p