المؤلفون: Reum Oh, Byunghyun Lee, Sang-Woong Shin, Wonil Bae, Hundai Choi, Indal Song, Yun-Sang Lee, Jung-Hwan Choi, Chi-Wook Kim, Seong-Jin Jang, Joo Sun Choi

المصدر: 2014 Symposium on VLSI Circuits Digest of Technical Papers VLSI Circuits Digest of Technical Papers, 2014 Symposium on. :1-2 Jun, 2014

Relation: 2014 IEEE Symposium on VLSI Circuits

المؤلفون: Young-Soo Sohn, Joung-Wook Moon, Dong-Hun Lee, Haeyoung Chung, Seok-Yong Kang, Seong-Jin Jang, Jun-Bae Kim, Yong-Ho Cho, Ki-Ho Kim, In-Dal Song, Kwang-Il Park, Hundai Choi, Jung-Hwan Choi, Hye-Sung Yoo, Seok-Hun Hyun, Il-Won Park, Ki-Jae Song

المصدر: A-SSCC

مصطلحات موضوعية: business.industry, Computer science, 0211 other engineering and technologies, Skew, 02 engineering and technology, DDR4 SDRAM, CMOS, Transceiver, business, Phase shift module, Dram, Computer hardware, 021106 design practice & management, Electronic circuit, Voltage

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::c643084e66fe95f71eb2fcf04a50c308
https://doi.org/10.1109/asscc.2018.8579329

المؤلفون: Junsuk Park, Kyung Seok Oh, Young Sang Choi, Taesik Na, Seong-Jin Jang, Byung-Chul Kim, Jongeun Lee, Sang Hee Kim, Byung-sick Moon, Junghwan Park, Ki-Won Lee, Yong Shim, Dong Su Lee, Haeyoung Chung, Sang-Hee Kang, Inwoo Jun, Joo Sun Choi, Han-Gyun Jung, Jung-Hwan Choi, Hanki Jeoung, Hundai Choi, Jang Seok Choi, Kyomin Sohn, In-Dal Song, Dae-Hee Jung, Byung-Hyun Lee, Won-Il Bae, Ju-Seop Park

المصدر: ISSCC

مصطلحات موضوعية: DDR4 SDRAM, business.industry, Computer science, Cyclic redundancy check, Embedded system, Memory bandwidth, Electrical and Electronic Engineering, business, Error detection and correction, Dram, Jitter

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::65a6811c6578bf6e7f19d3fb6742bd23
https://doi.org/10.1109/jssc.2012.2213512

المؤلفون: Seong-Jin Jang, Yun-Sang Lee, Joo Sun Choi, Reum Oh, Jung-Hwan Choi, Won-Il Bae, Chi-wook Kim, Sang-woong Shin, Hundai Choi, In-Dal Song, Byung-Hyun Lee

المصدر: VLSIC

مصطلحات موضوعية: Engineering, Hardware_MEMORYSTRUCTURES, business.industry, Process (computing), Hardware_PERFORMANCEANDRELIABILITY, Test method, DDR3 SDRAM, CAS latency, DDR4 SDRAM, Hardware_INTEGRATEDCIRCUITS, Calibration, Electronic engineering, business, Dram, Voltage

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::14a4eb66b1ad9ace297a9df8aee93d85
https://doi.org/10.1109/vlsic.2014.6858367

المؤلفون: Kyomin Sohn, Taesik Na, Indal Song, Yong Shim, Wonil Bae, Sanghee Kang, Dongsu Lee, Hangyun Jung, Hanki Jeoung, Ki-Won Lee, Junsuk Park, Jongeun Lee, Byunghyun Lee, Inwoo Jun, Juseop Park, Junghwan Park, Hundai Choi, Sanghee Kim, Haeyoung Chung, Young Choi, Dae-Hee Jung, Jang Seok Choi, Byungsick Moon, Jung-Hwan Choi, Byungchul Kim, Seong-Jin Jang, Joo Sun Choi, Kyung Seok Oh

المصدر: 2012 IEEE International Solid-State Circuits Conference.

مصطلحات موضوعية: DDR4 SDRAM, Scheme (programming language), Power demand, CMOS, business.industry, Computer science, Fetch, business, Error detection and correction, computer, Computer hardware, Dual (category theory), computer.programming_language

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::067b573eacb4ae8744e734ab6cf63573
https://doi.org/10.1109/isscc.2012.6176868