المؤلفون: Bajaj, A., Philips, B., Lyons, E., Westbrook, D., Zink, M., Chandrasekar, V., Huffman, E.

المصدر: IGARSS 2020 - 2020 IEEE International Geoscience and Remote Sensing Symposium Geoscience and Remote Sensing Symposium, IGARSS 2020 - 2020 IEEE International. :6483-6486 Sep, 2020

Relation: IGARSS 2020 - 2020 IEEE International Geoscience and Remote Sensing Symposium

المؤلفون: ALF Collaboration, Assaad, F. F., Bercx, M., Goth, F., Götz, A., Hofmann, J. S., Huffman, E., Liu, Z., Toldin, F. Parisen, Portela, J. S. E., Schwab, J.

المصدر: SciPost Physics Codebases 1 (2022)

مصطلحات موضوعية: Condensed Matter - Strongly Correlated Electrons, High Energy Physics - Lattice, Physics - Computational Physics, Quantum Physics

URL الوصول: http://arxiv.org/abs/2012.11914

المؤلفون: Yang, J. Y., Drury, C. F., De Jong, R., Huffman, E. C., Yang, X. M.

المصدر: 2014 4th International Conference On Simulation And Modeling Methodologies, Technologies And Applications (SIMULTECH) Simulation and Modeling Methodologies, Technologies and Applications (SIMULTECH), 2014 International Conference on. :529-536 Aug, 2014

Relation: 2014 International Conference on Simulation and Modeling Methodologies, Technologies and Applications (SIMULTECH)

المؤلفون: Opachich, YP, Bell, PM, Bradley, DK, Chen, N, Feng, J, Gopal, A, Hatch, B, Hilsabeck, TJ, Huffman, E, Koch, JA, Landen, OL, MacPhee, AG, Nagel, SR, Udin, S

المصدر: The Review of scientific instruments. 87(11)

مصطلحات موضوعية: Applied Physics, Engineering, Physical Sciences, Chemical Sciences

وصف الملف: application/pdf

URL الوصول: https://escholarship.org/uc/item/3zp874xp

المؤلفون: McNairn, H., Smith, A., Huffman, E., Jarvis, I., Pacheco, A., Gauthier, E.

المصدر: IGARSS 2004. 2004 IEEE International Geoscience and Remote Sensing Symposium Geoscience and remote sensing Geoscience and Remote Sensing Symposium, 2004. IGARSS '04. Proceedings. 2004 IEEE International. 3:1629-1632 vol.3 2004

Relation: IGARSS 2004. 2004 IEEE International Geoscience and Remote Sensing

المؤلفون: van Zijll, M., Huffman, E., Lovinger, D.J., Chiang, S. ^*

المصدر: In Surface Science December 2017 666:90-95

المؤلفون: Huffman, E., Banerjee, D., Chandrasekharan, S., Wiese, U.-J.

المصدر: In Annals of Physics September 2016 372:309-319

المؤلفون: Madison, J. D.^Aff1, Underwood, O. D., Poulter, G. A.^Aff2, Huffman, E. M.^Aff3

المصدر: Integrating Materials and Manufacturing Innovation. 6(2):135-146

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