المؤلفون: Lee, B.H., Young, C.D., Choi, R., Sim, J.H., Bersuker, G., Kang, C.Y., Harris, R., Brown, G.A., Matthews, K., Song, S.C., Moumen, N., Barnett, J., Lysaght, P., Choi, K.S., Wen, H.C., Huffman, C., Alshareef, H., Majhi, P., Gopalan, S., Peterson, J., Kirsh, P., Li, H.-J., Gutt, J., Gardner, M., Huff, H.R., Zeitzoff, P., Murto, R.W., Larson, L., Ramiller, C.

المصدر: IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. Electron devices meeting Electron Devices Meeting, 2004. IEDM Technical Digest. IEEE International. :859-862 2004

Relation: 2004 International Electron Devices Meeting

المؤلفون: Lannon, J. M., Gregory, C., Lueck, M., Reed, J. D., Huffman, C. A., Temple, D.

المصدر: IEEE Transactions on Components, Packaging and Manufacturing Technology IEEE Trans. Compon., Packag. Manufact. Technol. Components, Packaging and Manufacturing Technology, IEEE Transactions on. 2(1):71-78 Jan, 2012

المؤلفون: Majumdar, K., Vivekanand, S., Huffman, C., Matthews, K., Ngai, T., Chen, C. H., Baek, R. H., Loh, W. Y., Rodgers, M., Stamper, H., Gausepohl, S., Kang, C. Y., Hobbs, C., Kirsch, P. D.

المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 34(9):1082-1084 Sep, 2013

المؤلفون: Seung-Chul Song, Zhibo Zhang, Huffman, C., Sim, J.H., Sang Ho Bae, Kirsch, P.D., Majhi, P., Rino Choi, Moumen, N., Byoung Hun Lee

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 53(5):979-989 May, 2006

المؤلفون: Veloso, A., Demuynck, S., Ercken, M., Goethals, A. M., Locorotondo, S., Lazzarino, F., Altamirano, E., Huffman, C., De Keersgieter, A., Brus, S., Demand, M., Struyf, H., De Backer, J., Hermans, J., Delvaux, C., Baudemprez, B., Vandeweyer, T., Van Roey, F., Baerts, C., Goossens, D., Dekkers, H., Ong, P., Heylen, N., Kellens, K., Volders, H., Hikavyy, A., Vrancken, C., Rakowski, M., Verhaegen, S., Dusa, M., Romijn, L., Pigneret, C., Van Dijk, A., Schreutelkamp, R., Cockburn, A., Gravey, V., Meiling, H., Hultermans, B., Lok, S., Shah, K., Rajagopalan, R., Gelatos, J., Richard, O., Bender, H., Vandenberghe, G., Beyer, G. P., Absil, P., Hoffmann, T., Ronse, K., Biesemans, S.

المصدر: 2009 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2009 IEEE International. :1-4 Dec, 2009

Relation: 2009 IEEE International Electron Devices Meeting (IEDM)

المؤلفون: Veloso, A., Demuynck, S., Ercken, M., Goethals, A. M., Demand, M., de Marneffe, J.-F., Altamirano, E., De Keersgieter, A., Delvaux, C., De Backer, J., Brus, S., Hermans, J., Baudemprez, B., Van Roey, F., Lorusso, G. F., Baerts, C., Goossens, D., Vrancken, C., Mertens, S., Versluijs, J. J., Truffert, V., Huffman, C., Laidler, D., Heylen, N., Ong, P., Parvais, B., Rakowski, M., Verhaegen, S., Hikavyy, A., Meiling, H., Hultermans, B., Romijn, L., Pigneret, C., Lok, S., Van Dijk, A., Shah, K., Noori, A., Gelatos, J., Arghavani, R., Schreutelkamp, R., Boelen, P., Richard, O., Bender, H., Witters, L., Collaert, N., Rooyackers, R., Absil, P., Lauwers, A., Jurczak, M., Hoffmann, T., Vanhaelemeersch, S., Cartuyvels, R., Ronse, K., Biesemans, S.

المصدر: 2008 IEEE International Electron Devices Meeting Electron Devices Meeting, 2008. IEDM 2008. IEEE International. :1-4 Dec, 2008

Relation: 2008 IEEE International Electron Devices Meeting (IEDM)

المؤلفون: Lee, Rinus T.P., Ohsawa, Y., Huffman, C., Trickett, Y., Nakamura, G., Hatem, C., Rao, K.V., Khaja, F., Lin, R., Matthews, K., Dunn, K., Jensen, A., Karpowicz, T., Nielsen, Peter F., Stinzianni, E., Cordes, A., Hung, P.Y., Kim, D.-H., Hill, R.J.W., Loh, W.-Y., Hobbs, C.

المصدر: 2014 IEEE International Electron Devices Meeting Electron Devices Meeting (IEDM), 2014 IEEE International. :32.4.1-32.4.4 Dec, 2014

Relation: 2014 IEEE International Electron Devices Meeting (IEDM)

المؤلفون: Xiong, W., Cleavelin, C.R., Kohli, P., Huffman, C., Schulz, T., Schruefer, K., Gebara, G., Mathews, K., Patruno, P., Le Vaillant, Y.-M., Cayrefourcq, I., Kennard, M., Mazure, C., Shin, K., Liu, T.-J.K.

المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 27(7):612-614 Jul, 2006

المؤلفون: Kirsch, P. D., Hill, R. J. W., Huang, J., Loh, W.Y., Kim, T.-W., Wong, M. H., Min, B. G., Huffman, C., Veksler, D., Young, C. D., Ang, K. W., Ali, I., Lee, R. T. P., Ngai, T., Wang, A., Wang, W.-E., Cunningham, T.H., Chen, Y. T., Hung, P. Y., Bersch, E., Sassman, B., Cruz, M., Trammell, S., Droopad, R., Oktybrysky, S., Lee, J. C., Bersuker, G., Hobbs, C., Jammy, R.

المصدر: Proceedings of Technical Program of 2012 VLSI Technology, System and Application VLSI Technology, Systems, and Applications (VLSI-TSA), 2012 International Symposium on. :1-2 Apr, 2012

Relation: 2012 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA)

المؤلفون: Horiguchi, N., Demuynck, S., Ercken, M., Locorotondo, S., Lazzarino, F., Altamirano, E., Huffman, C., Brus, S., Demand, M., Struyf, H., De Backer, J., Hermans, J., Delvaux, C., Vandeweyer, T., Baerts, C., Mannaert, G., Truffert, V., Verluijs, J., Alaerts, W., Dekkers, H., Ong, P., Heylen, N., Kellens, K., Volders, H., Hikavyy, A., Vrancken, C., Rakowski, M., Verhaegen, S., Vandenberghe, G., Beyer, G., Lauwers, A., Absil, P., Hoffman, T., Ronse, K., Biesemans, S.

المصدر: 2010 Symposium on VLSI Technology VLSI Technology (VLSIT), 2010 Symposium on. :23-24 Jun, 2010

Relation: 2010 IEEE Symposium on VLSI Technology