المؤلفون: Lee, Hyun-Woo, Yun, Won-Joo, Young-Kyoung Choi, Hyang-Hwa Choi, Jong-Jin Lee, Ki-Han Kim, Shin-Deok Kang, Ji-Yeon Yang, Jae-Suck Kang, Hyeng-Ouk Lee, Lee, Dong-Uk, Sujeong Sim, Young-Ju Kim, Won-Jun Choi, Keun-Soo Song, Sang-Hoon Shin, Hyung-Wook Moon, Seung-Wook Kwack, Jung-Woo Lee, Park, Nak-Kyu, Kwan-Weon Kim, Young-Jung Choi, Jin-Hong Ahn, Byong-Tae Chung

المصدر: 2009 IEEE International Solid-State Circuits Conference - Digest of Technical Papers Solid-State Circuits Conference - Digest of Technical Papers, 2009. ISSCC 2009. IEEE International. :140-141,141a Feb, 2009

Relation: 2009 IEEE International Solid-State Circuits Conference - (ISSCC)

المؤلفون: Wooyeol Shin, Keun-Soo Song, Jeonghun Lee, Duck-Hwa Hong, Young-Bo Shim, Yongdeok Cho, Jinkook Kim, Joo-Hwan Cho, Sang-Kwon Lee, Woo-Young Lee, Eunryeong Lee, Jaemo Yang, Jaewoong Yun, Sang Il Park, Dongkyun Kim, Hyeongon Kim, Hae-Kang Jung, Namkyu Jang, Hyeng-Ouk Lee, Bokrim Ko, Yongsuk Joo

المصدر: IEEE Journal of Solid-State Circuits. 50:1945-1959

مصطلحات موضوعية: Computer science, Clock rate, Bandwidth (signal processing), Electronic engineering, Memory rank, Electrical and Electronic Engineering, Chip, Electrical efficiency, Dram, Voltage

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::bd3ecdd5a1b8474a68f8bb2d19ea9028
https://doi.org/10.1109/jssc.2015.2429588

المؤلفون: Hyung-Wook Moon, Won-Joo Yun, Jae-Suck Kang, Sujeong Sim, Sang-hoon Shin, Seung-Wook Kwack, Hyun-woo Lee, Shin-Deok Kang, Kwan-Weon Kim, Jong-Jin Lee, Hyeng-Ouk Lee, Won Jun Choi, Nak-Kyu Park, Byong-Tae Chung, Young-Kyoung Choi, Hyang-Hwa Choi, Jung-Woo Lee, Young-Jung Choi, Keun-Soo Song, Dong Uk Lee, Ki-Han Kim, Jin-Hong Ahn, Ji Yeon Yang, Young Ju Kim

المصدر: ISSCC

مصطلحات موضوعية: Engineering, business.industry, Hardware_PERFORMANCEANDRELIABILITY, Noise (electronics), Phase-locked loop, Voltage-controlled oscillator, CMOS, Delay-locked loop, Hardware_INTEGRATEDCIRCUITS, Charge pump, Electronic engineering, business, Dram, Jitter

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::d3e2e286b65c62e3836c96bc0c173b61
https://doi.org/10.1109/isscc.2009.4977347

المؤلفون: Sang-hoon Shin, Dongsuk Shin, Shin Deok Kang, Won-Joo Yun, Keun Soo Song, Ye Seok Yang, Dong Uk Lee, Won Jun Choi, Jin-Hong Ahn, Hyang Hwa Choi, Hyeng Ouk Lee, Nak Kyu Park, Sujeong Sim, Seung Wook Kwack, Young Ju Kim, Ji Yeon Yang, Hyung Wook Moon, Hyun-woo Lee, Kwan-Weon Kim, Young Kyoung Choi, Jung-Woo Lee, Young Jung Choi

المصدر: ISSCC

مصطلحات موضوعية: Synchronous circuit, Engineering, CMOS, Duty cycle, Clock domain crossing, business.industry, Detector, Dual loop, Electronic engineering, business, Dram, Dual (category theory)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::4b6e0d0fb4f9670bb5ee6c1eea2be2c2
https://doi.org/10.1109/isscc.2008.4523167

المؤلفون: Young-Kyoung Choi, Won-Joo Yun, Ki-Chang Kwean, Won Jun Choi, Seung-Wook Kwack, Young-Jung Choi, Shin-Deok Kang, Sang-hoon Shin, Joong-Sik Kih, Hyong-Uk Moon, Hyun-woo Lee, Kwan-Weon Kim, Hyang-Hwa Choi, Hyeng-Ouk Lee, Nak-Kyu Park, Jung-Woo Lee, Young Ju Kim, Dong Uk Lee, Jin-Hong Ahn, Ye-Seok Yang

المصدر: 2006 IEEE Asian Solid-State Circuits Conference.

مصطلحات موضوعية: Engineering, business.industry, Duty cycle, Replica, Controller (computing), Low-power electronics, Process (computing), Electronic engineering, business, Dram, Block (data storage), Power (physics)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::6ce5ff40096b319a115e06fb9c94ea05
https://doi.org/10.1109/asscc.2006.357916

المؤلفون: Won-Joo Yun, Hyun Woo Lee, Dongsuk Shin, Shin Deok Kang, Ji Yeon Yang, Hyeng Ouk Lee, Dong Uk Lee, Sujeong Sim, Young Ju Kim, Won Jun Choi, Keun Soo Song, Sang Hoon Shin, Hyang Hwa Choi, Hyung Wook Moon, Seung Wook Kwack, Jung Woo Lee, Young Kyoung Choi, Nak Kyu Park, Kwan Weon Kim, Young Jung Choi

المصدر: 2008 IEEE International Solid-State Circuits Conference - Digest of Technical Papers; 2008, p282-613, 332p

المؤلفون: Won-Joo Yun, Hyun-Woo Lee, Young-Ju Kim, Won-Jun Choi, Sang-Hoon Shin, Hyang-Hwa Choi, Hyeng-Ouk Lee, Shin-Deok Kang, Hyong-Uk Moon, Seung-Wook Kwack, Dong-Uk Lee, Jung-Woo Lee, Young-Kyoung Choi, Nak-Kyu Park, Ki-Chang Kwean, Kwan-Weon Kim, Young-Jung Choi, Jin-Hong Ahn, Joong-Sik Kih, Ye-Seok Yang

المصدر: 2006 IEEE Asian Solid-State Circuits Conference; 2006, p323-326, 4p

المؤلفون: Hyun-Woo Lee, Won-Joo Yun, Young-Kyoung Choi, Hyang-Hwa Choi, Jong-Jin Lee, Ki-Han Kim, Shin-Deok Kang, Ji-Yeon Yang, Jae-Suck Kang, Hyeng-Ouk Lee, Dong-Uk Lee, Sujeong Sim, Young-Ju Kim, Won-Jun Choi, Keun-Soo Song, Sang-Hoon Shin, Hyung-Wook Moon, Seung-Wook Kwack, Jung-Woo Lee, Nak-Kyu Park

المصدر: 2009 IEEE International Solid-State Circuits Conference - Digest of Technical Papers; 2009, p140-141a, 3p