المؤلفون: Kuo, Gia-Wei, Tseng, Hsiao-Chien, Hu, Shih-Hsin, Lin, Hui-Yun, Lu, Pei-Yu, Yeh, Chung-Han, Tsai, I-Chang

المصدر: 2020 IEEE International Conference on Teaching, Assessment, and Learning for Engineering (TALE) Teaching, Assessment, and Learning for Engineering (TALE), 2020 IEEE International Conference on. :737-741 Dec, 2020

Relation: 2020 IEEE International Conference on Teaching, Assessment, and Learning for Engineering (TALE)

المؤلفون: Kuo, Chia-Wei, Yang, Hai-Ling, Liao, Hsien-Cheng, Hu, Shih-Hsin, Tseng, Hsiao-Chien, Yeh, Chung-Han, Tsai, I-Chang

المصدر: 2019 IEEE International Conference on Engineering, Technology and Education (TALE) Engineering, Technology and Education (TALE), 2019 IEEE International Conference on. :1-5 Dec, 2019

Relation: 2019 IEEE International Conference on Engineering, Technology and Education (TALE)

المؤلفون: Hu, Shih-Hsin, Abraham, Jacob A.

المصدر: 2016 IEEE 25th Asian Test Symposium (ATS) Asian Test Symposium, 2016 IEEE 25th Asian Test Symposium (ATS), 2016 IEEE 25th. :257-262 Nov, 2016

Relation: 2016 IEEE 25th Asian Test Symposium (ATS)

المؤلفون: Wu, Tung-Yeh, Hu, Shih-Hsin, Abraham, Jacob A.

المصدر: 16th Asia and South Pacific Design Automation Conference (ASP-DAC 2011) Design Automation Conference (ASP-DAC), 2011 16th Asia and South Pacific. :615-620 Jan, 2011

Relation: 2011 16th Asia and South Pacific Design Automation Conference ASP-DAC 2011

المؤلفون: Kufluoglu, Haldun, Chen, Min, Lu, Shan, Rabindranath, Ashwin, Kakoee, Reza, Hu, Shih-Hsin

المصدر: 2017 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS),2017 IEEE International. :4C-6.1-4C-6.5 Apr, 2017

Relation: 2017 IEEE International Reliability Physics Symposium (IRPS)

المؤلفون: Hu, Shih-Hsin, Wu, Tung-Yeh, Abraham, Jacob A.

المصدر: 2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems Defect and Fault Tolerance in VLSI Systems, 2009. DFT '09. 24th IEEE International Symposium on. :136-144 Oct, 2009

Relation: 2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT)

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