المؤلفون: Hoeju Chung, Youngchan Jang, Youngdon Choi, Park, Hwanwook, Jaekwan Kim, Soouk Lim, Jung Sunwoo, Park, Moonsook, Hyungwsuk Kim, Sang-Yun Kim, Hyun-Kyung Kim, Su-Jin Chung, Eun-Mi Lee, Youngju Kim, Yun-Sang Lee, Woo-Seop Kim, Jung-Bae Lee, Changhyun Kim

المصدر: 2008 IEEE Asian Solid-State Circuits Conference Solid-State Circuits Conference, 2008. A-SSCC '08. IEEE Asian. :29-32 Nov, 2008

Relation: 2008 IEEE Asian Solid-State Circuits Conference (A-SSCC)

المؤلفون: Jung-Bae Lee, Sang-Yun Kim, Jung Sunwoo, Eun-Mi Lee, Young-Chan Jang, Woo-Seop Kim, Hwan-Wook Park, Hyun-Kyung Kim, Hoe-ju Chung, Young-Ju Kim, Su-Jin Chung, Chang-Hyun Kim, Soouk Lim, Yun-Sang Lee, Young-don Choi, Moon-Sook Park, Jae-Kwan Kim, Hyungwsuk Kim

المصدر: 2008 IEEE Asian Solid-State Circuits Conference.

مصطلحات موضوعية: Hardware_MEMORYSTRUCTURES, business.industry, Computer science, Computation, Memory module, Test board, Gigabit, Bit error rate, Electronic engineering, business, Computer hardware, Dram, Coding (social sciences), Jitter

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::017af6aeeeb40aef38e73941d251a388
https://doi.org/10.1109/asscc.2008.4708721