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1
المؤلفون: Hungyu Lin, Ethan Wang, Jason Sweis, Philippe Hurat, Ya-Chieh Lai, Pai Yu-Chin, Ku Fang, Ching Juan Lee, Chia Wei Huang, Jun-Ming Chen, Yung-Feng Cheng
المصدر: Metrology, Inspection, and Process Control XXXVI.
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::83612338b32e5cfd4ec4088e975113a9
https://doi.org/10.1117/12.2613620 -
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المؤلفون: Ilin Chan, Ming-Der Yang, Hungyu Lin, Huiping Tsai, Yi-Ping Chen
المصدر: Advances in Intelligent Systems Research.
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::9e9679f3501d25c0ee85b1b37fc2c681
https://doi.org/10.2991/cmsa-18.2018.3