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1دورية أكاديمية
المؤلفون: Hyunjoon Jeong, Taewan Kim
المصدر: Nuclear Engineering and Technology, Vol 56, Iss 6, Pp 2002-2010 (2024)
مصطلحات موضوعية: ATLAS, SBLOCA, LSI, Multiple failures accident, RPV upper head, MARS-KS, Nuclear engineering. Atomic power, TK9001-9401
وصف الملف: electronic resource
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2دورية أكاديمية
المؤلفون: Jinyoung Choi, Hyunjoon Jeong, Sangmin Woo, Hyungmin Cho, Yohan Kim, Jeong-Taek Kong, Soyoung Kim
المصدر: IEEE Journal of the Electron Devices Society, Vol 12, Pp 65-73 (2024)
مصطلحات موضوعية: Artificial neural network (ANN), machine learning (ML), device modeling, compact model, binning, emerging device, Electrical engineering. Electronics. Nuclear engineering, TK1-9971
وصف الملف: electronic resource
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3دورية أكاديمية
المؤلفون: Hyunjoon Jeong, Sangmin Woo, Jinyoung Choi, Hyungmin Cho, Yohan Kim, Jeong-Taek Kong, Soyoung Kim
المصدر: IEEE Journal of the Electron Devices Society, Vol 11, Pp 153-160 (2023)
مصطلحات موضوعية: Artificial neural network (ANN), machine learning (ML), compact model, modelparameter extraction (MPE), nanosheet FET (NSFET), negative capacitance NSFET (NC-NSFET), Electrical engineering. Electronics. Nuclear engineering, TK1-9971
وصف الملف: electronic resource
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4
المؤلفون: Hyunjoon Jeong, Taewan Kim
المصدر: Kerntechnik.
مصطلحات موضوعية: Nuclear and High Energy Physics, Radiation, Nuclear Energy and Engineering, General Materials Science, Safety, Risk, Reliability and Quality
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::52a209213a222b2dccece7ed3c876b36
https://doi.org/10.1515/kern-2022-0116 -
5
المؤلفون: Ha Min-Woo, Taeeun Kim, Hyunjoon Jeong
المصدر: The transactions of The Korean Institute of Electrical Engineers. 69:450-453
مصطلحات موضوعية: Safe operating area, Materials science, business.industry, Bipolar junction transistor, Optoelectronics, Insulated-gate bipolar transistor, Carrier lifetime, Electrical and Electronic Engineering, business
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::01529114795aea23207ca86ac0f8b590
https://doi.org/10.5370/kiee.2020.69.3.450 -
6
المؤلفون: SangMin Woo, HyunJoon Jeong, JinYoung Choi, HyungMin Cho, Jeong-Taek Kong, SoYoung Kim
المصدر: Electronics; Volume 11; Issue 17; Pages: 2761
مصطلحات موضوعية: artificial neural network, compact model, nanosheet FETs, TCAD/SPICE simulation, Computer Networks and Communications, Hardware and Architecture, Control and Systems Engineering, Signal Processing, Electrical and Electronic Engineering
وصف الملف: application/pdf