المؤلفون: Song, Xiaorui, Hou, Zhiqiang^{Aff1, Aff2}, Gan, Zhehao, Hu, Yuyao, Zheng, Hongyu, Wu, Yongling^{Aff1, IDs4054402409063_cor6}, Liu, Mingming^{Aff1, Aff3, IDs4054402409063_cor7}

المصدر: Friction. :1-19

المؤلفون: LI Jiayang, XIAN Richang, LI Fei, HU Yuyao, XUE Yongduan, WANG Wei

المصدر: 电力工程技术, Vol 43, Iss 4, Pp 226-234 (2024)

مصطلحات موضوعية: grounding transformer, outlet short-circuit, multi-physics field coupling, winding deformation, winding temperature rise, improved short-circuit resistance, Applications of electric power, TK4001-4102

وصف الملف: electronic resource

Relation: https://www.epet-info.com/dlgcjsen/article/abstract/230611696; https://doaj.org/toc/2096-3203

URL الوصول: https://doaj.org/article/9ad63266009b48e1905a9053beac772c

المؤلفون: Qi, Zhao, Liu, Hui, Han, Liang, Zhang, Zhen, Hu, Yuyao

المصدر: 2022 IEEE International Conference on High Voltage Engineering and Applications (ICHVE) High Voltage Engineering and Applications (ICHVE), 2022 IEEE International Conference on. :1-4 Sep, 2022

Relation: 2022 IEEE International Conference on High Voltage Engineering and Applications (ICHVE)

المؤلفون: Wu, Hong, Xu, Zhaoguo, Li, Xiuguang, Hao, Jinpeng, Hu, Yuyao

المصدر: 2022 IEEE International Conference on High Voltage Engineering and Applications (ICHVE) High Voltage Engineering and Applications (ICHVE), 2022 IEEE International Conference on. :1-4 Sep, 2022

Relation: 2022 IEEE International Conference on High Voltage Engineering and Applications (ICHVE)

المؤلفون: Wang, Shaojie, Xu, Tianshan, Deng, Qiang, Zhao, Hailong, Hu, Xiulei, Yang, Zhongping, Bi, Maoqiang, Hu, Yuyao

المصدر: 2022 IEEE International Conference on High Voltage Engineering and Applications (ICHVE) High Voltage Engineering and Applications (ICHVE), 2022 IEEE International Conference on. :1-4 Sep, 2022

Relation: 2022 IEEE International Conference on High Voltage Engineering and Applications (ICHVE)

المؤلفون: Hu, Yuyao^{Aff38, Aff39}, Cai, Fudong^Aff38, Xian, Richang^Aff39, Liu, Wei^Aff38, Zhao, Mengyang^Aff39

المساهمون: Angrisani, Leopoldo, Series Editor^Aff1, Arteaga, Marco, Series Editor^Aff2, Chakraborty, Samarjit, Series Editor^Aff3, Chen, Jiming, Series Editor^Aff4, Chen, Shanben, Series Editor^Aff5, Chen, Tan Kay, Series Editor^Aff6, Dillmann, Rüdiger, Series Editor^Aff7, Duan, Haibin, Series Editor^Aff8, Ferrari, Gianluigi, Series Editor^Aff9, Ferre, Manuel, Series Editor^Aff10, Jabbari, Faryar, Series Editor^Aff11, Jia, Limin, Series Editor^Aff12, Kacprzyk, Janusz, Series Editor^Aff13, Khamis, Alaa, Series Editor^Aff14, Kroeger, Torsten, Series Editor^Aff15, Li, Yong, Series Editor^Aff16, Liang, Qilian, Series Editor^Aff17, Martín, Ferran, Series Editor^Aff18, Ming, Tan Cher, Series Editor^Aff19, Minker, Wolfgang, Series Editor^Aff20, Misra, Pradeep, Series Editor^Aff21, Mukhopadhyay, Subhas, Series Editor^Aff22, Ning, Cun-Zheng, Series Editor^Aff23, Nishida, Toyoaki, Series Editor^Aff24, Oneto, Luca, Series Editor^Aff25, Panigrahi, Bijaya Ketan, Series Editor^Aff26, Pascucci, Federica, Series Editor^Aff27, Qin, Yong, Series Editor^Aff28, Seng, Gan Woon, Series Editor^Aff29, Speidel, Joachim, Series Editor^Aff30, Veiga, Germano, Series Editor^Aff31, Wu, Haitao, Series Editor^Aff32, Zamboni, Walter, Series Editor^Aff33, Tan, Kay Chen, Series Editor^Aff34, Yang, Qingxin, editor^Aff35, Li, Zewen, editor^Aff36, Luo, An, editor^Aff37

المصدر: The Proceedings of the 18th Annual Conference of China Electrotechnical Society : Volume IV. 1165:137-147

المؤلفون: Xiong Changsheng, Hu Yuyao, Zhou Bo, Liu Xue, Luan Qiaolin

المصدر: Redai dili, Vol 44, Iss 5, Pp 938-950 (2024)

مصطلحات موضوعية: high-speed rail station, construction land expansion, influence mechanism, hainan roundabout railway (hrr), Geography (General), G1-922

وصف الملف: electronic resource

Relation: https://www.rddl.com.cn/CN/10.13284/j.cnki.rddl.003862; https://doaj.org/toc/1001-5221

URL الوصول: https://doaj.org/article/a843ba738e684a25aee58078cb6fc2bf

المؤلفون: Hu, Yuyao, Zong, Chunyu, Xian, Richang, Zhang, Peng, Yin, Wenliang

المصدر: 2020 IEEE International Conference on High Voltage Engineering and Application (ICHVE) High Voltage Engineering and Application (ICHVE), 2020 IEEE International Conference on. :1-4 Sep, 2020

Relation: 2020 IEEE International Conference on High Voltage Engineering and Application (ICHVE)

المؤلفون: Hu, Yuyao, Liang, Dong, Wang, Jing, Xuan, Yaping, Zhao, Fu, Liu, Jun, Li, Ruxin

مصطلحات موضوعية: Physics - Optics, Electrical Engineering and Systems Science - Image and Video Processing

URL الوصول: http://arxiv.org/abs/2111.03259

المؤلفون: Shen, Hao^Aff41, Liu, Hui^Aff41, Hu, Yuyao^Aff42, Zhao, Yunpeng^Aff42, Zhao, Chong^Aff42

المساهمون: Angrisani, Leopoldo, Series Editor^Aff1, Arteaga, Marco, Series Editor^Aff2, Panigrahi, Bijaya Ketan, Series Editor^Aff3, Chakraborty, Samarjit, Series Editor^Aff4, Chen, Jiming, Series Editor^Aff5, Chen, Shanben, Series Editor^Aff6, Chen, Tan Kay, Series Editor^Aff7, Dillmann, Rüdiger, Series Editor^Aff8, Duan, Haibin, Series Editor^Aff9, Ferrari, Gianluigi, Series Editor^Aff10, Ferre, Manuel, Series Editor^Aff11, Hirche, Sandra, Series Editor^Aff12, Jabbari, Faryar, Series Editor^Aff13, Jia, Limin, Series Editor^Aff14, Kacprzyk, Janusz, Series Editor^Aff15, Khamis, Alaa, Series Editor^Aff16, Kroeger, Torsten, Series Editor^Aff17, Li, Yong, Series Editor^Aff18, Liang, Qilian, Series Editor^Aff19, Martín, Ferran, Series Editor^Aff20, Ming, Tan Cher, Series Editor^Aff21, Minker, Wolfgang, Series Editor^Aff22, Misra, Pradeep, Series Editor^Aff23, Möller, Sebastian, Series Editor^Aff24, Mukhopadhyay, Subhas, Series Editor^Aff25, Ning, Cun-Zheng, Series Editor^Aff26, Nishida, Toyoaki, Series Editor^Aff27, Oneto, Luca, Series Editor^Aff28, Pascucci, Federica, Series Editor^Aff29, Qin, Yong, Series Editor^Aff30, Seng, Gan Woon, Series Editor^Aff31, Speidel, Joachim, Series Editor^Aff32, Veiga, Germano, Series Editor^Aff33, Wu, Haitao, Series Editor^Aff34, Zamboni, Walter, Series Editor^Aff35, Zhang, Junjie James, Series Editor^Aff36, Xie, Kaigui, editor^Aff37, Hu, Jianlin, editor^Aff38, Yang, Qingxin, editor^Aff39, Li, Jian, editor^Aff40

المصدر: The Proceedings of the 17th Annual Conference of China Electrotechnical Society : Volume III. 1014:861-868